Isbn: 9789048178766 - new methods of concurrent checking: 42 (frontiers in electronic testing) (13 resultados)

New Methods of Concurrent Checking
Gossel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected. …

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Condición: New. pp. 192.

New Methods of Concurrent Checking (Frontiers in Electronic Testing, 42)
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Idioma: Inglés
Editorial: Springer, 2010
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Taschenbuch. Condición: Neu. New Methods of Concurrent Checking | Michael Gössel (u. a.) | Taschenbuch | viii | Englisch | 2010 | Springer | EAN 9789048178766 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

New Methods of Concurrent Checking (Frontiers in Electronic Testing (42))
Gössel, Michael, Ocheretny, Vitaly, Sogomonyan, Egor, Marien
Idioma: Inglés
Editorial: Springer, 2010
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New Methods of Concurrent Checking
Gossel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Idioma: Inglés
Editorial: Springer, 2010
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected. 192 pp. Englisch.…

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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Of great importance for the emerging nanotechnologies with their increasing numbers of transient faultsShows in a systematic way how the best possible state-of-the-art digital error detection circuits can be designedThe only book which desc.…

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Condición: New. Print on Demand pp. 192 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

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Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 192 pp. Englisch.…

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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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Condición: New. PRINT ON DEMAND pp. 192.