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- EditorialLAP LAMBERT Academic Publishing
- Año de publicación2018
- ISBN 10 6137339475
- ISBN 13 9786137339473
- EncuadernaciónTapa blanda
- IdiomaInglés
- Número de páginas180
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Software-Based Self-Test with Decision Diagrams for Microprocessors
Publicado por
LAP LAMBERT Academic Publishing Feb 2018, 2018
ISBN 10: 6137339475
ISBN 13: 9786137339473
Nuevo
Taschenbuch
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The field of Software-Based Self-Test (SBST) has been a topic of extensive research in industry and academia for more than three decades. Despite that an automated self-test generation is still lacking a suitable formalisation for modeling of microprocessors. This book presents a methodology to formalize and automate SBST synthesis and is leading to a reassessment of microprocessor modeling process. The book consists of four logically connected parts, starting with state-of-the-art in the field of SBST and with introductory material on modelling methods. The following parts narrate the problems of microprocessor model synthesis, high-level fault modeling, test data generation, and self-test test program construction. Based on the ground set in the first two parts, the book presents methods of automation of model synthesis and self-test program synthesis. Final part completes the research, incorporating the SBST programs into testing flow of processor-centric boards. The book is intended for use by CAD and test engineers, researchers, graduate students, or as supplementary material for courses on computer architectures, and test or design for testability of digital systems. 180 pp. Englisch. Nº de ref. del artículo: 9786137339473
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EUR 23,00
De Alemania a Estados Unidos de America
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Cantidad disponible: 2 disponibles
Imagen del vendedor
Software-Based Self-Test with Decision Diagrams for Microprocessors
Publicado por
LAP LAMBERT Academic Publishing, 2018
ISBN 10: 6137339475
ISBN 13: 9786137339473
Nuevo
Taschenbuch
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The field of Software-Based Self-Test (SBST) has been a topic of extensive research in industry and academia for more than three decades. Despite that an automated self-test generation is still lacking a suitable formalisation for modeling of microprocessors. This book presents a methodology to formalize and automate SBST synthesis and is leading to a reassessment of microprocessor modeling process. The book consists of four logically connected parts, starting with state-of-the-art in the field of SBST and with introductory material on modelling methods. The following parts narrate the problems of microprocessor model synthesis, high-level fault modeling, test data generation, and self-test test program construction. Based on the ground set in the first two parts, the book presents methods of automation of model synthesis and self-test program synthesis. Final part completes the research, incorporating the SBST programs into testing flow of processor-centric boards. The book is intended for use by CAD and test engineers, researchers, graduate students, or as supplementary material for courses on computer architectures, and test or design for testability of digital systems. Nº de ref. del artículo: 9786137339473
Gastos de envío:
EUR 29,42
De Alemania a Estados Unidos de America
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Cantidad disponible: 1 disponibles
Imagen del vendedor
Software-Based Self-Test with Decision Diagrams for Microprocessors
Publicado por
LAP LAMBERT Academic Publishing, 2018
ISBN 10: 6137339475
ISBN 13: 9786137339473
Nuevo
Tapa blanda
Librería: moluna, Greven, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Ubar RaimundRaimund Ubar, PhD: professor at Tallinn University of Technology, Estonia. Fields of Study: computer science, design for testability, fault diagnosis in digital systems. Lectured in 20+ universities, participated in 10+ E. Nº de ref. del artículo: 508183825
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EUR 48,99
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