Isbn: 9783642099212 - extended defects in germanium: fundamental and technological aspects: 118 (springer series in materials science) (11 resultados)

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  • Idioma: Inglés

    Editorial: Springer, 2010

    3642099211 / 9783642099212

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    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

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    EUR 170,19

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    Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The aim is to give an overview of the physics of extended defects in Germanium, i.e. dislocations (line defects), grain boundaries, stacking faults, twins and {311} defects (two-dimensional defects) and precipitates, bubbles, etc. The first part covers fundamentals, describing the crystallographic structure and other physical and electrical properties, mainly of dislocations. Since dislocations are essential for the plastic deformation of Germanium, methods for analysis and imaging of dislocations and to evaluate their structure are described. Attention is given to the electrical and optical properties, which are important for devices made in dislocated Ge. The second part treats the creation of extended defects during wafer and device processing. Issues are addressed such as defect formation during ion implantation, necessary to create junctions, which are an essential part in every device type. Extended defects are also created during the deposition of thin or thick epitaxial layers on other substrates, which are important for optoelectronic and photovoltaic applications. In brief, the book is intended to provide a fundamental understanding of the extended-defect formation during Ge materials and device processing, providing ways to distinguish harmful from less detrimental defects and should point out ways for defect engineering and control. …

  • Idioma: Inglés

    Editorial: Springer, 2010

    3642099211 / 9783642099212

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    Librería: preigu, Osnabrück, Alemaniapreigu

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    EUR 140,10

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    Taschenbuch. Condición: Neu. Extended Defects in Germanium | Fundamental and Technological Aspects | Cor Claeys (u. a.) | Taschenbuch | Springer Series in Materials Science | xx | Englisch | 2010 | Springer | EAN 9783642099212 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

  • Idioma: Inglés

    Editorial: Springer, 2010

    3642099211 / 9783642099212

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    Librería: Books Puddle, Woodside, NY, Estados Unidos de AmericaBooks Puddle

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    EUR 229,17

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    Cantidad disponible: 4 disponibles

    Condición: New. pp. xx + 297 1st Edition.

  • Idioma: Inglés

    Editorial: Springer, 2010

    3642099211 / 9783642099212

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    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

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    EUR 250,72

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    Paperback. Condición: Brand New. reprint edition. 317 pages. 9.25x6.10x0.76 inches. In Stock.

  • Idioma: Inglés

    Editorial: Springer, 2010

    3642099211 / 9783642099212

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    Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books

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    Condición: Usado - Como Nuevo

    EUR 259,83

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    Cantidad disponible: 1 disponible

    Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Idioma: Inglés

    Editorial: Springer, 2010

    3642099211 / 9783642099212

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    Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    EUR 126,26

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    Condición: new. Questo è un articolo print on demand.

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg Nov 2010, 2010

    3642099211 / 9783642099212

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    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The aim is to give an overview of the physics of extended defects in Germanium, i.e. dislocations (line defects), grain boundaries, stacking faults, twins and {311} defects (two-dimensional defects) and precipitates, bubbles, etc. The first part covers fundamentals, describing the crystallographic structure and other physical and electrical properties, mainly of dislocations. Since dislocations are essential for the plastic deformation of Germanium, methods for analysis and imaging of dislocations and to evaluate their structure are described. Attention is given to the electrical and optical properties, which are important for devices made in dislocated Ge. The second part treats the creation of extended defects during wafer and device processing. Issues are addressed such as defect formation during ion implantation, necessary to create junctions, which are an essential part in every device type. Extended defects are also created during the deposition of thin or thick epitaxial layers on other substrates, which are important for optoelectronic and photovoltaic applications. In brief, the book is intended to provide a fundamental understanding of the extended-defect formation during Ge materials and device processing, providing ways to distinguish harmful from less detrimental defects and should point out ways for defect engineering and control. 320 pp. Englisch.…

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, 2010

    3642099211 / 9783642099212

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    Librería: moluna, Greven, Alemaniamoluna

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    Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Deals with all aspects of defects in Ge, an element which is gaining importance again in semiconductor technologyDiscusses all kinds of expanded defects in Ge, such as dislocation, stacking faults, twins, grain boundaries and bubbles on a crystall. …

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, Springer Berlin Heidelberg Nov 2010, 2010

    3642099211 / 9783642099212

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    Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000

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    EUR 160,49

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    Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The aim is to give an overview of the physics of extended defects in Germanium, i.e. dislocations (line defects), grain boundaries, stacking faults, twins and {311} defects (two-dimensional defects) and precipitates, bubbles, etc. The first part covers fundamentals, describing the crystallographic structure and other physical and electrical properties, mainly of dislocations. Since dislocations are essential for the plastic deformation of Germanium, methods for analysis and imaging of dislocations and to evaluate their structure are described. Attention is given to the electrical and optical properties, which are important for devices made in dislocated Ge. The second part treats the creation of extended defects during wafer and device processing. Issues are addressed such as defect formation during ion implantation, necessary to create junctions, which are an essential part in every device type. Extended defects are also created during the deposition of thin or thick epitaxial layers on other substrates, which are important for optoelectronic and photovoltaic applications. In brief, the book is intended to provide a fundamental understanding of the extended-defect formation during Ge materials and device processing, providing ways to distinguish harmful from less detrimental defects and should point out ways for defect engineering and control.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 320 pp. Englisch.…

  • Idioma: Inglés

    Editorial: Springer, 2010

    3642099211 / 9783642099212

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    Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books

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    EUR 242,43

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    Condición: New. Print on Demand pp. xx + 297 231 Illus. (8 Col.).

  • Idioma: Inglés

    Editorial: Springer, 2010

    3642099211 / 9783642099212

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    Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios

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    EUR 240,26

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    Condición: New. PRINT ON DEMAND pp. xx + 297.