Scanning Electron Microscopy and X-ray Microanalysis: A Text for Biologists, Materials Scientists and Geologists - Tapa dura

Goldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, D. C.

 
9780306441752: Scanning Electron Microscopy and X-ray Microanalysis: A Text for Biologists, Materials Scientists and Geologists
Tapa dura
ISBN 10: 0306441756 ISBN 13: 9780306441752
Editorial: Kluwer Academic / Plenum Publishers, 1992

Sinopsis

Book by Goldstein Joseph Newbury Dale E Echlin Patrick Joy

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Críticas

From a review of the first edition:
`The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.'
Microscope Journal

Reseña del editor

In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High­ resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop­ ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.

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Editorial
Kluwer Academic / Plenum Publishers
Año de publicación
1992
Idioma
Inglés
ISBN 10 
0306441756
ISBN 13 
9780306441752
Encuadernación
Tapa dura
Número de páginas
800
Contacto del fabricante
no disponible
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Otras ediciones populares con el mismo título

9781461276531: Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

Edición Destacada

ISBN 10:  1461276535 ISBN 13:  9781461276531
Editorial: Springer, 2011
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