Paul k predecki (91 resultados)

Hardcover. Condición: Fine. Estado de la sobrecubierta: Fine. First Edition. Previous owner's blindstamp, otherwise a fine hardcover copy in a fine mylar protected DJ, white spine.

Hardcover. Condición: Fine. Estado de la sobrecubierta: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.

Hardcover. Condición: Fine. Estado de la sobrecubierta: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.

Hardcover. Condición: Very Good. Hardcover; Volume 32 only; proceedings of the 37th annual conference on App lications of X-Ray Analysis, held August 1-5, 1988, in Steamboat Springs, C olorado; light fading and shelf wear to exterior; former owner's stamping o n front endpaper; a few small spots at top page edge; in very good conditio n with clean text, firm binding. Dust jacket shows light scuffing and shelf wear.…

Hardcover. Condición: Very Good. Hardcover; Volume 29 only; proceedings of the 34th annual conference on App lications of X-Ray Analysis, held August 5-9, 1985, in Snowmass, Colorado; light fading and shelf wear to exterior; light stain at top page corners; f ade spots to endpapers; in very good condition with clean text, firm bindin g. Dust jacket shows scuffing, light soiling, and a few small edge tears.…

Hardcover. Condición: Fine. Estado de la sobrecubierta: Fine. First Edition. Previous owner's blindstamp, otherwise a fine hardcover copy in a fine mylar protected DJ, white spine.

Condición: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condición: New.

Condición: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condición: New.

Condición: New. pp. 1334.

Condición: As New. Unread book in perfect condition.

Condición: New. pp. 1334 1st Edition.

Condición: New. pp. 1334.

Condición: New. pp. 412 Index.

Condición: New. pp. 648.

Condición: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condición: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.…

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index. …

Condición: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.…

Taschenbuch. Condición: Neu. Advances in X-Ray Analysis | Volume 28 | Paul K. Predecki (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2011 | Springer US | EAN 9781461294993 | Verantwortliche Person für die EU: Springer Heidelberg, Tiergartenstr. 17, 69121 Heidelberg, buchhandel-buch[at]springer[dot]com | Anbieter: preigu. …

Taschenbuch. Condición: Neu. Advances in X-Ray Analysis | Volume 35B | C. S. Barrett (u. a.) | Taschenbuch | iv | Englisch | 2012 | Springer | EAN 9781461365327 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Condición: New. pp. 932 68:B&W 7 x 10 in or 254 x 178 mm Case Laminate on White w/Gloss Lam.

Condición: New. pp. 932.

Condición: New. pp. 932.

Gebunden. Condición: New. Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrument.

Condición: Very Good. *Price HAS BEEN REDUCED by 10% until Monday, Nov. 9 (weekend SALE item)* 813 pp., hardcover, minor library markings else text clean & binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.…

Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condición: As New. Unread book in perfect condition.

Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.