Joseph eric dale (44 resultados)

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin
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Librería: ThriftBooks-Atlanta, AUSTELL, GA, Estados Unidos de AmericaThriftBooks-Atlanta
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Regular
EUR 7,59
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Fair. No Jacket. Former library book; Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin
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Librería: ThriftBooks-Dallas, Dallas, TX, Estados Unidos de AmericaThriftBooks-Dallas
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Aceptable
EUR 7,59
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin
- Tapa dura
Librería: ThriftBooks-Atlanta, AUSTELL, GA, Estados Unidos de AmericaThriftBooks-Atlanta
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 7,59
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin
- Tapa dura
Librería: ThriftBooks-Dallas, Dallas, TX, Estados Unidos de AmericaThriftBooks-Dallas
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Aceptable
EUR 7,59
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Good. No Jacket. Former library book; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin
- Tapa dura
Librería: ThriftBooks-Dallas, Dallas, TX, Estados Unidos de AmericaThriftBooks-Dallas
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Regular
EUR 7,59
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin
- Tapa dura
Librería: ThriftBooks-Atlanta, AUSTELL, GA, Estados Unidos de AmericaThriftBooks-Atlanta
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 7,59
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph,Joy, David C.,Newbury, Dale E.,Lifshin, Eric,Echlin, Patrick,Fiori, Charles
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Librería: HPB Inc., Dallas, TX, Estados Unidos de AmericaHPB Inc.
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 4,60
Envío por EUR 3,35Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
hardcover. Condición: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph I. Goldstein~Dale E. Newbury~Patrick Echlin~David C. Joy~Charles Fiori~Eric Lifshin
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Librería: Bookmans, tucson, AZ, Estados Unidos de AmericaBookmans
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Regular
EUR 4,60
Envío por EUR 3,56Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Acceptable. Highlighting/Underlining/Notes etc. Satisfaction 100% guaranteed.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
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Librería: BooksRun, Philadelphia, PA, Estados Unidos de AmericaBooksRun
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 8,83
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Very Good. 2nd ed. With dust jacket. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

- Tapa dura
Librería: HPB-Red, Dallas, TX, Estados Unidos de AmericaHPB-Red
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Aceptable
EUR 7,22
Envío por EUR 3,35Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Alton D. Romig Jr.; Charles E. Lyman; Charles Fiori; Eric Lifshin
- Tapa dura
Librería: ThriftBooks-Atlanta, AUSTELL, GA, Estados Unidos de AmericaThriftBooks-Atlanta
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 10,89
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph I. Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin
- Tapa dura
Librería: Visible Voice Books, Cleveland, OH, Estados Unidos de AmericaVisible Voice Books
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 6,90
Envío por EUR 4,02Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
hardcover. Condición: Very Good. Springer November 1981.

Idioma: Inglés
Editorial: Hargrove Press, 2025
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Librería: 2nd Life Books, Burlington, NJ, Estados Unidos de America2nd Life Books
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 8,57
Envío por EUR 3,57Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Condición: very_good. Used book in very good condition. May have some minor wear. May NOT include discs, or access code or other supplemental material. Ships directly from Amazon and is eligible for Prime or super saver FREE shipping. We ship Monday-Saturday and respond to inquiries within 24 hours.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Joseph I. Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin
- Tapa dura
Librería: Half Price Books Inc., Dallas, TX, Estados Unidos de AmericaHalf Price Books Inc.
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 9,19
Envío por EUR 3,35Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
hardcover. Condición: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Fiori, Charles; Lifshin, Eric
- Tapa dura
Librería: SoCo Books, Trinidad, CO, Estados Unidos de AmericaSoCo Books
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Bueno
EUR 7,82
Envío por EUR 6,24Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Very Good. Estado de la sobrecubierta: Fair. 2nd Edition.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
- Tapa dura
Librería: Bulrushed Books, Moscow, ID, Estados Unidos de AmericaBulrushed Books
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Regular
EUR 9,20
Envío por EUR 8,02Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Condición: Acceptable. SHIPS FAST. RESCUED + REPAIRED. Features a small coffee mishap, plus a reinforced binding, secured cover, and light annotations or highlighting-a durable, fully readable working copy brought back to life at a great value by our Book Sustainability Project. No access codes or CDs.…

