Warta wilhelm – Iberlibro

Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Describes an imaging technique for the evaluation of materials and electronic devicesDiscusses various new application fields of lock-in thermographyIs useful as a reference work for researchers and engineer…

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials: 10 (Springer Series in Advanced Microelectronics)

Breitenstein, Otwin; Warta, Wilhelm; Schubert, Martin C.

Idioma: Inglés

Editorial: Springer, 2019

3319998242 / 9783319998244

Serie: Springer Series in Advanced Microelectronics, Libro 63 de 72. Libro 63 de 72 - Springer Series in Advanced Microelectronics

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Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books

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Condición: Nuevo

EUR 245,49

Envío por EUR 7,53

Se envía de Reino Unido a Estados Unidos de America

Cantidad disponible: 4 disponibles

Condición: New. Print on Demand.

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials: 10 (Springer Series in Advanced Microelectronics)

Breitenstein, Otwin; Warta, Wilhelm; Schubert, Martin C.

Idioma: Inglés

Editorial: Springer, 2019

3319998242 / 9783319998244

Serie: Springer Series in Advanced Microelectronics, Libro 63 de 72. Libro 63 de 72 - Springer Series in Advanced Microelectronics

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Impresión bajo demanda

Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios

Vendedor de 4 estrellas

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Condición: Nuevo

EUR 242,18

Envío por EUR 9,95

Se envía de Alemania a Estados Unidos de America

Cantidad disponible: 4 disponibles

Condición: New. PRINT ON DEMAND.

Warta wilhelm (14 resultados)

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Linearer und nichtlinearer Ladungsträgertransport in Naphtalin-Kristallen. Dissertation.

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics, 10)

Lock-In Thermography

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics, 10)

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials: 10 (Springer Series in Advanced Microelectronics)

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics (10))

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)

Lock-In Thermography

Lock-In Thermography

Lock-in Thermography

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials: 10 (Springer Series in Advanced Microelectronics)

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials: 10 (Springer Series in Advanced Microelectronics)