B bensoussan (26 resultados)

Condición: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In poor condition, suitable as a reading copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1050grams, ISBN:9780130888525. …

Condición: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1100grams, ISBN:9780131918726. …

Condición: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In poor condition, suitable as a reading copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1050grams, ISBN:9780131918726. …

gebundene Ausgabe. Condición: Gut. 346 Seiten Das hier angebotene Buch stammt aus einer teilaufgelösten Bibliothek und kann die entsprechenden Kennzeichnungen aufweisen (Rückenschild, Instituts-Stempel.); der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. In ENGLISCHER Sprache. Sprache: Englisch Gewicht in Gramm: 680. …

Leinen. Condición: Befriedigend. xvii,346 Seiten exBibliotheksexemplar mit den üblichen Stempeln/Signaturen, Kanten gering bestossen, papierbedingte Seitenbräunung /// Standort Wimregal MIR-30571 ISBN 9780444106209 WITHIN THE EU: shipping only to GERMANY and AUSTRIA due to the new EPR regulations. Sprache: Englisch Gewicht in Gramm: 659. …

paperback. Condición: New. Paperback Pages Number: 174 Language: Chinese. 10 of the decision-making tool for the business of every manager and business owners to provide guidance. practical and easy to understand! You can use business analysis to address the most important strategic and tactical challenges. Do not have knuckled down to study higher mathematics or complicated theory! 10 of the decision-making tool will lead you through the entire process of business analysis. it uses plain language to explain every one .…

XVII, 346 pp. -TEXT IN ENGLISH- Sprache: Englisch Gewicht in Gramm: 700 8vo. Hardcover, ex-library copy with back label, library signs and stamps, binding rubbed and partially stained / discolored, inside fine.

Condición: New.

Condición: As New. Unread book in perfect condition.

Condición: New.

Condición: New. In English.

Condición: New.

Condición: As New. Unread book in perfect condition.

Hardback. Condición: New. RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality and Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditionsDetailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and moreNew multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.…

Condición: New.

Condición: New. 2024. 1st Edition. hardcover. . . . . .

Condición: New. 1st edition NO-PA16APR2015-KAP.

Condición: New. 2024. 1st Edition. hardcover. . . . . . Books ship from the US and Ireland.

Condición: Gut. Zustand: Gut | Seiten: 384 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

Hardback. Condición: New. RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality and Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditionsDetailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and moreNew multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.…

Hardcover. Condición: gut. 2024. Reliability Prediction for Microelectronics In englischer Sprache. pages.

Editions du c.n.r.s. - Centre National de la Recherche Scientifique, Etablissement Public Régional Rhône-Alpes Université Lyon II - 1980 - In-8 broché, couverture illustrée - 80 pages - Nombreuses illustrations en N&B, in et hors-texte, dans l'ouvrage Bon état - Petit frottement avec manque de matière sur la tranche latérale de la 4ème de couverture - Petite tâche d'encre au niveau du coin inférieur de la couverture.…

Condición: New. PRINT ON DEMAND.