Defect microstructure analysis diffraction (16 resultados)

Condición: New. Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction. Editor(s): Snyder, Robert; Fiala, Jaroslav; Bunge, Hans J. Series: International Union of Crystallography - Monographs on Crystallography. Num Pages: 808 pages, numerous line figures. BIC Classification: PNT. Category: (P) Professional & Vocational. Dimension: 238 x 164 x 49. Weight in Grams: 1292. . 2000. Hardback. . . . .…

Condición: New.

Condición: As New. Unread book in perfect condition.

Condición: New.

Condición: New. Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction. Editor(s): Snyder, Robert; Fiala, Jaroslav; Bunge, Hans J. Series: International Union of Crystallography - Monographs on Crystallography. Num Pages: 808 pages, numerous line figures. BIC Classification: PNT. Category: (P) Professional & Vocational. Dimension: 238 x 164 x 49. Weight in Grams: 1292. . 2000. Hardback. . . . . Books ship from the US and Ireland.…

Condición: As New. Unread book in perfect condition.

Condición: New. In English.

Hardcover. Condición: New. In shrink wrap. Looks like an interesting title.

Hardcover. Condición: new. Hardcover. Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With the advent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles to broaden and sometimes to become asymmetric. Thus, information on the realstructure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book providesa comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays thefoundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in aspecimen. This book provides a complete summary of the developments of the twentieth century and points the way. This book reviews the state of the art for determining the "real" structure of matter. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.…

Condición: new. Questo è un articolo print on demand.

HRD. Condición: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

Hardcover. Condición: new. Hardcover. Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With the advent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles to broaden and sometimes to become asymmetric. Thus, information on the realstructure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book providesa comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays thefoundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in aspecimen. This book provides a complete summary of the developments of the twentieth century and points the way. This book reviews the state of the art for determining the "real" structure of matter. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

Hardcover. Condición: new. Hardcover. Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With the advent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles to broaden and sometimes to become asymmetric. Thus, information on the realstructure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book providesa comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays thefoundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in aspecimen. This book provides a complete summary of the developments of the twentieth century and points the way. This book reviews the state of the art for determining the "real" structure of matter. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Condición: New. Print on Demand pp. 808.

Condición: New. PRINT ON DEMAND pp. 808.

Condición: New. Print on Demand pp. 808 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.