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Idioma: Inglés
Publicado por Dover Publications 7/7/2006, 2006
ISBN 10: 0486450287 ISBN 13: 9780486450285
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Añadir al carritoPaperback or Softback. Condición: New. A User's Guide to Ellipsometry. Book.
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Publicado por Dover Publications Inc., New York, 2006
ISBN 10: 0486450287 ISBN 13: 9780486450285
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Añadir al carritoPaperback. Condición: new. Paperback. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry - particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth.A User's Guide to Ellipsometry will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and optical constants in film, it also considers the trajectories of the ellipsometric parameters Del and Psi and how changes in materials affect parameters. This volume also addresses the use of polysilicon, a material commonly employed in the microelectronics industry, and the effects of substrate roughness. Three appendices provide helpful references. Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Idioma: Inglés
Publicado por Dover Publications Inc., 2006
ISBN 10: 0486450287 ISBN 13: 9780486450285
Librería: Bookbot, Prague, Republica Checa
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Añadir al carritoSoftcover. Condición: Fine. Leichte Kratzer / Abnutzungen / Druckstellen; Leichte Rillen / Abschürfungen / Risse / Knicke. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 14 case studies illustrate concepts and applications. Three appendices provide helpful references. 1993 edition.
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Añadir al carritoPaperback. Condición: Brand New. 260 pages. 8.25x5.25x0.50 inches. In Stock.
Idioma: Inglés
Publicado por Dover Publications Inc. 2009-01-01, 2009
ISBN 10: 0486450287 ISBN 13: 9780486450285
Librería: Chiron Media, Wallingford, Reino Unido
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Idioma: Inglés
Publicado por Dover Publications Inc., 2006
ISBN 10: 0486450287 ISBN 13: 9780486450285
Librería: moluna, Greven, Alemania
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Añadir al carritoCondición: New. Inhaltsverzeichnisrnrn1. Theoretical Aspectsn2. Instrumentationn3. Using Optical Parameters to Determine Material Propertiesn4. Determining Optical Parameters for Inaccessible Substrates and Unknown Filmsn5. Extremely Thin Filmsn6. The Spe.
Librería: BennettBooksLtd, Los Angeles, CA, Estados Unidos de America
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Idioma: Inglés
Publicado por Dover Publications Jul 2006, 2006
ISBN 10: 0486450287 ISBN 13: 9780486450285
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Añadir al carritoTaschenbuch. Condición: Neu. Neuware - Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition.
Idioma: Inglés
Publicado por Dover Publications Inc., 2006
ISBN 10: 0486450287 ISBN 13: 9780486450285
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Idioma: Inglés
Publicado por Dover Publications Inc., New York, 2006
ISBN 10: 0486450287 ISBN 13: 9780486450285
Librería: AussieBookSeller, Truganina, VIC, Australia
EUR 22,91
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Añadir al carritoPaperback. Condición: new. Paperback. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry - particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth.A User's Guide to Ellipsometry will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and optical constants in film, it also considers the trajectories of the ellipsometric parameters Del and Psi and how changes in materials affect parameters. This volume also addresses the use of polysilicon, a material commonly employed in the microelectronics industry, and the effects of substrate roughness. Three appendices provide helpful references. Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Idioma: Inglés
Publicado por Dover Publications Inc., New York, 2006
ISBN 10: 0486450287 ISBN 13: 9780486450285
Librería: CitiRetail, Stevenage, Reino Unido
EUR 22,66
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Añadir al carritoPaperback. Condición: new. Paperback. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry - particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth.A User's Guide to Ellipsometry will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and optical constants in film, it also considers the trajectories of the ellipsometric parameters Del and Psi and how changes in materials affect parameters. This volume also addresses the use of polysilicon, a material commonly employed in the microelectronics industry, and the effects of substrate roughness. Three appendices provide helpful references. Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.