Fiala jaroslav (13 resultados)
Editorial: Süddeutsches Archiv München 2002
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Librería: Andreas Schüller, Chemnitz, AlemaniaAndreas Schüller
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Softcover. Condición: Gut. 1. Auflage. Aus dem Inhalt: Museumslandschaft Bayern. Die Museen in Mähren und Schlesien -derzeitige Ausgangslage und Zukunftsperspektiven. Das Museumswesen in der Tschechoslowakei. Archive und Archivarbeit in bayern. Archivarbeit in der CSFR. Zusammenarbeit der Museen in Bayern und in der CSFR. Beispi…ele und Tendenzen. Zusammenarbeit auf dem Weg zur Normalität. Das Egerlandmuseum in Marktredwitz. Die Konföderation der Egerländer Museen und ihre Zusammenarbeit mit Museen in Bayern. Das Museum in Eger. Die Zusammenarbeit der Museen im Landkreis Tirschenreuth mit Museen in Böhmen. Das Museum des Chodenlandes in Domazlice/Taus, Grenzüberschreitende Zusammenarbeit der Museen des Landkreises Cham mit Böhmen. Die Wallfahrt der Böhmen nach Neukirchen beim Hl. Blut und ihre Darstellung im neuen Wallfahrtsmuseum. Das Böhmerwaldmuseum Schüttenhofen-Bergreichenstein. Bauernhäuser in Südböh,em-eine zweisprachige Sonderausstellung des freilichtmuseums Finsterau. Zur Problematik der Freilichtmuseen in Südböhmen. Deutschsprachige Tondokumente aus Böhmen. Zur Benutzung von historischen Tonaufzeichnungen in Ausstellungen. Das Kreisarchiv in Teplitz. Die Zusammenarbeit sächsischer und tschechischer Museen. Entwicklungsperspektiven slowakischer Museen und Galerien-die Karpatendeutschen. Museumsarbeit heute: Tendenzen-Inhalte-Organisationen. Frainer Bildgeschirr und Umdruck auf Steingut im alten Österreich. Die älteste Gmundener Fayence. Zweihundert Jahre Schlaggenwalder Porzellan. Zur Frage des Hundskopfmotivs bei den Tauser Choden. Die Prunkstube im Balthashof in Stadl im Böhmerwald. Loretoheiligtümer in Mähren, Böhmen und Schlesien Aus dem Inhalt: Museumslandschaft Bayern. Die Museen in Mähren und Schlesien -derzeitige Ausgangslage und Zukunftsperspektiven. Das Museumswesen in der Tschechoslowakei. Archive und Archivarbeit in bayern. Archivarbeit in der CSFR. Zusammenarbeit der Museen in Bayern und in der CSFR. Beispiele und Tendenzen. Zusammenarbeit auf dem Weg zur Normalität. Das Egerlandmuseum in Marktredwitz. Die Konföderation der Egerländer Museen und ihre Zusammenarbeit mit Museen in Bayern. Das Museum in Eger. Die Zusammenarbeit der Museen im Landkreis Tirschenreuth mit Museen in Böhmen. Das Museum des Chodenlandes in Domazlice/Taus, Grenzüberschreitende Zusammenarbeit der Museen des Landkreises Cham mit Böhmen. Die Wallfahrt der Böhmen nach Neukirchen beim Hl. Blut und ihre Darstellung im neuen Wallfahrtsmuseum. Das Böhmerwaldmuseum Schüttenhofen-Bergreichenstein. Bauernhäuser in Südböh,em-eine zweisprachige Sonderausstellung des freilichtmuseums Finsterau. Zur Problematik der Freilichtmuseen in Südböhmen. Deutschsprachige Tondokumente aus Böhmen. Zur Benutzung von historischen Tonaufzeichnungen in Ausstellungen. Das Kreisarchiv in Teplitz. Die Zusammenarbeit sächsischer und tschechischer Museen. Entwicklungsperspektiven slowakischer Museen und Galerien-die Karpatendeutschen. Museumsarbeit heute: Tendenzen-Inhalte-Organisationen. Frainer Bildgeschirr und Umdruck auf Steingut im alten Österreich. Die älteste Gmundener Fayence. Zweihundert Jahre Schlaggenwalder Porzellan. Zur Frage des Hundskopfmotivs bei den Tauser Choden. Die Prunkstube im Balthashof in Stadl im Böhmerwald. Loretoheiligtümer in Mähren, Böhmen und Schlesien u.v.m. u.v.m. Leichte Gebrauchsspuren, Ecken etwas bestoßen,Namenseinkleber im Vorsatz. J92 In deutscher Sprache. 398 pages. 165x240cm.
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Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
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Condición: New. Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray d…iffraction. Editor(s): Snyder, Robert; Fiala, Jaroslav; Bunge, Hans J. Series: International Union of Crystallography - Monographs on Crystallography. Num Pages: 808 pages, numerous line figures. BIC Classification: PNT. Category: (P) Professional & Vocational. Dimension: 238 x 164 x 49. Weight in Grams: 1292. . 2000. Hardback. . . . .
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Condición: New. Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray d…iffraction. Editor(s): Snyder, Robert; Fiala, Jaroslav; Bunge, Hans J. Series: International Union of Crystallography - Monographs on Crystallography. Num Pages: 808 pages, numerous line figures. BIC Classification: PNT. Category: (P) Professional & Vocational. Dimension: 238 x 164 x 49. Weight in Grams: 1292. . 2000. Hardback. . . . . Books ship from the US and Ireland.
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Librería: BennettBooksLtd, Los Angeles, CA, Estados Unidos de AmericaBennettBooksLtd
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Hardcover. Condición: New. In shrink wrap. Looks like an interesting title.
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Hardcover. Condición: new. Hardcover. Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With the… advent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles to broaden and sometimes to become asymmetric. Thus, information on the realstructure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book providesa comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays thefoundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in aspecimen. This book provides a complete summary of the developments of the twentieth century and points the way. This book reviews the state of the art for determining the "real" structure of matter. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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Hardcover. Condición: new. Hardcover. Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With the… advent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured.In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles to broaden and sometimes to become asymmetric. Thus, information on the realstructure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book providesa comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays thefoundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in aspecimen. This book provides a complete summary of the developments of the twentieth century and points the way. This book reviews the state of the art for determining the "real" structure of matter. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
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Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Hardcover. Condición: new. Hardcover. Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With the… advent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles to broaden and sometimes to become asymmetric. Thus, information on the realstructure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book providesa comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays thefoundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in aspecimen. This book provides a complete summary of the developments of the twentieth century and points the way. This book reviews the state of the art for determining the "real" structure of matter. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
