James moyne (19 resultados)
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Librería: -OnTimeBooks-, Phoenix, AZ, Estados Unidos de America-OnTimeBooks-
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EUR 204,76
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Condición: good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipp…ed with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail.
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Librería: Better World Books: West, Reno, NV, Estados Unidos de AmericaBetter World Books: West
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EUR 235,92
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Condición: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Librería: PBShop.store UK, Fairford, GLOS, Reino UnidoPBShop.store UK
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EUR 244,60
Envío por EUR 6,86Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.
Run-to-Run Control in Semiconductor Manufacturing
Boning, Duane S. Ed(s): Moyne, James; del Castillo, Enrique; Hurwitz, A.M.
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- Primera edición
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
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EUR 258,45
Envío por EUR 9,50Se envía de Irlanda a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: New. Offers analyses of run-to-run (R2R) control. Through manufacturing case studies, this book provides justification for and demonstrates the benefits of run-to-run control, and offers the know-how and direction for incorporating R2R control into readers' manufacturing capabilities. Editor(s): Moyne, James; del Cast…illo, Enrique; Hurwitz, A.M. Num Pages: 368 pages, 27 black & white tables. BIC Classification: TGP; TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 158 x 22. Weight in Grams: 630. . 2000. 1st Edition. hardcover. . . . .
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 264,47
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Condición: New. In.
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- Primera edición
Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de AmericaGrand Eagle Retail
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EUR 291,71
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Hardcover. Condición: new. Hardcover. Run-to-Run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epita…xy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run-to-Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control. Offers analyses of run-to-run (R2R) control. Through manufacturing case studies, this book provides justification for and demonstrates the benefits of run-to-run control, and offers the know-how and direction for incorporating R2R control into readers' manufacturing capabilities. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 300,48
Envío por EUR 3,44Se envía dentro de Estados Unidos de AmericaCantidad disponible: 3 disponibles
Condición: New. pp. 368.
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Librería: Rarewaves.com USA, London, LONDO, Reino UnidoRarewaves.com USA
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EUR 316,41
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Hardback. Condición: New. Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithogra…phy, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.
Run-to-Run Control in Semiconductor Manufacturing
Boning, Duane S. Ed(s): Moyne, James; del Castillo, Enrique; Hurwitz, A.M.
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Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 317,92
Envío por EUR 9,06Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: New. Offers analyses of run-to-run (R2R) control. Through manufacturing case studies, this book provides justification for and demonstrates the benefits of run-to-run control, and offers the know-how and direction for incorporating R2R control into readers' manufacturing capabilities. Editor(s): Moyne, James; del Cast…illo, Enrique; Hurwitz, A.M. Num Pages: 368 pages, 27 black & white tables. BIC Classification: TGP; TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 158 x 22. Weight in Grams: 630. . 2000. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 308,97
Envío por EUR 9,95Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 3 disponibles
Condición: New. pp. 368.
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Librería: moluna, Greven, Alemaniamoluna
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EUR 272,21
Envío por EUR 48,99Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Gebunden. Condición: New. James Moyne, Enrique del Castillo, Arnon M. HurwitzRun-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine runs, thereby minimizing process drift, shift, and variability-and with them, costs. It.
Run to Run Control in Semiconductor Manufacturing
Moyne, James (Editor)/ Del Castillo, Enrique (Editor)/ Hurwitz, Arnon Max (Editor)
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 317,74
Envío por EUR 14,60Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: Brand New. 1st edition. 348 pages. 9.00x6.00x0.75 inches. In Stock.
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 262,50
Envío por EUR 63,09Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Buch. Condición: Neu. Neuware - Run-to-Run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine 'runs,' thereby minimizing process drift, shift, and variability and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, li…thography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run-to-Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control. TOC:Introduction.- What is Run-to-Run Control - Target Audience.- Purpose of this Book.- Outline.- Background.- History of the Development of Run-to-Run Control.- Developing a Run-to-Run Solution.- Developing and Deploying Run-to-Run Solutions: Integrating Control.- Run-to-Run Solution Conclusions.- Summary of Run-to-Run Development and Deployment Process.- Deploying Run-to-Run Control in a Timely and Cost Effective Manner.- Overcoming Barriers to Deployment.- Future Research and Development Issues.- References.
Run to Run Control in Semiconductor Manufacturing
Moyne, James (Editor)/ Del Castillo, Enrique (Editor)/ Hurwitz, Arnon Max (Editor)
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 361,50
Envío por EUR 14,60Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: Brand New. 1st edition. 348 pages. 9.00x6.00x0.75 inches. In Stock.
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Librería: preigu, Osnabrück, Alemaniapreigu
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EUR 299,80
Envío por EUR 70,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Buch. Condición: Neu. Run-To-Run Control in Semiconductor Manufacturing | James Moyne (u. a.) | Buch | Einband - fest (Hardcover) | Englisch | 2000 | CRC Press | EAN 9780849311789 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu.
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Librería: Rarewaves.com UK, London, Reino UnidoRarewaves.com UK
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 310,94
Envío por EUR 75,94Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardback. Condición: New. Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithogra…phy, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.
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Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Como Nuevo
EUR 441,65
Envío por EUR 29,21Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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- Primera edición
Librería: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 455,09
Envío por EUR 31,93Se envía de Australia a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: new. Hardcover. Run-to-Run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epita…xy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run-to-Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control. Offers analyses of run-to-run (R2R) control. Through manufacturing case studies, this book provides justification for and demonstrates the benefits of run-to-run control, and offers the know-how and direction for incorporating R2R control into readers' manufacturing capabilities. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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- Impresión bajo demanda
Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
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EUR 272,27
Envío por EUR 7,59Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 3 disponibles
Condición: New. pp. 368 Illus. This item is printed on demand.
