9780470112809 - nano-cmos design for manufacturability: robust circuit and physical design for sub-65nm technology nodes de wong, ban p.; mittal, anurag; starr, greg w.; zach, franz; moroz, victor; kahng, andrew (28 resultados)
NANO-CMOS Design for Manufacturability : Robust Circuit and Physical Design for Sub-65nm Technology Nodes
Mittal, Anurag, Moroz, Victor, Wong, Ban P., Zach, Franz, Starr, Greg W.
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Librería: Better World Books, Mishawaka, IN, Estados Unidos de AmericaBetter World Books
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EUR 31,18
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Condición: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
Nano-Cmos Design For Manufacturability: Robust Circuit And Physical Design For Technology Nodes
Wong, Ban P.; Mittal, Anurag; Starr, Greg W.; Zach, Franz; Moroz, Victor; Kahng, Andrew
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Librería: Romtrade Corp., STERLING HEIGHTS, MI, Estados Unidos de AmericaRomtrade Corp.
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EUR 99,78
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Nano-Cmos Design For Manufacturability: Robust Circuit And Physical Design For Technology Nodes
Wong, Ban P.; Mittal, Anurag; Starr, Greg W.; Zach, Franz; Moroz, Victor; Kahng, Andrew
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Librería: SMASS Sellers, IRVING, TX, Estados Unidos de AmericaSMASS Sellers
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Nano-CMOS Design for Manufacturability
Anurag Mittal Greg W. Starr Franz Zach Victor Moroz Andrew Kahng Ban P. Wong
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 110,70
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Condición: New. pp. xv + 385.
Nano-CMOS Design for Manufacturability
Mittal Anurag Starr Greg W. Zach Franz Moroz Victor Kahng Andrew Wong Ban P.
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Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
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Condición: New. pp. xv + 385 Illus.
Nano-CMOS Design for Manufacturability
Mittal Anurag Starr Greg W. Zach Franz Moroz Victor Kahng Andrew Wong Ban P.
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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Condición: New. pp. xv + 385.
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Librería: PBShop.store UK, Fairford, GLOS, Reino UnidoPBShop.store UK
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HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.
Nano-CMOS Design for Manufacturability : Robust Circuit and Physical Design for Sub-65 nm Technology Nodes
Wong, Ban; Zach, Franz; Moroz, Victor; Mittal, Anurag; Starr, Greg
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 128,60
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Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Librería: Libro Co. Italia Srl, San Casciano Val di Pesa, FI, ItaliaLibro Co. Italia Srl
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Rilegato in Tela. Condición: fine. West Sussex, 2008; clothbound, pp. 385, cm 16x23. Libro.
Nano-CMOS Design for Manufacturability : Robust Circuit and Physical Design for Sub-65 nm Technology Nodes
Wong, Ban; Zach, Franz; Moroz, Victor; Mittal, Anurag; Starr, Greg
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Nano-CMOS Design for Manufacturability : Robust Circuit and Physical Design for Sub-65 nm Technology Nodes
Wong, Ban; Zach, Franz; Moroz, Victor; Mittal, Anurag; Starr, Greg
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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Nano-CMOS Design for Manufacturability: Robust Circuit and Physical Design for Sub-65nm Technology Nodes
Wong, Ban P.; Mittal, Anurag; Starr, Greg W.; Zach, Franz; Moroz, Victor; Kahng, Andrew
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Librería: California Books, Miami, FL, Estados Unidos de AmericaCalifornia Books
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Nano-CMOS Design for Manufacturability: Robust Circuit and Physical Design for Sub-65nm Technology Nodes
Wong, Ban P.; Mittal, Anurag; Starr, Greg W.; Zach, Franz; Moroz, Victor; Kahng, Andrew
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 145,79
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Condición: New. In English.
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Librería: THE SAINT BOOKSTORE, Southport, Reino UnidoTHE SAINT BOOKSTORE
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EUR 143,35
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Hardback. Condición: New. New copy - Usually dispatched within 4 working days.
Nano-CMOS Design for Manufacturability : Robust Circuit and Physical Design for Sub-65 nm Technology Nodes
Wong, Ban; Zach, Franz; Moroz, Victor; Mittal, Anurag; Starr, Greg
- Tapa dura
Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 149,99
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Condición: As New. Unread book in perfect condition.
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- Primera edición
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
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EUR 164,10
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Condición: New. The current semiconductor model continues to give birth to a large number of design engineers who are producing a large number of chips, but without any interaction with process/device people. This book addresses major challenges faced by engineers and offers concrete solutions provided by industry experts. Num P…ages: 386 pages, Illustrations. BIC Classification: TG; TJFD. Category: (P) Professional & Vocational. Dimension: 232 x 164 x 22. Weight in Grams: 688. . 2008. 1st Edition. Hardcover. . . . .
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Librería: moluna, Greven, Alemaniamoluna
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Condición: New. Ban P. Wong, CEng, MIET, is Director of Design Methodology at Chartered Semiconductor, Inc. He holds five patents and is the lead author of Nano-CMOS Circuit and Physical Design (Wiley).Franz Zach, PhD, is Senior Director at PDF Solutions, where he is invol.
Nano-CMOS Design for Manufacturability: Robust Circuit and Physical Design for Sub-65 nm Technology Nodes
Wong, Ban/ Zach, Franz/ Moroz, Victor/ Mittal, Anurag/ Starr, Greg
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 186,67
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Hardcover. Condición: Brand New. 1st edition. 386 pages. 9.25x6.25x1.00 inches. In Stock.
