International Workshop Proceedings (Defect and Fault Tolerance in VLSI Systems) - Tapa dura

Institute Of Electrical And Electronics Engineers

 
9780818628351: International Workshop Proceedings (Defect and Fault Tolerance in VLSI Systems)
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ISBN 10: 0818628359 ISBN 13: 9780818628351
Editorial: IEEE Computer Society Press,U.S., 1993

Sinopsis

Nearly three dozen papers from the November 1992 conference in Dallas, Texas, discuss methods of testing the large circuits used in microelectronics. The sections cover defect and yield modeling, fault tolerant arrays and systems, testing, concurrent error detection, system fault diagnosis, defect and fault modeling, defect tolerance, fault tolerant arithmetics, system testing, and routing for defect tolerance. In addition, invited speakers discuss the WASP project, and the lessons from designing a wafer scale 2D array. No subject index. Annotation copyright Book News, Inc. Portland, Or.

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Reseña del editor

Nearly three dozen papers from the November 1992 conference in Dallas, Texas, discuss methods of testing the large circuits used in microelectronics. The sections cover defect and yield modeling, fault tolerant arrays and systems, testing, concurrent error detection, system fault diagnosis, defect and fault modeling, defect tolerance, fault tolerant arithmetics, system testing, and routing for defect tolerance. In addition, invited speakers discuss the WASP project, and the lessons from designing a wafer scale 2D array. No subject index. Annotation copyright Book News, Inc. Portland, Or.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
IEEE Computer Society Press,U.S.
Año de publicación
1993
Idioma
Inglés
ISBN 10 
0818628359
ISBN 13 
9780818628351
Encuadernación
Tapa dura
Número de páginas
352
Contacto del fabricante
no disponible
Persona responsable
no disponible