Isbn: 9783642093418 - applied scanning probe methods ix: characterization: 4 (nanoscience and technology) (11 resultados)

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  • Idioma: Inglés

    Editorial: Springer, 2010

    3642093418 / 9783642093418

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    Librería: Books Puddle, Woodside, NY, Estados Unidos de AmericaBooks Puddle

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    Condición: New. pp. lx + 387 1st Edition.

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    Editorial: Springer, 2010

    3642093418 / 9783642093418

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    Taschenbuch. Condición: Neu. Applied Scanning Probe Methods IX | Characterization | Bharat Bhushan (u. a.) | Taschenbuch | NanoScience and Technology | lix | Englisch | 2010 | Springer | EAN 9783642093418 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

  • Idioma: Inglés

    Editorial: Springer, 2010

    3642093418 / 9783642093418

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    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

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    Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The success of the Springer Series Applied Scanning Probe Methods I-VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.…

  • Idioma: Inglés

    Editorial: Springer, 2010

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    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

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    Paperback. Condición: Brand New. 387 pages. 9.00x6.00x1.06 inches. In Stock.

  • Idioma: Inglés

    Editorial: Springer, 2010

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    Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books

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    Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Idioma: Inglés

    Editorial: Springer, 2010

    3642093418 / 9783642093418

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    Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    Condición: new. Questo è un articolo print on demand.

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, Springer Berlin Heidelberg Nov 2010, 2010

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    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The success of the Springer Series Applied Scanning Probe Methods I-VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics. 448 pp. Englisch.…

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, 2010

    3642093418 / 9783642093418

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    Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state-of-the-art of this techniqueReal industrial applications includedThe volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is.…

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    Editorial: Springer, 2010

    3642093418 / 9783642093418

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    Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books

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    Condición: New. Print on Demand pp. lx + 387 216 Illus.

  • Idioma: Inglés

    Editorial: Springer, 2010

    3642093418 / 9783642093418

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    Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios

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    Condición: New. PRINT ON DEMAND pp. lx + 387.

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, Springer Vieweg Nov 2010, 2010

    3642093418 / 9783642093418

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    Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000

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    Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The success of the Springer Series Applied Scanning Probe Methods I¿VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 448 pp. Englisch.…