Nicolaidis michael (49 resultados)
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Librería: Anybook.com, Lincoln, Reino UnidoAnybook.com
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EUR 87,58
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Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:9781441950338.
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 115,42
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Condición: New. In.
Idioma: Inglés
Editorial: Springer 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 115,42
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Condición: New. In.
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Librería: GreatBookPrices, Columbia, Estados Unidos de AmericaGreatBookPrices
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EUR 130,78
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Condición: New.
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 115,40
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Condición: New.
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Librería: Books Puddle, New York, Estados Unidos de AmericaBooks Puddle
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EUR 135,10
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Condición: New. pp. 164.
Idioma: Inglés
Editorial: Springer 2010
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: Book Dispensary, Concord, CanadaBook Dispensary
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EUR 138,48
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Hardcover. Condición: New. BRAND NEW hardcover. Book.
Idioma: Inglés
Editorial: Springer 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: Books Puddle, New York, Estados Unidos de AmericaBooks Puddle
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EUR 143,62
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Condición: New. pp. 168.
Idioma: Inglés
Editorial: Kluwer Academic Publishers 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: Kennys Bookshop and Art Galleries Ltd., Galway, IrlandaKennys Bookshop and Art Galleries Ltd.
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EUR 134,16
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Condición: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicola…idis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . .
On Line-Testing for VLSI
Nicolaidis, Michael (Edited by)/ Zorian, Yervant (Edited by)/ Pradhan, Dhiraj K. (Edited by)
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 153,01
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Paperback. Condición: Brand New. 164 pages. 11.00x8.25x0.37 inches. In Stock.
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Librería: preigu, Osnabrück, Alemaniapreigu
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EUR 95,15
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Taschenbuch. Condición: Neu. On-Line Testing for VLSI | Michael Nicolaidis (u. a.) | Taschenbuch | iv | Englisch | 2010 | Springer | EAN 9781441950338 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Idioma: Inglés
Editorial: Kluwer Academic Publishers 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: Kennys Bookstore, Olney, Estados Unidos de AmericaKennys Bookstore
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EUR 168,26
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Condición: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicola…idis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . . Books ship from the US and Ireland.
Idioma: Inglés
Editorial: Springer 2010
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 164,21
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Condición: New. In.
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 112,77
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of… concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Idioma: Inglés
Editorial: Springer, Springer 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 114,36
Envío por EUR 62,63Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concur…rent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Idioma: Inglés
Editorial: Springer US 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: Buchpark, Trebbin, AlemaniaBuchpark
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EUR 78,55
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Condición: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurren…t error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 172,73
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Condición: As New. Unread book in perfect condition.
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Librería: Mispah books, Redhill, Reino UnidoMispah books
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EUR 163,21
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Paperback. Condición: Like New. Like New. book.
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Librería: GreatBookPrices, Columbia, Estados Unidos de AmericaGreatBookPrices
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EUR 195,54
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Condición: As New. Unread book in perfect condition.
Idioma: Inglés
Editorial: Springer 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: Mispah books, Redhill, Reino UnidoMispah books
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Como Nuevo
EUR 166,78
Envío por EUR 28,91Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Idioma: Inglés
Editorial: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: preigu, Osnabrück, Alemaniapreigu
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EUR 149,00
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Taschenbuch. Condición: Neu. Soft Errors in Modern Electronic Systems | Michael Nicolaidis | Taschenbuch | Frontiers in Electronic Testing | xviii | Englisch | 2012 | Springer | EAN 9781461426899 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]c…om | Anbieter: preigu.
Idioma: Inglés
Editorial: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: Books Puddle, New York, Estados Unidos de AmericaBooks Puddle
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EUR 223,86
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Condición: New. pp. 336.
