D keith bowen (26 resultados)
Victoria History of Herefordshire : Colwall
Bowen, James P. (EDT); Craven, Alex (EDT); Comber, Jonathan (CON); Ray, Keith (CON); Whitehead, David (CON)
- Tapa blanda
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 21,58
Envío por EUR 2,31Se envía dentro de Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: As New. Unread book in perfect condition.
Victoria History of Herefordshire : Colwall
Bowen, James P. (EDT); Craven, Alex (EDT); Comber, Jonathan (CON); Ray, Keith (CON); Whitehead, David (CON)
- Tapa blanda
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 25,34
Envío por EUR 2,31Se envía dentro de Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New.
Victoria History of Herefordshire : Colwall
Bowen, James P. (EDT); Craven, Alex (EDT); Comber, Jonathan (CON); Ray, Keith (CON); Whitehead, David (CON)
- Tapa blanda
Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 22,45
Envío por EUR 17,64Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New.
- Tapa dura
Librería: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Alemaniabooks4less (Versandantiquariat Petra Gros GmbH & Co. KG)
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 20,95
Envío por EUR 19,95Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
gebundene Ausgabe. Condición: Gut. 589 Seiten Das hier angebotene Buch stammt aus einer teilaufgelösten Bibliothek und kann die entsprechenden Kennzeichnungen aufweisen (Rückenschild, Instituts-Stempel.); der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Original-Schutzumschlag vorhanden (siehe Foto). In E…NGLISCHER Sprache. Sprache: Englisch Gewicht in Gramm: 1125.
Victoria History of Herefordshire : Colwall
Bowen, James P. (EDT); Craven, Alex (EDT); Comber, Jonathan (CON); Ray, Keith (CON); Whitehead, David (CON)
- Tapa blanda
Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 24,51
Envío por EUR 17,64Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: As New. Unread book in perfect condition.
- Tapa blanda
Librería: THE SAINT BOOKSTORE, Southport, Reino UnidoTHE SAINT BOOKSTORE
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 95,64
Envío por EUR 18,61Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Paperback / softback. Condición: New. New copy - Usually dispatched within 4 working days.
- Tapa dura
Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 239,81
Envío por EUR 3,49Se envía dentro de Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. pp. 296 Index.
- Tapa dura
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 257,04
Envío por EUR 2,31Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: New.
- Tapa dura
Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 250,81
Envío por EUR 17,64Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New.
- Tapa dura
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 272,86
Envío por EUR 2,31Se envía dentro de Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New.
- Tapa dura
- Primera edición
Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de AmericaGrand Eagle Retail
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 280,04
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: new. Hardcover. The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray met…rology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems.Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text.Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput. Emphasizes on practical metrology, with real world examples from the semiconductor and magnetics industries. This book discusses the techniques, theory, and applications of X-ray metrology in semiconductors and other advanced thin films. It covers the essential metrological questions of precision and repeatability, absolute accuracy and spot size. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
- Tapa dura
Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 264,17
Envío por EUR 17,64Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: New.
- Tapa dura
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 303,79
Envío por EUR 2,31Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: As New. Unread book in perfect condition.
- Tapa dura
Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 294,30
Envío por EUR 17,64Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: As New. Unread book in perfect condition.
X-Ray Metrology in Semiconductor Manufacturing
D. Keith Bowen (Bede Plc, Durham, UK)|Brian K. Tanner (University of Durham, UK)
- Tapa dura
Librería: moluna, Greven, Alemaniamoluna
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 257,81
Envío por EUR 48,99Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: New. D. Keith Bowen, Brian K. TannerThe scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved us.
- Tapa dura
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 321,07
Envío por EUR 2,31Se envía dentro de Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: As New. Unread book in perfect condition.
