Xubing lu (10 resultados)

Condición: New. In English.

Condición: New.

Buch. Condición: Neu. Neuware -Explores HfO2-based ferroelectrics for memory, sensing, and advanced electronic applicationsFerroelectric hafnium oxide (HfO2)-based materials have transformed the field of electronic materials and device design, offering pathways to overcome long-standing barriers in scalability, compatibility, and reliability. The emergence of robust ferroelectricity in doped HfO2 has revolutionized both research and industry perspectives, providing a viable solution where conventional ferroelectrics often fell short.With contributions from leading experts, HfO2-Based Ferroelectric Materials addresses the critical need for a consolidated reference on HfO2-based ferroelectrics, offering foundational knowledge as well as the latest insights into fabrication, material characterization, and device integration. The book opens with fundamentals of ferroelectricity and the mechanisms driving HfO2-based ferroelectric behavior, before progressing to detailed examinations of deposition techniques, superlattice structures, and reliability considerations. It further explores a broad spectrum of applications, including non-volatile memories, neuromorphic computing, compute-in-memory architectures, and negative capacitance transistors, alongside emerging roles in energy storage, microwave technologies, and piezoelectric systems. Special attention is given to persistent challenges such as the wake-up effect, fatigue, and imprint issues and the strategies developed to mitigate them.An authoritative and well-structured resource for advancing the frontiers of electronic materials and device technologies, HfO2-Based Ferroelectric Materials:\* Explains the origins of ferroelectricity in doped HfO2 and its unique material advantages\* Details deposition techniques and approaches to regulating ferroelectric behavior\* Examines device-level challenges, including wake-up effect, fatigue, and imprint reliability\* Highlights applications spanning non-volatile memories, neuromorphic computing, and energy-efficient devices\* Discusses advanced designs such as superlattice-like laminate structures and 3D ferroelectric memories\* Provides insight into the reliability of HfO2-based thin films, capacitors, and field-effect transistorsHfO2-Based Ferroelectric Materials: Fabrication, Characterization, and Device Applications is an essential resource for materials scientists, electronics engineers, semiconductor and solid-state physicists, and professionals in the semiconductor and sensor industries. It is also a valuable reference for graduate-level courses in electronic materials, semiconductor devices, and advanced nanotechnology within physics, materials science, and electrical engineering degree programs. 480 pp. Englisch.…

Buch. Condición: Neu. Neuware -Explores HfO2-based ferroelectrics for memory, sensing, and advanced electronic applicationsFerroelectric hafnium oxide (HfO2)-based materials have transformed the field of electronic materials and device design, offering pathways to overcome long-standing barriers in scalability, compatibility, and reliability. The emergence of robust ferroelectricity in doped HfO2 has revolutionized both research and industry perspectives, providing a viable solution where conventional ferroelectrics often fell short.With contributions from leading experts, HfO2-Based Ferroelectric Materials addresses the critical need for a consolidated reference on HfO2-based ferroelectrics, offering foundational knowledge as well as the latest insights into fabrication, material characterization, and device integration. The book opens with fundamentals of ferroelectricity and the mechanisms driving HfO2-based ferroelectric behavior, before progressing to detailed examinations of deposition techniques, superlattice structures, and reliability considerations. It further explores a broad spectrum of applications, including non-volatile memories, neuromorphic computing, compute-in-memory architectures, and negative capacitance transistors, alongside emerging roles in energy storage, microwave technologies, and piezoelectric systems. Special attention is given to persistent challenges such as the wake-up effect, fatigue, and imprint issues and the strategies developed to mitigate them.An authoritative and well-structured resource for advancing the frontiers of electronic materials and device technologies, HfO2-Based Ferroelectric Materials:\* Explains the origins of ferroelectricity in doped HfO2 and its unique material advantages\* Details deposition techniques and approaches to regulating ferroelectric behavior\* Examines device-level challenges, including wake-up effect, fatigue, and imprint reliability\* Highlights applications spanning non-volatile memories, neuromorphic computing, and energy-efficient devices\* Discusses advanced designs such as superlattice-like laminate structures and 3D ferroelectric memories\* Provides insight into the reliability of HfO2-based thin films, capacitors, and field-effect transistorsHfO2-Based Ferroelectric Materials: Fabrication, Characterization, and Device Applications is an essential resource for materials scientists, electronics engineers, semiconductor and solid-state physicists, and professionals in the semiconductor and sensor industries. It is also a valuable reference for graduate-level courses in electronic materials, semiconductor devices, and advanced nanotechnology within physics, materials science, and electrical engineering degree programs. 480 pp. Englisch.…

Condición: New.

