9780471181729 - ellipsometry: a user's guide de tompkins; mcgahan (23 resultados)

Hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

hardcover. Condición: Very Good. Estado de la sobrecubierta: N/A.

Hardcover. Condición: Very Good. Book has lightly exposed binding between front endpaper and title page, a light crease along length of back endpaper near binding, light rubbing and smudging to covers, light bumps to outer bottom corners, light bumps to edges. otherwise in very good condition, strong binding, clean and unmarked pages; some light cosmetic wear but an overall sturdy, attractive copy with bright interiors. …

Condición: New.

Condición: New. pp. 248 1st Edition.

HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.

Condición: New. pp. 248.

Condición: new.

Condición: New.

Condición: New. In English.

Condición: As New. Unread book in perfect condition.

Hardcover. Condición: Near Fine. No Jacket. John Wiley, New York, 1999. Hard cover, black boards. Condition : Fine, like new. Appears unread. A very clean copy.

Condición: New.

Hardcover. Condición: new. New Copy. Customer Service Guaranteed.

Condición: As New. Unread book in perfect condition.

Condición: New. While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. Num Pages: 248 pages, Illustrations. BIC Classification: PHJ; TGM. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 163 x 237 x 19. Weight in Grams: 516. . 1999. 1st Edition. Hardcover. . . . .…

Condición: New. While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic.

Hardcover. Condición: Brand New. 1st edition. 228 pages. 10.00x6.50x1.00 inches. In Stock.

Buch. Condición: Neu. Neuware - Mit Hilfe der Ellipsometrie mißt man Dicken und optische Eigenschaften dünner Filme. In den vergangenen Jahren hat die ellipsometrische Spektroskopie ebenso wie die eng verwandte Reflektometrie zunehmend die Industrielabors erobert. Dies schafft Bedarf an einer praxisnahen Einführung für ein interdisziplinäres Publikum von Materialwissenschaftlern, Physikern, Chemikern und Elektrotechnikern, wie sie mit diesem Buch gelungen ist. (04/99).…

Condición: New. While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. Num Pages: 248 pages, Illustrations. BIC Classification: PHJ; TGM. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 163 x 237 x 19. Weight in Grams: 516. . 1999. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.…

Hardcover. Condición: new. Hardcover. Ellipsometry is an optical technique used to measure thickness and optical properties of thin films. Single wave ellipsometry has been around for years, but now spectroscopic ellipsometry has entered the mainstream of industrial laboratories. This is a practical introduction to spectroscopic ellipsometry and the related technique of reflectometry. In addition to an introduction to the fundamentals, the book includes applications and case studies. While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Hardcover. Condición: Brand New. 1st edition. 228 pages. 10.00x6.50x1.00 inches. In Stock. This item is printed on demand.

Hardback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 552.