ISBN: 9781482210200 - spatial point patterns: methodology and applications with r (chapman & hall/crc interdisciplinary statistics) (18 resultados)

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Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics
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Hardcover. Condición: Very Good. Spatial Point Patterns: Methodology and Applications with R (Chapman & Hall/CRC Interdisciplinary Statistics) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. …

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Editorial: Chapman and Hall/CRC 01/v /24 N, 2015
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Hardcover. Condición: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee.

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Editorial: Chapman and Hall/CRC 2015-11-24, 2015
Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics
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Editorial: Chapman and Hall/CRC, 2015
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Idioma: Inglés
Editorial: Chapman and Hall/CRC, 2015
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Idioma: Inglés
Editorial: Chapman and Hall/CRC, 2015
Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics
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Idioma: Inglés
Editorial: Chapman and Hall/CRC, 2015
Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics
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Librería: California Books, Miami, FL, Estados Unidos de AmericaCalifornia Books
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Editorial: Taylor & Francis Group, 2015
Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics
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Librería: Books Puddle, Woodside, NY, Estados Unidos de AmericaBooks Puddle
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Condición: New. pp. 400.

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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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Editorial: Taylor and Francis Inc, US, 2015
Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics
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Librería: Rarewaves.com USA, London, LONDO, Reino UnidoRarewaves.com USA
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Hardback. Condición: New. Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional "structure," such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter. …

Idioma: Inglés
Editorial: Chapman & Hall, 2015
Serie: Libro 1 de 1 - Chapman & Hall/CRC Interdisciplinary Statistics
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Hardcover. Condición: Brand New. 810 pages. 9.00x7.00x2.00 inches. In Stock.

Idioma: Inglés
Editorial: Taylor and Francis Inc, US, 2015
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Hardback. Condición: New. Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional "structure," such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter. …

Idioma: Inglés
Editorial: Taylor & Francis Group, 2015
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Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
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Condición: New. pp. 400 This item is printed on demand.

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Editorial: Chapman And Hall/CRC Nov 2015, 2015
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional 'structure,' such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter. 830 pp. Englisch.…

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Buch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional 'structure,' such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter.…