Buch. Condición: Neu. HfO2-Based Ferroelectric Materials | Fabrication, Characterization and Device Applications | Xubing Lu | Buch | 480 S. | Englisch | 2026 | Wiley-VCH | EAN 9783527353187 | Verantwortliche Person für die EU: Wiley-VCH GmbH, Boschstr. 12, 69469 Weinheim, product-safety[at]wiley[dot]com | Anbieter: preigu. …

Buch. Condición: Neu. Neuware - Explores HfO2-based ferroelectrics for memory, sensing, and advanced electronic applicationsFerroelectric hafnium oxide (HfO2)-based materials have transformed the field of electronic materials and device design, offering pathways to overcome long-standing barriers in scalability, compatibility, and reliability. The emergence of robust ferroelectricity in doped HfO2 has revolutionized both research and industry perspectives, providing a viable solution where conventional ferroelectrics often fell short.With contributions from leading experts, HfO2-Based Ferroelectric Materials addresses the critical need for a consolidated reference on HfO2-based ferroelectrics, offering foundational knowledge as well as the latest insights into fabrication, material characterization, and device integration. The book opens with fundamentals of ferroelectricity and the mechanisms driving HfO2-based ferroelectric behavior, before progressing to detailed examinations of deposition techniques, superlattice structures, and reliability considerations. It further explores a broad spectrum of applications, including non-volatile memories, neuromorphic computing, compute-in-memory architectures, and negative capacitance transistors, alongside emerging roles in energy storage, microwave technologies, and piezoelectric systems. Special attention is given to persistent challenges such as the wake-up effect, fatigue, and imprint issues and the strategies developed to mitigate them.An authoritative and well-structured resource for advancing the frontiers of electronic materials and device technologies, HfO2-Based Ferroelectric Materials:\* Explains the origins of ferroelectricity in doped HfO2 and its unique material advantages\* Details deposition techniques and approaches to regulating ferroelectric behavior\* Examines device-level challenges, including wake-up effect, fatigue, and imprint reliability\* Highlights applications spanning non-volatile memories, neuromorphic computing, and energy-efficient devices\* Discusses advanced designs such as superlattice-like laminate structures and 3D ferroelectric memories\* Provides insight into the reliability of HfO2-based thin films, capacitors, and field-effect transistorsHfO2-Based Ferroelectric Materials: Fabrication, Characterization, and Device Applications is an essential resource for materials scientists, electronics engineers, semiconductor and solid-state physicists, and professionals in the semiconductor and sensor industries. It is also a valuable reference for graduate-level courses in electronic materials, semiconductor devices, and advanced nanotechnology within physics, materials science, and electrical engineering degree programs.…

Hardcover. Condición: new. Hardcover. Explores HfO2-based ferroelectrics for memory, sensing, and advanced electronic applications Ferroelectric hafnium oxide (HfO2)-based materials have transformed the field of electronic materials and device design, offering pathways to overcome long-standing barriers in scalability, compatibility, and reliability. The emergence of robust ferroelectricity in doped HfO2 has revolutionized both research and industry perspectives, providing a viable solution where conventional ferroelectrics often fell short. With contributions from leading experts, HfO2-Based Ferroelectric Materials addresses the critical need for a consolidated reference on HfO2-based ferroelectrics, offering foundational knowledge as well as the latest insights into fabrication, material characterization, and device integration. The book opens with fundamentals of ferroelectricity and the mechanisms driving HfO2-based ferroelectric behavior, before progressing to detailed examinations of deposition techniques, superlattice structures, and reliability considerations. It further explores a broad spectrum of applications, including non-volatile memories, neuromorphic computing, compute-in-memory architectures, and negative capacitance transistors, alongside emerging roles in energy storage, microwave technologies, and piezoelectric systems. Special attention is given to persistent challengessuch as the wake-up effect, fatigue, and imprint issuesand the strategies developed to mitigate them. An authoritative and well-structured resource for advancing the frontiers of electronic materials and device technologies, HfO2-Based Ferroelectric Materials: Explains the origins of ferroelectricity in doped HfO2 and its unique material advantagesDetails deposition techniques and approaches to regulating ferroelectric behaviorExamines device-level challenges, including wake-up effect, fatigue, and imprint reliabilityHighlights applications spanning non-volatile memories, neuromorphic computing, and energy-efficient devicesDiscusses advanced designs such as superlattice-like laminate structures and 3D ferroelectric memoriesProvides insight into the reliability of HfO2-based thin films, capacitors, and field-effect transistors HfO2-Based Ferroelectric Materials: Fabrication, Characterization, and Device Applications is an essential resource for materials scientists, electronics engineers, semiconductor and solid-state physicists, and professionals in the semiconductor and sensor industries. It is also a valuable reference for graduate-level courses in electronic materials, semiconductor devices, and advanced nanotechnology within physics, materials science, and electrical engineering degree programs. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