Idioma: Inglés
Editorial: Springer, Humana 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 179,61
Envío por EUR 62,56Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physica…l mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Idioma: Inglés
Editorial: Springer Us 2010
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 179,61
Envío por EUR 63,24Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mecha…nisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Idioma: Inglés
Editorial: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: Mispah books, Redhill, Reino UnidoMispah books
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Como Nuevo
EUR 228,73
Envío por EUR 28,91Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Idioma: Inglés
Editorial: Springer Verlag 2010
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 249,16
Envío por EUR 14,46Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Hardcover. Condición: Brand New. 316 pages. 9.25x6.25x1.00 inches. In Stock.
Idioma: Inglés
Editorial: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 23 de 40. Libro 23 de 40 - Frontiers in Electronic Testing
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 281,87
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Paperback. Condición: Brand New. 336 pages. 9.25x6.10x0.76 inches. In Stock.
Editorial: Studio International and Seth Siegelaub London / New York, United Kingdom / US 1970
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Librería: Specific Object / David Platzker, New York, Estados Unidos de AmericaSpecific Object / David Platzker
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EUR 670,08
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Añadir al carrito48 pp.; 31.5 x 25 cm.; sewn bound; black-and-white & color; edition size unknown; unsigned and unnumbered; offset-printed Hardback variant of Studio International, Vol. 180, No. 924 (July / August 1970) containing only the conceptual catalogue for an exhibition that took place within the pages of the issue organized, and with an… introduction by, Seth Siegelaub. Curated chapters by David Antin, Germano Celant, Michel Claura, Charles Harrison, Lucy R. Lippard, and Hans Strelow. Artists include Dan Graham, John Baldessari, Richard Serra, Eleanor Antin, Fred Lonidier, George Nicolaidis, Keith Sonnier, Giovanni Anselmo, Alighiero Boetti, Pier Paolo Calzolari, Mario Merz, Giuseppe Penone, Emilio Prini, Pistoletti, Gilberto Zorio, Daniel Buren, Keith Arnatt, Terry Atkinson, David Bainbridge, Harold Hurrell, Michael Baldwin, Victor Burgin, Joseph Kosuth, Barry Flanagan, John Latham, Roelof Louw, Robert Barry, Stephen Kaltenbach, Lawrence Weiner, On Kawara, Sol LeWitt, Douglas Huebler, N.E. Thing Co., Frederick Barthelme, Jan Dibbets, and Hanne Darboven. "This exhibition was organized by requesting six critics to each edit an 8-page section and in turn, to make available their section to the artist(s) that interest them." -- from Siegelaub's introduction. Text in English, German, and French. References : "Materializing Six Years : Lucy R. Lippard and the Emergence of Conceptual Art" by Catherine Morris, Vincent Bonin, Julia Bryan-Wilson. Brooklyn / Cambridge, NY / MA : Brooklyn Museum / MIT Press, 2012, pp. 39. "International General, Distributing Independently Produced Vanguard Art Books, Catalogues and Information" by Seth Siegelaub. New York, NY : International General, 1971. "Seth Siegelaub : Beyond Conceptual Art" by Leontine Coelewij, Sara Martinetti, Marja Bloem, Julia Bryan-Wilson, Jo Melvin, Götz Langkau, Matilda McQuaid, Alan Kennedy, Seth Siegelaub. Köln and Amsterdam, Germany / Netherlands : Verlag der Buchandlung Walther König / Stedelijk Museum, 2016, pp. 208-211. "Six Years, The Dematerialization of the Art Object from 1966 to 1972 : A Cross-Reference Book of Information on Some Esthetic Boundaries . / edited and annotated by Lucy R. Lippard." by Lucy R. Lippard. Praeger Publishers Inc., NY / DC : Praeger Publishers Inc., 1973, pp. 179. Good / Very Good. Curve to recto with mild rubbing of covers. Light yellowing of pages. Contents otherwise clean and unmarked.
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Librería: Brook Bookstore On Demand, Napoli, ItaliaBrook Bookstore On Demand
Contactar con el vendedorVendedor de 3 estrellasCondición: Nuevo
EUR 86,24
Envío por EUR 5,50Se envía de Italia a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: new. Questo è un articolo print on demand.
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 106,99
Envío por EUR 23,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includ…es the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. 164 pp. Englisch.
