Isbn: 9780123739735 - system-on-chip test architectures: nanometer design for testability (volume .) (systems on silicon, volume .) (10 resultados)

Condición: good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail.…

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Hardcover. Condición: new. Hardcover. System-on-Chip Test Architectures A guide to VLSI Testing and Design-for-Testability techniques that allows students, researchers, DFT practitioners, and VLSI designers to master System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. It also includes practical problems at the end of each chapter for students. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. …

Hardcover. Condición: new. New Copy. Customer Service Guaranteed.

hardcover. Condición: New. Special order direct from the distributor.

Condición: New. A guide to VLSI Testing and Design-for-Testability techniques that allows students, researchers, DFT practitioners, and VLSI designers to master System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. It also includes practical problems at the end of each chapter for students. Series: Systems on Silicon. Num Pages: 896 pages, Approx. 600 illustrations. BIC Classification: THR. Category: (P) Professional & Vocational. Dimension: 242 x 199 x 38. Weight in Grams: 1602. . 2007. 1st Edition. hardcover. . . . .…

Condición: New. A guide to VLSI Testing and Design-for-Testability techniques that allows students, researchers, DFT practitioners, and VLSI designers to master System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. It also includes practical problems at the end of each chapter for students. Series: Systems on Silicon. Num Pages: 896 pages, Approx. 600 illustrations. BIC Classification: THR. Category: (P) Professional & Vocational. Dimension: 242 x 199 x 38. Weight in Grams: 1602. . 2007. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.…

Condición: New. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (.

Hardcover. Condición: Brand New. illustrated edition. 896 pages. 9.50x7.50x1.50 inches. In Stock.

Hardcover. Condición: new. Hardcover. System-on-Chip Test Architectures A guide to VLSI Testing and Design-for-Testability techniques that allows students, researchers, DFT practitioners, and VLSI designers to master System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. It also includes practical problems at the end of each chapter for students. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. …