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Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore
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EUR 205,97
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Condición: New. The current semiconductor model continues to give birth to a large number of design engineers who are producing a large number of chips, but without any interaction with process/device people. This book addresses major challenges faced by engineers and offers concrete solutions provided by industry experts. Num P…ages: 386 pages, Illustrations. BIC Classification: TG; TJFD. Category: (P) Professional & Vocational. Dimension: 232 x 164 x 22. Weight in Grams: 688. . 2008. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
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- Edición internacional
Librería: UK BOOKS STORE, London, LONDO, Reino UnidoUK BOOKS STORE
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EUR 216,15
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Condición: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if th…e Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
Nano-CMOS Design for Manufacturability: Robust Circuit and Physical Design for Sub-65nm Technology Nodes
Wong, Ban P., Mittal, Anurag, Starr, Greg W., Zach, Franz, M
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Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
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Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Nano-CMOS Design for Manufacturability: Robust Circuit and Physical Design for Sub-65nm Technology Nodes
Wong, Ban P.; Mittal, Anurag; Starr, Greg W.; Zach, Franz; Moroz, Victor; Kahng, Andrew
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Librería: brandnewtexts4sale, Houston, TX, Estados Unidos de Americabrandnewtexts4sale
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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Buch. Condición: Neu. Neuware - Discover innovative tools that pave the way from circuit and physical design to fabrication processingNano-CMOS Design for Manufacturability examines the challenges that design engineers face in the nano-scaled era, such as exacerbated effects and the proven design for manufacturability (DFM) meth…odology in the midst of increasing variability and design process interactions. In addition to discussing the difficulties brought on by the continued dimensional scaling in conformance with Moore's law, the authors also tackle complex issues in the design process to overcome the difficulties, including the use of a functional first silicon to support a predictable product ramp. Moreover, they introduce several emerging concepts, including stress proximity effects, contour-based extraction, and design process interactions.This book is the sequel to Nano-CMOS Circuit and Physical Design, taking design to technology nodes beyond 65nm geometries. It is divided into three parts:\* Part One, Newly Exacerbated Effects, introduces the newly exacerbated effects that require designers' attention, beginning with a discussion of the lithography aspects of DFM, followed by the impact of layout on transistor performance\* Part Two, Design Solutions, examines how to mitigate the impact of process effects, discussing the methodology needed to make sub-wavelength patterning technology work in manufacturing, as well as design solutions to deal with signal, power integrity, WELL, stress proximity effects, and process variability\* Part Three, The Road to DFM, describes new tools needed to support DFM efforts, including an auto-correction tool capable of fixing the layout of cells with multiple optimization goals, followed by a look ahead into the future of DFMThroughout the book, real-world examples simplify complex concepts, helping readers see how they can successfully handle projects on Nano-CMOS nodes. It provides a bridge that allows engineers to go from physical and circuit design to fabrication processing and, in short, make designs that are not only functional, but that also meet power and performance goals within the design schedule.
Nano-CMOS Design for Manufacturability: Robust Circuit and Physical Design for Sub-65 nm Technology Nodes
Wong, Ban/ Zach, Franz/ Moroz, Victor/ Mittal, Anurag/ Starr, Greg
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 172,56
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Hardcover. Condición: Brand New. 1st edition. 386 pages. 9.25x6.25x1.00 inches. In Stock. This item is printed on demand.
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Librería: THE SAINT BOOKSTORE, Southport, Reino UnidoTHE SAINT BOOKSTORE
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EUR 178,57
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Hardback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 718.
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Hardcover. Condición: new. Hardcover. Discover innovative tools that pave the way from circuit and physical design to fabrication processing Nano-CMOS Design for Manufacturability examines the challenges that design engineers face in the nano-scaled era, such as exacerbated effects and the proven design for manufacturability (DF…M) methodology in the midst of increasing variability and design process interactions. In addition to discussing the difficulties brought on by the continued dimensional scaling in conformance with Moore's law, the authors also tackle complex issues in the design process to overcome the difficulties, including the use of a functional first silicon to support a predictable product ramp. Moreover, they introduce several emerging concepts, including stress proximity effects, contour-based extraction, and design process interactions. This book is the sequel to Nano-CMOS Circuit and Physical Design, taking design to technology nodes beyond 65nm geometries. It is divided into three parts: Part One, Newly Exacerbated Effects, introduces the newly exacerbated effects that require designers' attention, beginning with a discussion of the lithography aspects of DFM, followed by the impact of layout on transistor performance Part Two, Design Solutions, examines how to mitigate the impact of process effects, discussing the methodology needed to make sub-wavelength patterning technology work in manufacturing, as well as design solutions to deal with signal, power integrity, WELL, stress proximity effects, and process variability Part Three, The Road to DFM, describes new tools needed to support DFM efforts, including an auto-correction tool capable of fixing the layout of cells with multiple optimization goals, followed by a look ahead into the future of DFM Throughout the book, real-world examples simplify complex concepts, helping readers see how they can successfully handle projects on Nano-CMOS nodes. It provides a bridge that allows engineers to go from physical and circuit design to fabrication processing and, in short, make designs that are not only functional, but that also meet power and performance goals within the design schedule. The current semiconductor model continues to give birth to a large number of design engineers who are producing a large number of chips, but without any interaction with process/device people. This book addresses major challenges faced by engineers and offers concrete solutions provided by industry experts. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
