Digital integrated circuit testing de hnatek eugene (21 resultados)

HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.

Condición: New.

HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.

Hardcover. Condición: New. Brand new book, sourced directly from publisher. Dispatch time is 9-10 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.

Condición: As New. Unread book in perfect condition.

Condición: New.

Condición: As New. Unread book in perfect condition.

Buch. Condición: Neu. Neuware -Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a.…

Hardback. Condición: New. New copy - Usually dispatched within 4 working days.

Condición: New. In English.

Condición: New. pp. 196.

Buch. Condición: Neu. Neuware - Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a.…

Buch. Condición: Neu. Digital Integrated Circuit Testing from a Quality Perspective | Eugene R. Hnatek | Buch | Einband - fest (Hardcover) | Englisch | 1993 | Springer US | EAN 9780442006433 | Verantwortliche Person für die EU: Springer Nature Customer Service Center GmbH, Europaplatz 3, 69115 Heidelberg, productsafety[at]springernature[dot]com | Anbieter: preigu.…

Buch. Condición: Neu. Neuware -Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a 194 pp. Englisch.…

Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a 194 pp. Englisch.…

Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a 194 pp. Englisch.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Preface. Part One: Pharyngolaryngectomy: reconstruction by myocutaneous flaps Pharyngolaryngectomy: reconstruction by free jejunal transfer with microvascular anastomosis Pharyngolaryngo-oesophagectomy: reconstruction by colonic transposition Pharyng.…

Hardcover. Condición: Brand New. 9.50x6.25x0.75 inches. In Stock. This item is printed on demand.

Condición: New. Print on Demand pp. 196 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from aSpringer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 194 pp. Englisch.…

Condición: New. PRINT ON DEMAND pp. 196.