Ibe eishi h (30 resultados)
Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Kanekawa, Nobuyasu; Ibe, Eishi H.; Suga, Takashi; Uematsu, Yutaka
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 115,39
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Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Kanekawa, Nobuyasu; Ibe, Eishi H.; Suga, Takashi; Uematsu, Yutaka
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 115,39
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Dependability in Electronic Systems : Mitigation of Hardware Failures, Soft Errors, and Electro-magnetic Disturbances
Kanekawa, Nobuyasu; Ibe, Eishi H.; Suga, Takashi; Uematsu, Yutaka
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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Dependability in Electronic Systems : Mitigation of Hardware Failures, Soft Errors, and Electro-magnetic Disturbances
Kanekawa, Nobuyasu; Ibe, Eishi H.; Suga, Takashi; Uematsu, Yutaka
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 130,77
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Dependability in Electronic Systems : Mitigation of Hardware Failures, Soft Errors, and Electro-magnetic Disturbances
Kanekawa, Nobuyasu; Ibe, Eishi H.; Suga, Takashi; Uematsu, Yutaka
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 115,38
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 143,53
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Condición: New. pp. 232.
Dependability in Electronic Systems: Mitigation of Hardware.
Kanekawa, Nobuyasu; Ibe, Eishi H.; Suga, Takashi; Uematsu, Yutaka
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 159,28
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Condición: New. pp. 232.
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 152,44
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Condición: As New. Unread book in perfect condition.
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Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
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EUR 142,93
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Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 174,51
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 191,35
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Condición: New.
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Librería: Rarewaves USA, OSWEGO, IL, Estados Unidos de AmericaRarewaves USA
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EUR 193,70
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Hardback. Condición: New. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons an…d heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 176,16
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Condición: New.
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Librería: Majestic Books, Hounslow, , Reino UnidoMajestic Books
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EUR 188,17
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Condición: New. pp. 400.
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Librería: Buchpark, Trebbin, , AlemaniaBuchpark
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EUR 85,75
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Condición: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbancesby: Nobuyasu Kanekawa Eishi H. IbeTakashi Suga Yutaka Uematsu The importance of "dependability" in electronic systems is obvious, es…pecially in safety-critical or mission-critical applications. Dependability hinges on matters such as failure causes and countermeasures for soft/hard -errors in semiconductor devices, electro-magnetic interferences, power integration, and system architecture.This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples.Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability. ¿Provides a set of valuable techniques to design dependability into embedded systems;¿Offers fault mitigation techniques widely applicable in general control systems in space and ground-based transportation systems; ¿Presents fundamentals of soft-errors in semiconductor devices and their impacts and countermeasures in electronic systems such as network servers and routers;¿Describes fundamentals of electro-magnetic interference and practical countermeasures in many industrial applications;¿Discusses vulnerability in power supply systems and how power integration is accomplished.
Dependability in Electronic Systems : Mitigation of Hardware Failures, Soft Errors, and Electro-magnetic Disturbances
Kanekawa, Nobuyasu; Ibe, Eishi H.; Suga, Takashi; Uematsu, Yutaka
- Tapa dura
Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 183,41
Envío por EUR 17,35Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: As New. Unread book in perfect condition.
Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Kanekawa, Nobuyasu, Ibe, Eishi H., Suga, Takashi, Uematsu, Y
- Tapa dura
Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Como Nuevo
EUR 173,89
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Hardcover. Condición: Like New. Like New. book.
Dependability in Electronic Systems : Mitigation of Hardware Failures, Soft Errors, and Electro-magnetic Disturbances
Kanekawa, Nobuyasu; Ibe, Eishi H.; Suga, Takashi; Uematsu, Yutaka
- Tapa dura
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 206,39
Envío por EUR 2,27Se envía dentro de Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: As New. Unread book in perfect condition.
Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Kanekawa, Nobuyasu, Ibe, Eishi H., Suga, Takashi, Uematsu, Y
- Tapa blanda
Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Como Nuevo
EUR 184,61
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Paperback. Condición: Like New. Like New. book.
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Librería: Revaluation Books, Exeter, , Reino UnidoRevaluation Books
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EUR 201,13
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Hardcover. Condición: Brand New. 268 pages. 9.50x6.75x1.00 inches. In Stock.
Dependability in Electronic Systems : Mitigation of Hardware Failures, Soft Errors, and Electro-magnetic Disturbances
Kanekawa, Nobuyasu; Ibe, Eishi H.; Suga, Takashi; Uematsu, Yutaka
- Tapa blanda
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 217,42
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Condición: As New. Unread book in perfect condition.
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- Primera edición
Librería: CitiRetail, Stevenage, Reino UnidoCitiRetail
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EUR 176,26
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Hardcover. Condición: new. Hardcover. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays,… neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
- Tapa dura
Librería: Rarewaves USA United, OSWEGO, IL, Estados Unidos de AmericaRarewaves USA United
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 176,15
Envío por EUR 43,07Se envía dentro de Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Hardback. Condición: New. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons an…d heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
- Tapa dura
Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 206,45
Envío por EUR 63,46Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Buch. Condición: Neu. Neuware - This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutr…ons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation.\* Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms\* Covers both terrestrial and avionic-level conditions\* Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary\* Written by a widely-recognized authority in soft-errors in electronic devices\* Code samples available for download from the Companion WebsiteThis book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
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- Impresión bajo demanda
Librería: moluna, Greven, , Alemaniamoluna
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EUR 93,00
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a set of valuable techniques to design dependability into embedded systemsDescribes fundamentals of electro-magnetic interference and practical countermeasures in many industrial applicationsDiscusses vulnera…bility in power supply systems and how.
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- Impresión bajo demanda
Librería: moluna, Greven, , Alemaniamoluna
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 100,39
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a set of valuable techniques to design dependability into embedded systemsDescribes fundamentals of electro-magnetic interference and practical countermeasures in many industrial applicationsDiscusses vulnera…bility in power supply systems and how.
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- Impresión bajo demanda
Librería: Majestic Books, Hounslow, , Reino UnidoMajestic Books
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EUR 149,75
Envío por EUR 7,52Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. Print on Demand pp. 232 Illus.
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 149,07
Envío por EUR 9,95Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. PRINT ON DEMAND pp. 232.
Dependability in Electronic Systems: Mitigation of Hardware.
Kanekawa, Nobuyasu; Ibe, Eishi H.; Suga, Takashi; Uematsu, Yutaka
- Tapa blanda
- Impresión bajo demanda
Librería: Majestic Books, Hounslow, , Reino UnidoMajestic Books
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 165,84
Envío por EUR 7,52Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. Print on Demand pp. 232.
Dependability in Electronic Systems: Mitigation of Hardware.
Kanekawa, Nobuyasu; Ibe, Eishi H.; Suga, Takashi; Uematsu, Yutaka
- Tapa blanda
- Impresión bajo demanda
Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 168,37
Envío por EUR 9,95Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. PRINT ON DEMAND pp. 232.
