Defect fault tolerance vlsi (43 resultados)

hard cover. Condición: Very Good. No Jacket. Illustrated in black and white. 305 pages VG. Slight shelf wear to covers, overall very good condition.

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Soft cover. Condición: As New. I.E.E.E.Press/ Computer Society 2000 paperback 422 pages full of statistics, minor shelfwear but this is A BRAND NEW BOOK UNUSED. Full refund if not satisfied. 24 hour despatch via Insured for. If not pictured in this listing, a scan of the actual book is available on request.…

Condición: New. pp. 380.

Paperback. Condición: Brand New. reprint edition. 374 pages. 9.45x6.61x0.86 inches. In Stock.

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Softcover. Condición: Very Good. No Jacket. First Edition. Ex research library book. The covers look great. The binding is tight. The interior pages are clean and unmarked. Electronic delivery tracking will be issued free of charge.

Condición: New. pp. 332.

Condición: New. Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of def.

Condición: New. pp. 336.

Paperback. Condición: Brand New. reprint edition. 329 pages. 10.00x7.01x0.75 inches. In Stock.

Buch. Condición: Neu. Neuware - Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an 'International Workshop on Designing for Yield' at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the 'IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems' in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.…

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hardcover. Condición: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condición: new. Questo è un articolo print on demand.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized. 380 pp. Englisch.…

Condición: new. Questo è un articolo print on demand.