michael nicolaidis (48 resultados)

Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:9781441950338.

Condición: New. In.

Condición: New. In.

Condición: New.

Condición: New.

Hardcover. Condición: New. BRAND NEW hardcover. Book.

Condición: New. pp. 164.

Condición: New. pp. 168.

Condición: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . .

Paperback. Condición: Brand New. 164 pages. 11.00x8.25x0.37 inches. In Stock.

Condición: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . . Books ship from the US and Ireland.

Condición: New. In.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Condición: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Condición: As New. Unread book in perfect condition.

Paperback. Condición: Like New. Like New. book.

Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condición: As New. Unread book in perfect condition.

Taschenbuch. Condición: Neu. Soft Errors in Modern Electronic Systems | Michael Nicolaidis | Taschenbuch | Frontiers in Electronic Testing | xviii | Englisch | 2012 | Springer | EAN 9781461426899 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Condición: New. pp. 336.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Hardcover. Condición: Brand New. 316 pages. 9.25x6.25x1.00 inches. In Stock.

Paperback. Condición: Brand New. 336 pages. 9.25x6.10x0.76 inches. In Stock.

48 pp.; 31.5 x 25 cm.; sewn bound; black-and-white & color; edition size unknown; unsigned and unnumbered; offset-printed Hardback variant of Studio International, Vol. 180, No. 924 (July / August 1970) containing only the conceptual catalogue for an exhibition that took place within the pages of the issue organized, and with an introduction by, Seth Siegelaub. Curated chapters by David Antin, Germano Celant, Michel Claura, Charles Harrison, Lucy R. Lippard, and Hans Strelow. Artists include Dan Graham, John Baldessari, Richard Serra, Eleanor Antin, Fred Lonidier, George Nicolaidis, Keith Sonnier, Giovanni Anselmo, Alighiero Boetti, Pier Paolo Calzolari, Mario Merz, Giuseppe Penone, Emilio Prini, Pistoletti, Gilberto Zorio, Daniel Buren, Keith Arnatt, Terry Atkinson, David Bainbridge, Harold Hurrell, Michael Baldwin, Victor Burgin, Joseph Kosuth, Barry Flanagan, John Latham, Roelof Louw, Robert Barry, Stephen Kaltenbach, Lawrence Weiner, On Kawara, Sol LeWitt, Douglas Huebler, N.E. Thing Co., Frederick Barthelme, Jan Dibbets, and Hanne Darboven. "This exhibition was organized by requesting six critics to each edit an 8-page section and in turn, to make available their section to the artist(s) that interest them." -- from Siegelaub's introduction. Text in English, German, and French. References : "Materializing Six Years : Lucy R. Lippard and the Emergence of Conceptual Art" by Catherine Morris, Vincent Bonin, Julia Bryan-Wilson. Brooklyn / Cambridge, NY / MA : Brooklyn Museum / MIT Press, 2012, pp. 39. "International General, Distributing Independently Produced Vanguard Art Books, Catalogues and Information" by Seth Siegelaub. New York, NY : International General, 1971. "Seth Siegelaub : Beyond Conceptual Art" by Leontine Coelewij, Sara Martinetti, Marja Bloem, Julia Bryan-Wilson, Jo Melvin, Götz Langkau, Matilda McQuaid, Alan Kennedy, Seth Siegelaub. Köln and Amsterdam, Germany / Netherlands : Verlag der Buchandlung Walther König / Stedelijk Museum, 2016, pp. 208-211. "Six Years, The Dematerialization of the Art Object from 1966 to 1972 : A Cross-Reference Book of Information on Some Esthetic Boundaries . / edited and annotated by Lucy R. Lippard." by Lucy R. Lippard. Praeger Publishers Inc., NY / DC : Praeger Publishers Inc., 1973, pp. 179. Good / Very Good. Curve to recto with mild rubbing of covers. Light yellowing of pages. Contents otherwise clean and unmarked.

Condición: new. Questo è un articolo print on demand.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. 164 pp. Englisch.

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design.