Multi run memory tests pattern de mrozek ireneusz (31 resultados)

X, 135 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.

Condición: New.

Hardback or Cased Book. Condición: New. Multi-Run Memory Tests for Pattern Sensitive Faults. Book.

Condición: New.

Condición: As New. Unread book in perfect condition.

Condición: New.

Condición: New. In English.

Condición: New. In English.

PF. Condición: New.

Condición: New.

Condición: New. Softcover reprint of the original 1st ed. 2019 edition NO-PA16APR2015-KAP.

Condición: New.

Condición: New.

Condición: As New. Unread book in perfect condition.

Hardcover. Condición: Brand New. 148 pages. 9.25x6.10x0.67 inches. In Stock.

Condición: New.

Condición: New.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations.…

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations.…

Taschenbuch. Condición: Neu. Multi-run Memory Tests for Pattern Sensitive Faults | Ireneusz Mrozek | Taschenbuch | x | Englisch | 2019 | Springer | EAN 9783030081980 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Paperback. Condición: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condición: new. Questo è un articolo print on demand.

Condición: new. Questo è un articolo print on demand.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations. 148 pp. Englisch.…

Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations. 148 pp. Englisch.…

Condición: New. Print on Demand.

Condición: New. PRINT ON DEMAND.

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing processPresents practical algorithms for design and implementation of efficient multi-run testsDemonstrates method.…

Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing processPresents practical algorithms for design and implementation of efficient multi-run testsDemonstrates method.…

Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 148 pp. Englisch.…