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Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering) - Tapa dura

 
9781609602123: Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)
Tapa dura
ISBN 10: 1609602129 ISBN 13: 9781609602123
Editorial: Information Science Reference, 2010

Sinopsis

Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.

"Sinopsis" puede pertenecer a otra edición de este libro.

Reseña del editor

Covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined ""classical"" design and test topics and solutions for IC test technology and fault-tolerant systems.

Reseña del editor

Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined classical design and test topics and solutions for IC test technology and fault-tolerant systems.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Information Science Reference
Año de publicación
2010
Idioma
Inglés
ISBN 10 
1609602129
ISBN 13 
9781609602123
Encuadernación
Tapa dura
Número de páginas
580
Editor
Ubar Raimund, Raik Jaan, Vierhaus Heinrich Theodor
Contacto del fabricante
no disponible
Persona responsable
gpsr@libri.de
gpsr@libri.de

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