Isbn: 9789811008825 - cmos rf circuit design for reliability and variability (springerbriefs in reliability) (16 resultados)

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Condición: New. pp. 106.

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Paperback. Condición: Brand New. 112 pages. 9.00x6.00x0.50 inches. In Stock.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.…

Taschenbuch. Condición: Neu. CMOS RF Circuit Design for Reliability and Variability | Jiann-Shiun Yuan | Taschenbuch | SpringerBriefs in Applied Sciences and Technology | vi | Englisch | 2016 | Springer | EAN 9789811008825 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Condición: new. Questo è un articolo print on demand.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations. 112 pp. Englisch.…

Condición: New. Print on Demand pp. 106.

Condición: New. PRINT ON DEMAND pp. 106.

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book to address the effect of device reliability and process variations on the RF circuit performance degradations Present of all kinds RF circuits in the reliability examination Includes analytical equations, experimental data and sim.…

Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 112 pp. Englisch.…