Lifetime Reliability-aware Design of Integrated Circuits - Tapa blanda

Raji, Mohsen; Ghavami, Behnam

 
9783031153471: Lifetime Reliability-aware Design of Integrated Circuits
Tapa blanda
ISBN 10: 3031153472 ISBN 13: 9783031153471
Editorial: Springer, 2023

Sinopsis

This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.   

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Acerca del autor

Mohsen Raji received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as a faculty member in School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran, since 2015. He teaches courses such as VLSI systems design, microprocessors, embedded systems, fault tolerant system design. He has supervised or co-supervised about 10 graduate students and published over 30 refereed papers. He is serving as an associated editor of Iranian Journal of Science and Technology, Transactions of Electrical Engineering. His current research interests include dependable computing, reliable and robust logic designs, design automation of digital systems, and embedded systems.

 

Behnam Ghavami was born in Esfarayen, Iran. He received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as a Faculty Member with the Computer Engineering Department, Shahid Bahonar University of Kerman, since 2010, where he is currently an Associate Professor. He teaches courses in design and test of digital systems, computer architecture, embedded processor design, and reliable circuit design. He has supervised or co-supervised about 20 graduate students. He has published over 100 refereed papers. His research interests include the design automation of digital systems, computer architecture, statistical analysis, robust logic designs, and embedded processors. He is currently an Associate Editor of the Journal of Electronic Testing-Springer and Microelectronics Journal-Elsevier. He has a decade of industry experience, including working on FPGA in automotive industry.

De la contraportada

This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.

  • Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits;
  • Describes state-of-the art aging- and process variation-aware CAD algorithms;
  • Includes reliability improvement techniques for common clocked storage element.

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Editorial
Springer
Año de publicación
2023
Idioma
Inglés
ISBN 10 
3031153472
ISBN 13 
9783031153471
Encuadernación
Tapa blanda
Número de edición
1
Número de páginas
124
Contacto del fabricante
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Darmstadt
64293
Alemania

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9783031153440: Lifetime Reliability-aware Design of Integrated Circuits

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ISBN 10:  3031153448 ISBN 13:  9783031153440
Editorial: Springer, 2022
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