Stroud charles e e (44 resultados)
Idioma: Inglés
Editorial: Pennsylvania Historical Association, University Park, 2012
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Librería: Clayton Fine Books, Shepherdstown, WV, Estados Unidos de AmericaClayton Fine Books
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Añadir al carritoSoft cover. Condición: Near Fine. First Edition. Near fine in original wrappers.
Idioma: Inglés
Editorial: Springer, 2002
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Librería: HPB-Red, Dallas, TX, Estados Unidos de AmericaHPB-Red
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EUR 42,43
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hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
Idioma: Inglés
Editorial: Springer, 2002
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Librería: Goodwill of Greater Milwaukee and Chicago, Racine, WI, Estados Unidos de AmericaGoodwill of Greater Milwaukee and Chicago
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EUR 46,75
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Condición: good. Book is considered to be in good or better condition. The actual cover image may not match the stock photo. Hard cover books may show signs of wear on the spine, cover or dust jacket. Paperback book may show signs of wear on spine or cover as well as having a slight bend, curve or creasing to it. Book should hav…e minimal to no writing inside and no highlighting. Pages should be free of tears or creasing. Stickers should not be present on cover or elsewhere, and any CD or DVD expected with the book is included. Book is not a former library copy.
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 49,53
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Condición: New.
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 48,72
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Condición: New.
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Librería: Basi6 International, Irving, TX, Estados Unidos de AmericaBasi6 International
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EUR 73,68
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Condición: Brand New. New. Delivery takes 25-30 days. Excellent Customer Service.
Idioma: Inglés
Editorial: Springer, 2002
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Librería: WeBuyBooks, Rossendale, LANCS, Reino UnidoWeBuyBooks
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EUR 64,93
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Condición: Good. Most items will be dispatched the same or the next working day. A copy that has been read but remains in clean condition. All of the pages are intact and the cover is intact and the spine may show signs of wear. The book may have minor markings which are not specifically mentioned.
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Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
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EUR 76,50
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Condición: New. pp. xxxvi + 856 Illus.
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 101,50
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Condición: New. pp. xxxvi + 856.
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 93,52
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Condición: New. pp. xxxvi + 856.
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 133,45
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Condición: As New. Unread book in perfect condition.
Idioma: Inglés
Editorial: Springer, 2002
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Librería: AwesomeBooks, Wallingford, Reino UnidoAwesomeBooks
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EUR 152,25
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hardcover. Condición: Very Good. A Designerâs Guide to Built-In Self-Test: 19 (Frontiers in Electronic Testing, 19) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clea…rly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. .
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 155,25
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Condición: As New. Unread book in perfect condition.
Idioma: Inglés
Editorial: Springer -, 2002
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Librería: Bahamut Media, Reading, Reino UnidoBahamut Media
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EUR 152,25
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hardcover. Condición: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee.
Idioma: Inglés
Editorial: Springer, 2013
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Librería: Basi6 International, Irving, TX, Estados Unidos de AmericaBasi6 International
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EUR 174,27
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Condición: Brand New. New. Delivery takes 25-30 days. Excellent Customer Service.
Idioma: Inglés
Editorial: Springer, 2002
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Librería: Basi6 International, Irving, TX, Estados Unidos de AmericaBasi6 International
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EUR 174,27
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Condición: Brand New. New. Delivery takes 25-30 days. Excellent Customer Service.
Idioma: Inglés
Editorial: Springer, 2002
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Librería: BennettBooksLtd, Los Angeles, CA, Estados Unidos de AmericaBennettBooksLtd
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EUR 187,69
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hardcover. Condición: New. In shrink wrap. Looks like an interesting title.
Idioma: Inglés
Editorial: Kluwer Academic, 2002
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Librería: Anybook.com, Lincoln, Reino UnidoAnybook.com
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EUR 158,71
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Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:9781402070501.
Idioma: Inglés
Editorial: Springer, 2013
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 227,29
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Condición: New. In.
Idioma: Inglés
Editorial: Springer, 2002
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 227,29
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Condición: New. In.
Más imágenesIdioma: Inglés
Editorial: Humana, 2013
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Librería: preigu, Osnabrück, Alemaniapreigu
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EUR 184,95
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Taschenbuch. Condición: Neu. A Designer's Guide to Built-In Self-Test | Charles E. Stroud | Taschenbuch | xx | Englisch | 2013 | Humana | EAN 9781475776263 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Idioma: Inglés
Editorial: Kluwer Academic Publishers, 2002
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Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
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EUR 257,06
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Condición: New. Written from a designer's perspective, this title describes the BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. It pays particular attention to system-level use of BIST in order to maximize benefits of BIST through reduced testing time and cost as w…ell as high diagnostic resolution. Series: Frontiers in Electronic Testing. Num Pages: 340 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 20. Weight in Grams: 1450. . 2002. Hardback. . . . .
Idioma: Inglés
Editorial: Kluwer Academic Publishers, US, 2002
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Librería: Rarewaves.com USA, London, LONDO, Reino UnidoRarewaves.com USA
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EUR 275,97
Gastos de envío gratisSe envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Hardback. Condición: New. 2002 ed. A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book… is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.
Idioma: Inglés
Editorial: Springer, 2013
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 278,07
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Condición: New. pp. 344.
Idioma: Inglés
Editorial: Springer, 2002
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 279,92
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Condición: New. pp. 344.
Idioma: Inglés
Editorial: Springer US, Humana, 2013
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 223,11
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the cur…rent time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.
Idioma: Inglés
Editorial: Springer US, Springer New York, 2002
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 223,11
Envío por EUR 63,41Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current ti…me, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.
Idioma: Inglés
Editorial: Springer, 2013
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 302,16
Envío por EUR 11,67Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Paperback. Condición: Brand New. 340 pages. 9.30x6.20x0.80 inches. In Stock.
Idioma: Inglés
Editorial: Springer, 2002
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 304,56
Envío por EUR 14,59Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Hardcover. Condición: Brand New. 344 pages. 9.50x6.50x1.00 inches. In Stock.
Idioma: Inglés
Editorial: Kluwer Academic Publishers, 2002
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Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 323,26
Envío por EUR 9,09Se envía dentro de Estados Unidos de AmericaCantidad disponible: 15 disponibles
Condición: New. Written from a designer's perspective, this title describes the BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. It pays particular attention to system-level use of BIST in order to maximize benefits of BIST through reduced testing time and cost as w…ell as high diagnostic resolution. Series: Frontiers in Electronic Testing. Num Pages: 340 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 20. Weight in Grams: 1450. . 2002. Hardback. . . . . Books ship from the US and Ireland.
