X-ray fluorescence (XRF) and x-ray diffraction (XRD) are analytical techniques used to identify substances by examining the amount of energy given off from a substance during an x-ray. The most common errors in XRF analysis and XRD usually occur during preparation of the specimen. Editor(s): Buhrke, Victor E.; Jenkins, Ron; Smith, Deane K. Num Pages: 360 pages, bibliography. BIC Classification: MQH; PNFS. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 243 x 223 x 25. Weight in Grams: 702. . 1997. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.

N� de ref. del art�culo V9780471194583

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T�tulo

Practical Guide for the Preparation of Specimens for X-ray Flourescence and X-ray Diffraction Analysis

Editor

John Wiley and Sons Ltd

Fecha de publicaci�n

1997

Idioma

Ingl�s

ISBN 10

0471194581

ISBN 13

9780471194583

Encuadernaci�n

Encuadernaci�n de tapa dura

Estado

New

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Sinopsis

The first hands-on guide to XRD and XRF sampling and specimen preparation

Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume.

This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips.

With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort.

Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials
* Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more
* Features special chapters on specimen preparation equipment and XRF standards
* Contains useful bibliography and helpful references.

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VICTOR E. BUHRKE heads The Buhrke Company in Redwood City, California.

RON JENKINS is the general manager of the International Center for Diffraction Data in Newton Square, Pennsylvania.

DEANE K. SMITH is a professor emeritus in the Department of Geosciences at Pennsylvania State University.

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