Jacques derrien (23 resultados)
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Idioma: Inglés
Editorial: Springer Berlin Heidelberg, Springer Berlin Heidelberg, 1995
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The discovery of bright visible light emission from porous silicon has opened the door to various nanometer sized silicon structures where the confinement of carriers gives rise to interesting physical properties. While the high efficiency of the l…ight emission in the visible range is the common and the most prominent feature, their structures display similar properties with other highly divided materials (even non semiconductors), and then justify a multidisciplinary approach. This along with potential applications has attracted a large number of researchers followed by students to be trained. Until now international conferences have provided the exchange of information but have remained highly specialised so it was time to give thought to the organisation of topical and advanced lectures where the multidisciplinarity and the didactic approach are paramount. L'ecole des Houches was ideally devoted to that purpose. The meeting : ' Luminescence of porous silicon and silicon nanostructures' was the first international school on this topic but some aspects in the organisation and the attendance have given an international workshop flavor to it. The school by itself has trained 82 'students', most of them were students starting their Ph. D thesis. 50% were French citizens and the other represented countries were Germany, England, USA, Czechoslovakia, The Netherlands, Italy, Japan, Poland, Spain, Canada, Brazil, India and Russia.
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Semiconductor Interfaces: Formation and Properties : Proceedings of the Workkshop, Les Houches, France February 24?march 6, 1987
Lelay, Guy (EDT); Derrien, Jacques (EDT); Boccara, Nino (EDT)
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Semiconductor Interfaces: Formation and Properties : Proceedings of the Workkshop, Les Houches, France February 24?march 6, 1987
Lelay, Guy (EDT); Derrien, Jacques (EDT); Boccara, Nino (EDT)
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Semiconductor Interfaces: Formation and Properties : Proceedings of the Workkshop, Les Houches, France February 24?march 6, 1987
Lelay, Guy (EDT); Derrien, Jacques (EDT); Boccara, Nino (EDT)
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Semiconductor Interfaces: Formation and Properties : Proceedings of the Workkshop, Les Houches, France February 24?march 6, 1987
Lelay, Guy (EDT); Derrien, Jacques (EDT); Boccara, Nino (EDT)
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Condición: New. pp. 408.
Semiconductor Interfaces: Formation and Properties: Proceedings of the Workkshop, Les Houches, France February 24 March 6, 1987 (Springer Proceedings in Physics)
LeLay, Guy (Editor) / Derrien, Jacques (Editor) / Boccara, Nino (Editor)
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Paperback. Condición: Brand New. reprint edition. 400 pages. 9.60x6.80x1.00 inches. In Stock.
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration…of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success.
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Editorial: Éditions Bordessoules. Collection L'Histoire par les Documents. Saint-Jean-d'Angély. Charente-Maritime. Décembre, 1984
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Añadir al carritoCouverture rigide. Condición: Très bon. Estado de la sobrecubierta: Très bon. Cartonnage de l'éditeur imprimé en marron, jaquette blanche illustrée en couleurs [Vue de Laval - Le Château et le Vieux-Pont vers 1850 - Détail d'une peinture de Jean-Baptiste Messager] et imprimée en gris, blanc, noir, bleu, vert & rouge, in-4, 237x1…88 mm, préface de René Ballayer, Président du Conseil Général de la Mayenne, importante iconographie en noir dans le texte (cartes, plans, graphiques, gravures, photographies, etc.), bibliographie, index des noms de personnes, index des noms de lieux, édition originale augmentée d'une dédicace signée de 5 des 7 auteurs [Salbert - Naveau - Derrien - Pichot - Bouillon], très bon état (livre et jaquette). 432 pages. La Mayenne, des origines à nos jours. 1. Introduction géographique, par Jacques Salbert. 2. Les Temps Préhistoriques, par Roger Bouillon. 3. L'Âge du Fer et l'Antiquité, par Jacques Naveau, Archéologue. 4. La Moyen Age, par Daniel Pichot. 5. La Mayenne des Temps Modernes (XVIe - XVIIIe siècles), par Jacques Salbert. 6. Révolution, Contre-Révolution et Pacification (1789-1815), par Michel Denis. 7. Une contre-société (1815-1880), par Michel Denis et Pierre Derrien. 8. La Mayenne conservatrice (1880-1939), par Michel Denis. 9. La Mayenne de 1939 à nos jours - Le temps des mutations, par Georges Macé et Jacques Salbert. Dédicacé par l'auteur.
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Editorial: Springer Berlin Heidelberg, Springer Mär 1995, 1995
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The discovery of bright visible light emission from porous silicon has opened the door to various nanometer sized silicon structures where the confinement of carriers gives rise to interesting physical properties. While the high eff…iciency of the light emission in the visible range is the common and the most prominent feature, their structures display similar properties with other highly divided materials (even non semiconductors), and then justify a multidisciplinary approach. This along with potential applications has attracted a large number of researchers followed by students to be trained. Until now international conferences have provided the exchange of information but have remained highly specialised so it was time to give thought to the organisation of topical and advanced lectures where the multidisciplinarity and the didactic approach are paramount. L'ecole des Houches was ideally devoted to that purpose. The meeting : ' Luminescence of porous silicon and silicon nanostructures' was the first international school on this topic but some aspects in the organisation and the attendance have given an international workshop flavor to it. The school by itself has trained 82 'students', most of them were students starting their Ph. D thesis. 50% were French citizens and the other represented countries were Germany, England, USA, Czechoslovakia, The Netherlands, Italy, Japan, Poland, Spain, Canada, Brazil, India and Russia. 380 pp. Englisch.
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Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The discovery of bright visible light emission from porous silicon has opened the door to various nanometer sized silicon structures where the confinement of carriers gives rise to interesting physical properties. While the high efficie…ncy of the light emission in the visible range is the common and the most prominent feature, their structures display similar properties with other highly divided materials (even non semiconductors), and then justify a multidisciplinary approach. This along with potential applications has attracted a large number of researchers followed by students to be trained. Until now international conferences have provided the exchange of information but have remained highly specialised so it was time to give thought to the organisation of topical and advanced lectures where the multidisciplinarity and the didactic approach are paramount. L'ecole des Houches was ideally devoted to that purpose. The meeting : ' Luminescence of porous silicon and silicon nanostructures' was the first international school on this topic but some aspects in the organisation and the attendance have given an international workshop flavor to it. The school by itself has trained 82 «students», most of them were students starting their Ph. D thesis. 50% were French citizens and the other represented countries were Germany, England, USA, Czechoslovakia, The Netherlands, Italy, Japan, Poland, Spain, Canada, Brazil, India and Russia.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 380 pp. Englisch.
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Taschenbuch. Condición: Neu. Porous Silicon Science and Technology | Winter School Les Houches, 8 to 12 February 1994 | Jacques Derrien (u. a.) | Taschenbuch | xvii | Englisch | 1995 | Springer-Verlag GmbH | EAN 9783540589365 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[…dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in…the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success. 408 pp. Englisch.
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently be…en achieved in the elaboration of new th.
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Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the…elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 408 pp. Englisch.
