This book shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions. The book uses the authors’ R package spatstat throughout to process and analyze spatial point pattern data.
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Adrian Baddeley is a professor of computational statistics at Curtin University and a fellow of the Australian Academy of Science. He has been a leading researcher in spatial statistics for 40 years.
Ege Rubak is an associate professor in the world-renowned spatial statistics group at Aalborg University. His research focuses on spatial statistics and statistical computing.
Rolf Turner is retired and an Honorary Research Fellow at the University of Auckland, where he has taught a graduate course on spatial point processes in the Department of Statistics. He has considerable expertise in statistical computing and has worked as a statistician in the Division of Mathematics and Statistics at CSIRO, the University of New Brunswick, and the Starpath Project at the University of Auckland.
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional 'structure,' such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter. 830 pp. Englisch. Nº de ref. del artículo: 9781482210200
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