9789048178766 - new methods of concurrent checking: 42 (frontiers in electronic testing) de gössel, michael (11 resultados)
Idioma: Inglés
Editorial: Springer, 2010
Serie: Frontiers in Electronic Testing, Libro 20 de 40. Libro 20 de 40 - Frontiers in Electronic Testing
- Tapa blanda
Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 146,66
Envío por EUR 3,50Se envía dentro de Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. pp. 192.
New Methods of Concurrent Checking (Frontiers in Electronic Testing, 42)
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Idioma: Inglés
Editorial: Springer, 2010
Serie: Frontiers in Electronic Testing, Libro 20 de 40. Libro 20 de 40 - Frontiers in Electronic Testing
- Tapa blanda
Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 141,92
Envío por EUR 14,07Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. In.
Más imágenesIdioma: Inglés
Editorial: Springer, 2010
Serie: Frontiers in Electronic Testing, Libro 20 de 40. Libro 20 de 40 - Frontiers in Electronic Testing
- Tapa blanda
Librería: preigu, Osnabrück, Alemaniapreigu
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 95,25
Envío por EUR 70,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 5 disponibles
Taschenbuch. Condición: Neu. New Methods of Concurrent Checking | Michael Gössel (u. a.) | Taschenbuch | viii | Englisch | 2010 | Springer | EAN 9789048178766 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Idioma: Inglés
Editorial: Springer, Springer, 2010
Serie: Frontiers in Electronic Testing, Libro 20 de 40. Libro 20 de 40 - Frontiers in Electronic Testing
- Tapa blanda
Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 112,77
Envío por EUR 61,50Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library…or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected.
New Methods of Concurrent Checking (Frontiers in Electronic Testing (42))
Gössel, Michael, Ocheretny, Vitaly, Sogomonyan, Egor, Marien
Idioma: Inglés
Editorial: Springer, 2010
Serie: Frontiers in Electronic Testing, Libro 20 de 40. Libro 20 de 40 - Frontiers in Electronic Testing
- Tapa blanda
Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Como Nuevo
EUR 165,67
Envío por EUR 29,35Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Paperback. Condición: Like New. Like New. book.
Idioma: Inglés
Editorial: Springer, 2010
Serie: Frontiers in Electronic Testing, Libro 20 de 40. Libro 20 de 40 - Frontiers in Electronic Testing
- Tapa blanda
- Impresión bajo demanda
Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 86,24
Envío por EUR 5,50Se envía de Italia a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: new. Questo è un articolo print on demand.
Idioma: Inglés
Editorial: Springer Netherlands Okt 2010, 2010
Serie: Frontiers in Electronic Testing, Libro 20 de 40. Libro 20 de 40 - Frontiers in Electronic Testing
- Tapa blanda
- Impresión bajo demanda
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 106,99
Envío por EUR 23,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a…digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected. 192 pp. Englisch.
Idioma: Inglés
Editorial: Springer Netherlands, 2010
Serie: Frontiers in Electronic Testing, Libro 20 de 40. Libro 20 de 40 - Frontiers in Electronic Testing
- Tapa blanda
- Impresión bajo demanda
Librería: moluna, Greven, Alemaniamoluna
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 92,27
Envío por EUR 48,99Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Of great importance for the emerging nanotechnologies with their increasing numbers of transient faultsShows in a systematic way how the best possible state-of-the-art digital error detection circuits can be designedT…he only book which desc.
Idioma: Inglés
Editorial: Springer, 2010
Serie: Frontiers in Electronic Testing, Libro 20 de 40. Libro 20 de 40 - Frontiers in Electronic Testing
- Tapa blanda
- Impresión bajo demanda
Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 153,76
Envío por EUR 7,63Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. Print on Demand pp. 192 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Idioma: Inglés
Editorial: Springer, 2010
Serie: Frontiers in Electronic Testing, Libro 20 de 40. Libro 20 de 40 - Frontiers in Electronic Testing
- Tapa blanda
- Impresión bajo demanda
Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 154,00
Envío por EUR 9,95Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. PRINT ON DEMAND pp. 192.
Idioma: Inglés
Editorial: Springer, Springer Okt 2010, 2010
Serie: Frontiers in Electronic Testing, Libro 20 de 40. Libro 20 de 40 - Frontiers in Electronic Testing
- Tapa blanda
- Impresión bajo demanda
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 106,99
Envío por EUR 60,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digi…tal library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 192 pp. Englisch.
