Ubar (55 resultados)
Idioma: Inglés
Editorial: B E S Pub Co (edition Later Printing; First Printing), 1999
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Librería: BooksRun, Philadelphia, PA, Estados Unidos de AmericaBooksRun
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EUR 7,64
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: Very Good. Later Printing; First Printing. With dust jacket. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.
the feather men ppb1st1997 TRUE sas memoir fair later killer elite movie sas vengeance on arab royal
Editorial: penguin, 1997
- Primera edición
Librería: forest primeval, cherry tree, PA, Estados Unidos de Americaforest primeval
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EUR 9,00
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fair. fair.
Editorial: Berlin VEB Verlag Technik, 1989
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Librería: Grammat Antiquariat, Oberbarnim, AlemaniaGrammat Antiquariat
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EUR 12,00
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kart.. 1. 1. Aufl., gr. 8°, S.: 216, Ill., kart., Ecken und Ränder bestoßen und fleckig, Seiten angegilbt und fleckig sonst gut erhalten, Sprache: Deutsch 0,340 gr.
Librería: medimops, Berlin, Alemaniamedimops
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EUR 4,38
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Condición: very good. Gut/Very good: Buch bzw. Schutzumschlag mit wenigen Gebrauchsspuren an Einband, Schutzumschlag oder Seiten. / Describes a book or dust jacket that does show some signs of wear on either the binding, dust jacket or pages.
Editorial: VEB Verlag Technik, Berlin, 1989, 1989
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Librería: Versandantiquariat Kerzemichel, Wittenberge, AlemaniaVersandantiquariat Kerzemichel
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EUR 10,00
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215 S., 8°, Obrosch, 1. Auflg., mit 96 Bildern und 17 Tafeln, ehemaliges Bibliotheksexemplar, Stempel au Vs., Vorwort von den Herausgebern, sehr gut.
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Librería: Ammareal, Morangis, FranciaAmmareal
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EUR 51,29
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Softcover. Condición: Très bon. Ancien livre de bibliothèque avec équipements. Tome 1. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Volume 1. Ammareal gives back up to 15% of this item's net price to charity orga…nizations.
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 115,97
Envío por EUR 11,76Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Paperback. Condición: Brand New. 180 pages. 8.66x5.91x0.41 inches. In Stock.
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Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
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EUR 146,54
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Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Design and Test Technology for Dependable Systems-on-Chip
Ubar, Raimund (EDT); Raik, Jaan (EDT); Vierhaus, Heinrich Theodor (EDT)
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 179,18
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Condición: As New. Unread book in perfect condition.
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Librería: Basi6 International, Irving, TX, Estados Unidos de AmericaBasi6 International
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EUR 181,96
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Condición: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 184,32
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Condición: New. In.
Design and Test Technology for Dependable Systems-on-Chip
Ubar, Raimund (EDT); Raik, Jaan (EDT); Vierhaus, Heinrich Theodor (EDT)
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 196,67
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Condición: New.
Design and Test Technology for Dependable Systems-on-Chip
Ubar, Raimund (EDT); Raik, Jaan (EDT); Vierhaus, Heinrich Theodor (EDT)
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 184,31
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Condición: New.
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 201,17
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Condición: New. 1st ed. 2024 edition NO-PA16APR2015-KAP.
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Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
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EUR 207,43
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Condición: New.
Design and Test Technology for Dependable Systems-on-Chip
Ubar, Raimund (EDT); Raik, Jaan (EDT); Vierhaus, Heinrich Theodor (EDT)
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 204,51
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Condición: As New. Unread book in perfect condition.
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 211,14
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Condición: New.
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Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de AmericaGrand Eagle Retail
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EUR 235,78
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Hardcover. Condición: new. Hardcover. This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book introduces and discusses applications of two typ…es of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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- Edición internacional
Librería: UK BOOKS STORE, London, LONDO, Reino UnidoUK BOOKS STORE
Contactar con el vendedorVendedor de 5 estrellasEdición internacionalCondición: Nuevo
EUR 248,88
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Condición: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if th…e Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 242,21
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Hardcover. Condición: Brand New. 608 pages. 9.25x6.10x1.26 inches. In Stock.
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 257,71
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Condición: New.
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Librería: preigu, Osnabrück, Alemaniapreigu
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EUR 202,85
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Taschenbuch. Condición: Neu. Structural Decision Diagrams in Digital Test | Theory and Applications | Raimund Ubar (u. a.) | Taschenbuch | Computer Science Foundations and Applied Logic | xiii | Englisch | 2025 | Springer | EAN 9783031447365 | Verantwortliche Person für die EU: Springer Basel AG in Springer Science + Business Me…dia, Heidelberger Platz 3, 14197 Berlin, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 284,41
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Condición: As New. Unread book in perfect condition.
Idioma: Inglés
Editorial: Springer Nature Switzerland, Springer Nature Switzerland, 2025
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 235,39
Envío por EUR 65,13Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book intr…oduces and discusses applications of two types of structural decision diagrams (DDs): low-level,structurally synthesized binary DDs (SSBDDs)andhigh-level DDs (HLDDs)that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computerscience and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia:Raimund Ubaris a retired Professor,Jaan RaikandMaksim Jenihhinare tenured Professors.Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia.
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 235,39
Envío por EUR 65,93Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book introduces…and discusses applications of two types of structural decision diagrams (DDs): low-level,structurally synthesized binary DDs (SSBDDs)andhigh-level DDs (HLDDs)that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computerscience and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia:Raimund Ubaris a retired Professor,Jaan RaikandMaksim Jenihhinare tenured Professors.Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia.
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 326,20
Envío por EUR 3,49Se envía dentro de Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New.
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- Edición internacional
Librería: UK BOOKS STORE, London, LONDO, Reino UnidoUK BOOKS STORE
Contactar con el vendedorVendedor de 5 estrellasEdición internacionalCondición: Nuevo
EUR 339,63
Gastos de envío gratisSe envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 3 disponibles
Condición: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if th…e Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 353,50
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Hardcover. Condición: Brand New. 608 pages. 9.25x6.10x1.26 inches. In Stock.
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Librería: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 345,13
Envío por EUR 32,34Se envía de Australia a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: new. Hardcover. This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book introduces and discusses applications of two typ…es of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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- Impresión bajo demanda
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 64,90
Envío por EUR 23,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The field of Software-Based Self-Test (SBST) has been a topic of extensive research in industry and academia for more than three decades. Despite that an automated self-test generation is still lacking a suitable formalisation for m…odeling of microprocessors. This book presents a methodology to formalize and automate SBST synthesis and is leading to a reassessment of microprocessor modeling process. The book consists of four logically connected parts, starting with state-of-the-art in the field of SBST and with introductory material on modelling methods. The following parts narrate the problems of microprocessor model synthesis, high-level fault modeling, test data generation, and self-test test program construction. Based on the ground set in the first two parts, the book presents methods of automation of model synthesis and self-test program synthesis. Final part completes the research, incorporating the SBST programs into testing flow of processor-centric boards. The book is intended for use by CAD and test engineers, researchers, graduate students, or as supplementary material for courses on computer architectures, and test or design for testability of digital systems. 180 pp. Englisch.
