I akasaki (24 resultados)

Condición: New.

Condición: New.

Hardback or Cased Book. Condición: New. Defect and Impurity Engineered Semiconductors and Devices: Volume 378. Book.

Hardcover. Condición: As New. Topical Workshop on III-V Nitrides; 21-23 Sept. 1995 (TWN'95); Nagoya Japan. Illus. 4to; Fine in hardcover. 389 pp. > Language: English | > Media/Binding: Hardcover |.

Condición: As New. Unread book in perfect condition.

hardcover. Condición: Good. MRS, Materials Research Society, Pittsburgh. c.1995, 8vo. cloth, 1054pp., dj from a neighboring book partly peeled onto rear cover, ow VG $.

Hardcover. Near Fine, lower corner lightly bumped else as new. Hardcover, 7.8x11", 389 pp./ . . .

Condición: As New. Unread book in perfect condition.

Hardback. Condición: New. Defect engineering has come of age. That theme is well documented by both the academic and industrial research communities in this book from MRS. Going beyond defect control, the book explores the engineering of desired properties in semiconductor materials and devices through the deliberate introduction and manipulation of defects and impurities. Papers are grouped around ten distinct topics covering materials, processing and devices. Topics include: grown-in defects in bulk crystals; grown-in defects in thin films; gettering and related phenomena; hydrogen interaction with semiconductors; defect issues in widegap semiconductors; defect characterization; ion implantation and process-induced defects; defects in devices; interfaces, quantum wells and superlattices; and defect properties, reaction, activation and passivation.…

Condición: New. In English.

Condición: New.

Condición: New. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Editor(s): Akasaki, I. (Meijo University, Japan); Ashok, S.; Chevallier, J.; Johnson, N. M.; Sopori, B. L. Series: MRS Proceedings. Num Pages: 1082 pages, black & white illustrations. BIC Classification: TGM; TJFD5. Category: (U) Tertiary Education (US: College). Dimension: 229 x 152 x 56. Weight in Grams: 1600. . 1995. 1st Edition. hardcover. . . . .…

Condición: New. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Editor(s): Akasaki, I. (Meijo University, Japan); Ashok, S.; Chevallier, J.; Johnson, N. M.; Sopori, B. L. Series: MRS Proceedings. Num Pages: 1082 pages, black & white illustrations. BIC Classification: TGM; TJFD5. Category: (U) Tertiary Education (US: College). Dimension: 229 x 152 x 56. Weight in Grams: 1600. . 1995. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.…

Hardcover. Condición: Brand New. 1054 pages. 9.40x6.40x2.20 inches. In Stock.

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Defect engineering has come of age. That theme is well documented by both the academic and industrial research communities in this book from MRS. Going beyond defect control, the book explores the engineering of desired properties in semiconductor materials and devices through the deliberate introduction and manipulation of defects and impurities. Papers are grouped around ten distinct topics covering materials, processing and devices. Topics include: grown-in defects in bulk crystals; grown-in defects in thin films; gettering and related phenomena; hydrogen interaction with semiconductors; defect issues in widegap semiconductors; defect characterization; ion implantation and process-induced defects; defects in devices; interfaces, quantum wells and superlattices; and defect properties, reaction, activation and passivation.…

Hardback. Condición: New. Defect engineering has come of age. That theme is well documented by both the academic and industrial research communities in this book from MRS. Going beyond defect control, the book explores the engineering of desired properties in semiconductor materials and devices through the deliberate introduction and manipulation of defects and impurities. Papers are grouped around ten distinct topics covering materials, processing and devices. Topics include: grown-in defects in bulk crystals; grown-in defects in thin films; gettering and related phenomena; hydrogen interaction with semiconductors; defect issues in widegap semiconductors; defect characterization; ion implantation and process-induced defects; defects in devices; interfaces, quantum wells and superlattices; and defect properties, reaction, activation and passivation.…

Condición: New. Satisfaction Guaranteed or your money back.

Paperback. Condición: Very Good.

Condición: Sehr gut. Gebraucht - Sehr gut * very good, clean condition, no markings in text *.

Condición: New. Print on Demand pp. 1054.

Condición: New. PRINT ON DEMAND pp. 1054.

Condición: New. Print on Demand pp. 1054.

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Defect engineering has come of age. That theme is well documented by both the academic and industrial research communities in this book from MRS. Going beyond defect control, the book explores the engineering of desired properties in semiconductor materials.…

Buch. Condición: Neu. Defect and Impurity Engineered Semiconductors and Devices | I. Akasaki (u. a.) | Buch | Gebunden | Englisch | 1995 | Cambridge University Press | EAN 9781558992818 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.…