ISBN: 9781482210200 - spatial point patterns: methodology and applications with r (chapman & hall/crc interdisciplinary statistics) (18 resultados)

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  • Idioma: Inglés

    Editorial: -, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Hardcover. Condición: Very Good. Spatial Point Patterns: Methodology and Applications with R (Chapman & Hall/CRC Interdisciplinary Statistics) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. …

  • Idioma: Inglés

    Editorial: Chapman and Hall/CRC 01/v /24 N, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Librería: Bahamut Media, Reading, Reino UnidoBahamut Media

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    Hardcover. Condición: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee.

  • Idioma: Inglés

    Editorial: Chapman and Hall/CRC 2015-11-24, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Librería: Chiron Media, Wallingford, Reino UnidoChiron Media

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    Hardcover. Condición: New. Brand new book, sourced directly from publisher. Dispatch time is 7-8 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.

  • Idioma: Inglés

    Editorial: Chapman and Hall/CRC, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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  • Idioma: Inglés

    Editorial: Chapman and Hall/CRC, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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  • Idioma: Inglés

    Editorial: Chapman and Hall/CRC, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Condición: As New. Unread book in perfect condition.

  • Idioma: Inglés

    Editorial: Chapman and Hall/CRC, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK

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  • Idioma: Inglés

    Editorial: Chapman and Hall/CRC, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Librería: California Books, Miami, FL, Estados Unidos de AmericaCalifornia Books

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  • Idioma: Inglés

    Editorial: Taylor & Francis Group, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Librería: Books Puddle, Woodside, NY, Estados Unidos de AmericaBooks Puddle

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    Condición: New. pp. 400.

  • Idioma: Inglés

    Editorial: Taylor & Francis Group, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios

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    Condición: New. pp. 400.

  • Idioma: Inglés

    Editorial: Taylor and Francis Inc, US, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Librería: Rarewaves.com USA, London, LONDO, Reino UnidoRarewaves.com USA

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    Hardback. Condición: New. Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional "structure," such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter. …

  • Idioma: Inglés

    Editorial: Chapman & Hall, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

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    Hardcover. Condición: Brand New. 810 pages. 9.00x7.00x2.00 inches. In Stock.

  • Idioma: Inglés

    Editorial: Taylor and Francis Inc, US, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Librería: Rarewaves.com UK, London, Reino UnidoRarewaves.com UK

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    Hardback. Condición: New. Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional "structure," such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter. …

  • Idioma: Inglés

    Editorial: Taylor & Francis Group, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books

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    Condición: New. pp. 400 This item is printed on demand.

  • Idioma: Inglés

    Editorial: Chapman And Hall/CRC Nov 2015, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

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    Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional 'structure,' such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter. 830 pp. Englisch.…

  • Idioma: Inglés

    Editorial: CRC Press, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    HRD. Condición: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

  • Idioma: Inglés

    Editorial: CRC Press, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    HRD. Condición: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

  • Idioma: Inglés

    Editorial: Chapman And Hall/CRC, 2015

    1482210207 / 9781482210200

    Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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    Buch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional 'structure,' such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter.…