Ye fangming (28 resultados)

Knowledge-driven Board-level Functional Fault Diagnosis
Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 93,42
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Condición: As New. Unread book in perfect condition.

Knowledge-driven Board-level Functional Fault Diagnosis
Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 84,05
Envío por EUR 17,72Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New.

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Librería: Chiron Media, Wallingford, Reino UnidoChiron Media
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EUR 83,22
Envío por EUR 18,30Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 10 disponibles
PF. Condición: New.

Knowledge-driven Board-level Functional Fault Diagnosis
Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
- Tapa blanda
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 102,12
Envío por EUR 2,36Se envía dentro de Estados Unidos de AmericaCantidad disponible: 15 disponibles
Condición: New.

Knowledge-driven Board-level Functional Fault Diagnosis
Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
- Tapa dura
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 102,96
Envío por EUR 2,36Se envía dentro de Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New.

Knowledge-Driven Board-Level Functional Fault Diagnosis
Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 95,54
Envío por EUR 11,07Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. In English.

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Librería: Rarewaves.com USA, London, LONDO, Reino UnidoRarewaves.com USA
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 107,94
Gastos de envío gratisSe envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Hardback. Condición: New. 1st ed. 2017. This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing.Demonstrates techniques based on industrial data and feedback from an actual manufacturing line.Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.…

Knowledge-Driven Board-Level Functional Fault Diagnosis
Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
- Tapa dura
Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 95,54
Envío por EUR 13,34Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. In English.

Knowledge-driven Board-level Functional Fault Diagnosis
Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
- Tapa dura
Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 95,14
Envío por EUR 17,72Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: As New. Unread book in perfect condition.

Knowledge-driven Board-level Functional Fault Diagnosis
Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
- Tapa blanda
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 114,52
Envío por EUR 2,36Se envía dentro de Estados Unidos de AmericaCantidad disponible: 15 disponibles
Condición: As New. Unread book in perfect condition.

Knowledge-Driven Board-Level Functional Fault Diagnosis
Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
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Librería: Books Puddle, Woodside, NY, Estados Unidos de AmericaBooks Puddle
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 136,07
Envío por EUR 3,56Se envía dentro de Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. pp. 160.

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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 107,73
Envío por EUR 35,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponible
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.-Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;-Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;-Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.…

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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 107,73
Envío por EUR 35,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponible
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.-Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;-Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;-Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.…

Knowledge-Driven Board-Level Functional Fault Diagnosis
Ye, Fangming (Author)/ Zhang, Zhaobo (Author)/ Chakrabarty, Krishnendu (Author)/ Gu, Xinli (Author)
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 142,66
Envío por EUR 11,81Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Hardcover. Condición: Brand New. 147 pages. 9.75x6.75x0.75 inches. In Stock.

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Librería: preigu, Osnabrück, Alemaniapreigu
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EUR 83,60
Envío por EUR 70,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 5 disponibles
Taschenbuch. Condición: Neu. Knowledge-Driven Board-Level Functional Fault Diagnosis | Fangming Ye (u. a.) | Taschenbuch | xiii | Englisch | 2018 | Springer | EAN 9783319820545 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

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Librería: Buchpark, Trebbin, AlemaniaBuchpark
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Excelente
EUR 70,08
Envío por EUR 105,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponible
Condición: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.¿ Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;¿ Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;¿ Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.…

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Librería: Rarewaves.com UK, London, Reino UnidoRarewaves.com UK
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 104,77
Envío por EUR 76,79Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Hardback. Condición: New. 1st ed. 2017. This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing.Demonstrates techniques based on industrial data and feedback from an actual manufacturing line.Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.…

Knowledge-Driven Board-Level Functional Fault Diagnosis
Ye, Fangming, Zhang, Zhaobo, Chakrabarty, Krishnendu, Gu, Xi
- Tapa blanda
Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 165,49
Envío por EUR 29,54Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponible
Paperback. Condición: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

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Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 75,84
Envío por EUR 5,50Se envía de Italia a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: new. Questo è un articolo print on demand.

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Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 75,84
Envío por EUR 24,20Se envía de Italia a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: new. Questo è un articolo print on demand.

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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 93,08
Envío por EUR 23,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.-Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;-Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;-Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development. 164 pp. Englisch.…

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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 93,08
Envío por EUR 23,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.-Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;-Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;-Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development. 164 pp. Englisch.…

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Librería: moluna, Greven, Alemaniamoluna
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EUR 80,86
Envío por EUR 48,99Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturingDemonstrates techniques based on industrial data and feedback from an actual .…

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Librería: moluna, Greven, Alemaniamoluna
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 80,86
Envío por EUR 48,99Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturingDemonstrates techniques based on industrial data and feedback from an actual .…

Knowledge-Driven Board-Level Functional Fault Diagnosis
Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
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Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
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EUR 141,94
Envío por EUR 7,68Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. Print on Demand pp. 160.

Knowledge-Driven Board-Level Functional Fault Diagnosis
Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
- Tapa blanda
- Impresión bajo demanda
Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 142,15
Envío por EUR 9,95Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. PRINT ON DEMAND pp. 160.

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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 93,08
Envío por EUR 60,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponible
Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 164 pp. Englisch.…

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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 93,08
Envío por EUR 60,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponible
Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 164 pp. Englisch.…