9781461426899 - soft errors in modern electronic systems: 41 (frontiers in electronic testing) (11 resultados)
Idioma: Inglés
Editorial: Springer, 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Taschenbuch. Condición: Neu. Soft Errors in Modern Electronic Systems | Michael Nicolaidis | Taschenbuch | Frontiers in Electronic Testing | xviii | Englisch | 2012 | Springer | EAN 9781461426899 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]c…om | Anbieter: preigu.
Idioma: Inglés
Editorial: Springer, 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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Condición: New. pp. 336.
Idioma: Inglés
Editorial: Springer, Humana, 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 179,61
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physica…l mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Idioma: Inglés
Editorial: Springer, 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
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EUR 232,55
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Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Idioma: Inglés
Editorial: Springer, 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 286,58
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Paperback. Condición: Brand New. 336 pages. 9.25x6.10x0.76 inches. In Stock.
Idioma: Inglés
Editorial: Springer, 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Condición: new. Questo è un articolo print on demand.
Idioma: Inglés
Editorial: Springer, Humana Nov 2012, 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 171,19
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fun…damental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004. 336 pp. Englisch.
Idioma: Inglés
Editorial: Springer US, 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: moluna, Greven, Alemaniamoluna
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EUR 144,94
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Kartoniert / Broschiert. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced…electronicsSoft Errors from Space to Ground: Historical Overv.
Idioma: Inglés
Editorial: Springer, Humana Nov 2012, 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
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EUR 171,19
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Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundame…ntal physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques.The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 336 pp. Englisch.
Idioma: Inglés
Editorial: Springer, 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
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EUR 243,76
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Condición: New. Print on Demand pp. 336 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Idioma: Inglés
Editorial: Springer, 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 244,24
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Condición: New. PRINT ON DEMAND pp. 336.
