A Designer's Guide to Built-In Self-Test

Idioma: inglés

Editorial: Kluwer Academic Publishers, US, 2002

1402070500 / 9781402070501

Serie: Libro 8 de 40 - Frontiers in Electronic Testing

Librería: Rarewaves.com USA, London, London, Reino UnidoRarewaves.com USA

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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.…

N° de ref. del artículo LU-9781402070501

Título
A Designer's Guide to Built-In Self-Test
Autor
Charles E. Stroud
Editorial
Kluwer Academic Publishers, US
Año de publicación
2002
Estado
New
Encuadernación
Hardback
Idioma
inglés
ISBN 10
1402070500
ISBN 13
9781402070501
Edición
2002 ed.
Peso del artículo
703 gramos
Dimensiones
16.21 x 2.39 x 23.77 cm
Serie
Libro 8 de 40: Frontiers in Electronic Testing

Rarewaves.com USA

London, London, Reino Unido

Vendedor de 5 estrellas

Vendedor de AbeBooks desde 11 de junio de 2025

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