Raji mohsen (34 resultados)

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Condición: New. 1st ed. 2021 edition NO-PA16APR2015-KAP.

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Hardcover. Condición: Brand New. 127 pages. 9.25x6.10x9.21 inches. In Stock.

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Condición: New. pp. 124.

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Paperback. Condición: Brand New. 120 pages. 9.25x6.10x0.28 inches. In Stock.

Hardcover. Condición: Brand New. 120 pages. 9.25x6.10x9.21 inches. In Stock.

Taschenbuch. Condición: Neu. Lifetime Reliability-aware Design of Integrated Circuits | Mohsen Raji (u. a.) | Taschenbuch | xiii | Englisch | 2023 | Springer | EAN 9783031153471 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today's reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques. 128 pp. Englisch.…

Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today's reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques. 128 pp. Englisch.…

Condición: new. Questo è un articolo print on demand.

Condición: new. Questo è un articolo print on demand.

Condición: New. Print on Demand.

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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniqu.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an accessible, comprehensive introduction to soft errorsDescribes an easy to follow procedure for modeling, analysis, and estimation of soft error rate of digital circuitsIncludes state-of-the art soft error aware CAD algorithms.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuitsDescribes state-of-the art aging- and process variation-aware CAD algorithmsIncludes reliability improvement techniques for common clocked.…

Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital syste.…

Condición: New. Print on Demand pp. 124.

Condición: New. Print on Demand.