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Scanning Electron Microscopy and X-ray Microanalysis: A Text for Biologists, Materials Scientists and Geologists - Tapa dura
Sinopsis
Book by Goldstein Joseph Newbury Dale E Echlin Patrick Joy
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From a review of the first edition:
`The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.'
Microscope Journal
Reseña del editor
In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.
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Scanning Electron Microscopy and X-ray Microanalysis
Publicado por
Kluwer Academic Publishers Group, 1992
ISBN 10: 0306441756
ISBN 13: 9780306441752
Antiguo o usado
Tapa dura
Librería: Buchpark, Trebbin, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher. Nº de ref. del artículo: 1273477/202
Cantidad disponible: 1 disponibles
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Librería: ThriftBooks-Dallas, Dallas, TX, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 4.38. Nº de ref. del artículo: G0306441756I3N01
Cantidad disponible: 1 disponibles
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Librería: ThriftBooks-Atlanta, AUSTELL, GA, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 4.38. Nº de ref. del artículo: G0306441756I3N01
Cantidad disponible: 1 disponibles
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists (Second Edition)
Publicado por
Plenum Press, NY, 1992
ISBN 10: 0306441756
ISBN 13: 9780306441752
Antiguo o usado
Tapa dura
Librería: Florida Mountain Book Co., Datil, NM, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: Very Good. Hardcover, [xviii], 820 pages. Very Good condition in a Good dust jacket. Second edition. Size 10.25"x7.5". "The authors, emphasizing the practical aspects of the techniques described, discuss user-controlled functions of scanning electron microscope and electron microprobe electron optics, the characteristics of electron-specimen interactions, image formation and interpretation, and x-ray spectrometry." Book has moderate handling/shelfwear. Previous owner's name on front fly. Binding is tight. Text is clean and unmarked. Dust jacket has edgewear and sunned spine. Nº de ref. del artículo: 009504
Cantidad disponible: 1 disponibles
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Scanning Electron Microscopy and X-Ray Microanalysis: A Ts and Geoext for Biologists, Materials Scientistlogists
Publicado por
Plenum Press, 1992
ISBN 10: 0306441756
ISBN 13: 9780306441752
Antiguo o usado
Tapa dura
Librería: Anybook.com, Lincoln, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Dust jacket in poor condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,2000grams, ISBN:0306441756. Nº de ref. del artículo: 9797329
Cantidad disponible: 1 disponibles
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Librería: Bulrushed Books, Moscow, ID, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Condición: Acceptable. LIGHTNING FAST SHIPPING! A heavily used, but still working copy. Coffee stain and wrinkling to the edge of the pages when a tired undergrad fell asleep and knocked their cup over on their books. The binding and pages of the book have been reinforced with tape, has tape and stickers on the cover, as well as lots of notes (some of the answers in the learning activities may be filled in) on the pages. Definitely not pretty, but it's a working copy at a great price that ships fast. ~ Book does NOT contain an access code or CD/DVD. Nº de ref. del artículo: #212F-00072
Cantidad disponible: 1 disponibles
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig Jr., Alton D.; Lyman, Charles E.; Fiori, Charles and Lifshin, Eric
Librería: online-buch-de, Dozwil, Suiza
Calificación del vendedor: 5 de 5 estrellas
Condición: gebraucht; wie neu. Hardcover mit Schutzumschlag, dieser mit minimalen Standspuren, Buch selbst ist ungebraucht, 2. Auflage. Nº de ref. del artículo: 573-2-38
Cantidad disponible: 1 disponibles
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Librería: The Book Spot, Sioux Falls, MN, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: New. Nº de ref. del artículo: Abebooks60494
Cantidad disponible: 1 disponibles
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists. 2nd Edition
Librería: Rob the Book Man, Vancouver, WA, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Hardcover. Condición: Near Fine. Estado de la sobrecubierta: Very Good. 2nd Edition. Hardback in near fine condition with a very good plus dust jacket. 2nd Edition. Nº de ref. del artículo: 15119
Cantidad disponible: 1 disponibles
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Librería: Toscana Books, AUSTIN, TX, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks. Nº de ref. del artículo: Scanned0306441756
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