Reliability Prediction for Microelectronics

Idioma: inglés

Editorial: John Wiley and Sons Inc, US, 2024

1394210930 / 9781394210930

Librería: Rarewaves.com UK, London, Reino UnidoRarewaves.com UK

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RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality and Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditionsDetailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and moreNew multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.…

N° de ref. del artículo LU-9781394210930

Título
Reliability Prediction for Microelectronics
Autor
Joseph B. Bernstein, Alain Bensoussan, Emmanuel Bender
Editorial
John Wiley and Sons Inc, US
Año de publicación
2024
Estado
New
Encuadernación
Hardback
Idioma
inglés
ISBN 10
1394210930
ISBN 13
9781394210930
Peso del artículo
709 gramos

Rarewaves.com UK

London, Reino Unido

Vendedor de 5 estrellas

Vendedor de IberLibro desde 11 de junio de 2025

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