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists (Second Edition)
Goldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig, Alton D. Jr.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
- Tapa dura
Librería: Florida Mountain Book Co., Datil, NM, Estados Unidos de AmericaFlorida Mountain Book Co.
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 24,79
Envío por EUR 4,91Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Condición: Very Good. Hardcover, [xviii], 820 pages. Very Good condition in a Good dust jacket. Second edition. Size 10.25"x7.5". "The authors, emphasizing the practical aspects of the techniques described, discuss user-controlled functions of scanning electron microscope and electron microprobe electron optics, the characteristics of electron-specimen interactions, image formation and interpretation, and x-ray spectrometry." Book has moderate handling/shelfwear. Previous owner's name on front fly. Binding is tight. Text is clean and unmarked. Dust jacket has edgewear and sunned spine.…

- Tapa dura
- Primera edición
Librería: Paradou Books, Richmond, VA, Estados Unidos de AmericaParadou Books
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 27,59
Envío por EUR 3,53Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Very Good. 1st Edition. Clothbound hardcover, 119 pgs. Essays, color illus. Very light rubbing to cover, else fine.

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.
- Tapa dura
Librería: A Squared Books (Don Dewhirst), South Lyon, MI, Estados Unidos de AmericaA Squared Books (Don Dewhirst)
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 41,38
Envío por EUR 5,79Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
hardcover. Condición: Very Good. 3rd. Third Edition; 2003. Glossy paper covers; minimal wear; stain on top edge, otherwise like new condition; 4to - over 9 3/4" to 12" tall; no jacket. Interior is bright, clean and unmarked; 690 pages. Additional shipping charges may be required due to the size and weight of book.…

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.
- Tapa dura
Librería: -OnTimeBooks-, Phoenix, AZ, Estados Unidos de America-OnTimeBooks-
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Aceptable
EUR 50,16
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Condición: good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail.…

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Librería: Books From California, Simi Valley, CA, Estados Unidos de AmericaBooks From California
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Bueno
EUR 47,28
Envío por EUR 4,46Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
hardcover. Condición: Very Good. Cover and edges may have some wear.

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
Lyman, Charles E.; Newbury, Dale E.; Goldstein, Joseph; Williams, David B.; Romig Jr., Alton D.; Armstrong, John; Echlin, Patrick; Fiori, Charles; Joy, David C.; Lifshin, Eric; Peters, Klaus-Rüdiger
- Tapa blanda
Librería: -OnTimeBooks-, Phoenix, AZ, Estados Unidos de America-OnTimeBooks-
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Aceptable
EUR 52,30
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Condición: good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail.…

- Tapa blanda
Librería: HPB-Red, Dallas, TX, Estados Unidos de AmericaHPB-Red
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Aceptable
EUR 49,60
Envío por EUR 3,35Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Paperback. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists. 2nd Edition
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Alton D. Romig Jr.; Charles E. Lyman; Charles Fiori; Eric Lifshin
- Tapa dura
Librería: Rob the Book Man, Vancouver, WA, Estados Unidos de AmericaRob the Book Man
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Muy bueno
EUR 58,62
Envío por EUR 6,24Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Near Fine. Estado de la sobrecubierta: Very Good. 2nd Edition. Hardback in near fine condition with a very good plus dust jacket. 2nd Edition.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
- Tapa dura
Librería: DeckleEdge LLC, Albuquerque, NM, Estados Unidos de AmericaDeckleEdge LLC
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 65,11
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
hardcover. Condición: new.

Scanning Electron Microscopy and X-ray Microanalysis: A Text for Biologists, Materials Scientists and Geologists Goldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick and Joy, D. C.
Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric
- Tapa dura
Librería: online-buch-de, Dozwil, Suizaonline-buch-de
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 64,00
Envío por EUR 36,00Se envía de Suiza a Estados Unidos de AmericaCantidad disponible: 1 disponible
Jun 01, 1992. Condición: gebraucht; wie neu. Hardcover mit Schutzumschlag, dieser mit minimalen Standspuren, Buch selbst ist ungebraucht, 2. Auflage.

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.
- Tapa dura
Librería: DeckleEdge LLC, Albuquerque, NM, Estados Unidos de AmericaDeckleEdge LLC
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 120,47
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
hardcover. Condición: new.

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.
- Tapa blanda
Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 102,25
Envío por EUR 17,63Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. In English.
Más imágenes- Tapa blanda
Librería: Rarewaves.com USA, London, LONDO, Reino UnidoRarewaves.com USA
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 128,63
Gastos de envío gratisSe envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Paperback. Condición: New. Third Edition 2003. In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and "through-the-lens" detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.…

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.
- Tapa blanda
Librería: California Books, Miami, FL, Estados Unidos de AmericaCalifornia Books
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 140,70
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New.