Hardcover. Condición: new. Hardcover. Explores HfO2-based ferroelectrics for memory, sensing, and advanced electronic applications Ferroelectric hafnium oxide (HfO2)-based materials have transformed the field of electronic materials and device design, offering pathways to overcome long-standing barriers in scalability, compatibility, and reliability. The emergence of robust ferroelectricity in doped HfO2 has revolutionized both research and industry perspectives, providing a viable solution where conventional ferroelectrics often fell short. With contributions from leading experts, HfO2-Based Ferroelectric Materials addresses the critical need for a consolidated reference on HfO2-based ferroelectrics, offering foundational knowledge as well as the latest insights into fabrication, material characterization, and device integration. The book opens with fundamentals of ferroelectricity and the mechanisms driving HfO2-based ferroelectric behavior, before progressing to detailed examinations of deposition techniques, superlattice structures, and reliability considerations. It further explores a broad spectrum of applications, including non-volatile memories, neuromorphic computing, compute-in-memory architectures, and negative capacitance transistors, alongside emerging roles in energy storage, microwave technologies, and piezoelectric systems. Special attention is given to persistent challengessuch as the wake-up effect, fatigue, and imprint issuesand the strategies developed to mitigate them. An authoritative and well-structured resource for advancing the frontiers of electronic materials and device technologies, HfO2-Based Ferroelectric Materials: Explains the origins of ferroelectricity in doped HfO2 and its unique material advantagesDetails deposition techniques and approaches to regulating ferroelectric behaviorExamines device-level challenges, including wake-up effect, fatigue, and imprint reliabilityHighlights applications spanning non-volatile memories, neuromorphic computing, and energy-efficient devicesDiscusses advanced designs such as superlattice-like laminate structures and 3D ferroelectric memoriesProvides insight into the reliability of HfO2-based thin films, capacitors, and field-effect transistors HfO2-Based Ferroelectric Materials: Fabrication, Characterization, and Device Applications is an essential resource for materials scientists, electronics engineers, semiconductor and solid-state physicists, and professionals in the semiconductor and sensor industries. It is also a valuable reference for graduate-level courses in electronic materials, semiconductor devices, and advanced nanotechnology within physics, materials science, and electrical engineering degree programs. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Hardcover. Condición: new. Hardcover. Explores HfO2-based ferroelectrics for memory, sensing, and advanced electronic applications Ferroelectric hafnium oxide (HfO2)-based materials have transformed the field of electronic materials and device design, offering pathways to overcome long-standing barriers in scalability, compatibility, and reliability. The emergence of robust ferroelectricity in doped HfO2 has revolutionized both research and industry perspectives, providing a viable solution where conventional ferroelectrics often fell short. With contributions from leading experts, HfO2-Based Ferroelectric Materials addresses the critical need for a consolidated reference on HfO2-based ferroelectrics, offering foundational knowledge as well as the latest insights into fabrication, material characterization, and device integration. The book opens with fundamentals of ferroelectricity and the mechanisms driving HfO2-based ferroelectric behavior, before progressing to detailed examinations of deposition techniques, superlattice structures, and reliability considerations. It further explores a broad spectrum of applications, including non-volatile memories, neuromorphic computing, compute-in-memory architectures, and negative capacitance transistors, alongside emerging roles in energy storage, microwave technologies, and piezoelectric systems. Special attention is given to persistent challengessuch as the wake-up effect, fatigue, and imprint issuesand the strategies developed to mitigate them. An authoritative and well-structured resource for advancing the frontiers of electronic materials and device technologies, HfO2-Based Ferroelectric Materials: Explains the origins of ferroelectricity in doped HfO2 and its unique material advantagesDetails deposition techniques and approaches to regulating ferroelectric behaviorExamines device-level challenges, including wake-up effect, fatigue, and imprint reliabilityHighlights applications spanning non-volatile memories, neuromorphic computing, and energy-efficient devicesDiscusses advanced designs such as superlattice-like laminate structures and 3D ferroelectric memoriesProvides insight into the reliability of HfO2-based thin films, capacitors, and field-effect transistors HfO2-Based Ferroelectric Materials: Fabrication, Characterization, and Device Applications is an essential resource for materials scientists, electronics engineers, semiconductor and solid-state physicists, and professionals in the semiconductor and sensor industries. It is also a valuable reference for graduate-level courses in electronic materials, semiconductor devices, and advanced nanotechnology within physics, materials science, and electrical engineering degree programs. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.…