Surface analysis polymers xps de briggs (26 resultados)

Soft cover. Condición: Good. No Jacket. Condition : Good. Former university library copy with associated markings. Soft cover, no jacket. 198pp. No annotations or highlighting. Covered in protective laminate. Photo on request.

Condición: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.…

Condición: New.

Condición: New. In English.

Condición: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | The book describes the development of two powerful techniques for polymer surface studies.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.…

Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condición: New.

Condición: New. The book describes the development of two powerful techniques for polymer surface studies. Series Editor(s): Clarke, D. R.; Suresh, S.; Ward, I. M. Series: Cambridge Solid State Science Series. Num Pages: 214 pages, 119 b/w illus. 19 tables. BIC Classification: PNN; TG. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 13. Weight in Grams: 605. . 1998. hardcover. . . . . …

Condición: New. In English.

Condición: New. The book describes the development of two powerful techniques for polymer surface studies. Series Editor(s): Clarke, D. R.; Suresh, S.; Ward, I. M. Series: Cambridge Solid State Science Series. Num Pages: 214 pages, 119 b/w illus. 19 tables. BIC Classification: PNN; TG. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 13. Weight in Grams: 605. . 1998. hardcover. . . . . Books ship from the US and Ireland. …

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.…

Condición: New. Print on Demand pp. 216 Illus.

Condición: New. Print on Demand pp. 216.

Condición: New. PRINT ON DEMAND pp. 216.

Paperback / softback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

Paperback. Condición: new. Paperback. This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis. The book describes the development of two powerful techniques for polymer surface studies. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The book describes the development of two powerful techniques for polymer surface studies.Inhaltsverzeichnis1. Introduction 2. X-ray photoelectron spectroscopy (XPS) 3. Information from polymer XPS 4. Static secondary ion mass sp.…

Taschenbuch. Condición: Neu. Surface Analysis of Polymers by XPS and Static Sims | D. Briggs | Taschenbuch | Kartoniert / Broschiert | Englisch | 2005 | Cambridge University Press | EAN 9780521017534 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand. …

Condición: New. Print on Demand pp. 214.

Condición: New. Print on Demand pp. 214 119 Illus.

Condición: New. PRINT ON DEMAND pp. 214.

Hardcover. Condición: new. Hardcover. This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis. The book describes the development of two powerful techniques for polymer surface studies. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The book describes the development of two powerful techniques for polymer surface studies.Inhaltsverzeichnis1. Introduction 2. X-ray photoelectron spectroscopy (XPS) 3. Information from polymer XPS 4. Static secondary ion mass sp.…

Hardback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

Buch. Condición: Neu. Surface Analysis of Polymers by XPS and Static Sims | D. Briggs | Buch | Gebunden | Englisch | 2011 | Cambridge University Press | EAN 9780521352222 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.…