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Añadir al carritoHardcover. Condición: Sehr gut. 331 p., with figures, As library copy in very good condition. Sprache: Englisch Gewicht in Gramm: 845.
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Añadir al carritoCondición: Sehr gut. Zustand: Sehr gut | Seiten: 360 | Sprache: Englisch | Produktart: Bücher | The first hands-on guide to XRD and XRF sampling and specimen preparation Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume. This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips. With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort. Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials * Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more * Features special chapters on specimen preparation equipment and XRF standards * Contains useful bibliography and helpful references.
Librería: GoldBooks, Denver, CO, Estados Unidos de America
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Añadir al carritoCondición: New. pp. 360.
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Añadir al carritoCondición: New. pp. 360.
Librería: moluna, Greven, Alemania
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Añadir al carritoGebunden. Condición: New. VICTOR E. BUHRKE heads The Buhrke Company in Redwood City, California.RON JENKINS is the general manager of the International Center for Diffraction Data in Newton Square, Pennsylvania.DEANE K. SMITH is a professor emeritus in the Department of Geosciences .
Idioma: Inglés
Publicado por John Wiley and Sons Ltd, 1997
ISBN 10: 0471194581 ISBN 13: 9780471194583
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Original o primera edición
EUR 297,11
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Añadir al carritoCondición: New. X-ray fluorescence (XRF) and x-ray diffraction (XRD) are analytical techniques used to identify substances by examining the amount of energy given off from a substance during an x-ray. The most common errors in XRF analysis and XRD usually occur during preparation of the specimen. Editor(s): Buhrke, Victor E.; Jenkins, Ron; Smith, Deane K. Num Pages: 360 pages, bibliography. BIC Classification: MQH; PNFS. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 243 x 223 x 25. Weight in Grams: 702. . 1997. 1st Edition. Hardcover. . . . .
Librería: Revaluation Books, Exeter, Reino Unido
EUR 338,12
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Añadir al carritoHardcover. Condición: Brand New. 1st edition. 333 pages. 9.75x6.50x0.75 inches. In Stock.
Idioma: Inglés
Publicado por John Wiley and Sons Ltd, 1997
ISBN 10: 0471194581 ISBN 13: 9780471194583
Librería: Kennys Bookstore, Olney, MD, Estados Unidos de America
EUR 373,51
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Añadir al carritoCondición: New. X-ray fluorescence (XRF) and x-ray diffraction (XRD) are analytical techniques used to identify substances by examining the amount of energy given off from a substance during an x-ray. The most common errors in XRF analysis and XRD usually occur during preparation of the specimen. Editor(s): Buhrke, Victor E.; Jenkins, Ron; Smith, Deane K. Num Pages: 360 pages, bibliography. BIC Classification: MQH; PNFS. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 243 x 223 x 25. Weight in Grams: 702. . 1997. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 316,76
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Añadir al carritoBuch. Condición: Neu. Neuware - Das erste Buch, das die leistungsstarken Analyseinstrumente der Röntgendiffraktion und Röntgen-Fluoreszenzspektrometrie sowie auch das Präparieren von Analyseproben behandelt. Jedes Kapitel liefert detaillierte Informationen, Schritt-für-Schritt-Anleitungen und Anregungen, wo man die notwendige Ausrüstung für Probenpräparationen, Standards und Analysen findet. (10/97).
Idioma: Inglés
Publicado por John Wiley & Sons Inc, Berlin, 1998
ISBN 10: 0471194581 ISBN 13: 9780471194583
Librería: CitiRetail, Stevenage, Reino Unido
Original o primera edición Impresión bajo demanda
EUR 250,01
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Añadir al carritoHardcover. Condición: new. Hardcover. The first hands-on guide to XRD and XRF sampling and specimen preparation Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume. This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips. With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort. Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials * Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more * Features special chapters on specimen preparation equipment and XRF standards * Contains useful bibliography and helpful references. X-ray fluorescence (XRF) and x-ray diffraction (XRD) are analytical techniques used to identify substances by examining the amount of energy given off from a substance during an x-ray. The most common errors in XRF analysis and XRD usually occur during preparation of the specimen. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
Librería: Revaluation Books, Exeter, Reino Unido
EUR 316,78
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Añadir al carritoHardcover. Condición: Brand New. 1st edition. 333 pages. 9.75x6.50x0.75 inches. In Stock. This item is printed on demand.