- Tapa dura
- Primera edición
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 303,86
Envío por EUR 10,50Se envía de Irlanda a Estados Unidos de AmericaCantidad disponible: 10 disponibles
Condición: New. Emphasizes on practical metrology, with real world examples from the semiconductor and magnetics industries. This book discusses the techniques, theory, and applications of X-ray metrology in semiconductors and other advanced thin films. It covers the essential metrological questions of precision and repeatabilit…y, absolute accuracy and spot size. Num Pages: 296 pages, 152 black & white illustrations, 14 black & white tables, 50 black & white halftones. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 245 x 162 x 21. Weight in Grams: 586. . 2006. 1st Edition. hardcover. . . . .
- Tapa dura
Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 310,94
Envío por EUR 17,64Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: As New. Unread book in perfect condition.
- Tapa dura
Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 346,26
Envío por EUR 14,70Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: Brand New. 1st edition. 296 pages. 9.50x6.25x0.75 inches. In Stock.
- Tapa dura
Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 378,37
Envío por EUR 9,18Se envía dentro de Estados Unidos de AmericaCantidad disponible: 10 disponibles
Condición: New. Emphasizes on practical metrology, with real world examples from the semiconductor and magnetics industries. This book discusses the techniques, theory, and applications of X-ray metrology in semiconductors and other advanced thin films. It covers the essential metrological questions of precision and repeatabilit…y, absolute accuracy and spot size. Num Pages: 296 pages, 152 black & white illustrations, 14 black & white tables, 50 black & white halftones. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 245 x 162 x 21. Weight in Grams: 586. . 2006. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.
- Tapa dura
- Primera edición
Librería: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 430,95
Envío por EUR 32,35Se envía de Australia a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: new. Hardcover. The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray met…rology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems.Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text.Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput. Emphasizes on practical metrology, with real world examples from the semiconductor and magnetics industries. This book discusses the techniques, theory, and applications of X-ray metrology in semiconductors and other advanced thin films. It covers the essential metrological questions of precision and repeatability, absolute accuracy and spot size. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Idioma: Inglés
Editorial: Taylor & Francis Inc, United States, Bosa Roca, 2006
- Tapa blanda
Librería: WorldofBooks, Goring-By-Sea, WS, Reino UnidoWorldofBooks
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 477,59
Envío por EUR 6,59Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Paperback. Condición: Very Good. The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrolog…y (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput. The book has been read, but is in excellent condition. Pages are intact and not marred by notes or highlighting. The spine remains undamaged.
Editorial: Artforum, 1995
- Tapa blanda
- Publicación periódica
Librería: castlebooksbcn, Barcelona, B, Españacastlebooksbcn
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 60,00
Envío por EUR 34,00Se envía de España a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Encuadernación de tapa blanda. Condición: Bien. Estado de la sobrecubierta: Bien. Essays "Q & A: Jeffrey Slonim on Pet Piles," by Jeffery Slonim; "Letter from Paris: Pascaline Cuvelier [and] Olivier Zahm on A.P.C," by Pascaline Cuvelier and Olivier Zahm; "Preview: Florine Stettheimer at the Whitney: Jutta Koether talks with Elis…abeth Sussman," by Jutta Koether; "Preview: Florine Stettheimer at the Whitney: Brooks Adams on the Florine Scene," by Brooks Adams; "Film: Brian D'Amato on Robert Longo's Johnny Mnemonic," by Brian D'Amato; "Gadget Love: R. U. Sirius reviews J. C. Herz's Surfing the Internet," by Gadget Love; "Music: Christina Kelly on Jenny Toomey," by Christina Kelly; "Real Life Rock: Greil Marcus' Top Ten," by Greil Marcus; "Goth to Dance: Donald Kuspit talks with Georg Baselitz," by Donald Kuspit; "Critical Reflections: Dale Hickey with an introduction by Peter Schjeldahl," by Dale Hickey and Peter Schieldahl; "Venezia / Venezuela: A Project for Artforum by Meyer Vaisman with an introduction by Jesús Fuenmayor," by Meyer Vaisman and Jesús Fuenmayor; "Diary of a Sad Housewife: Collier Schorr talks with Todd Haynes," by Collier Schorr; "Art of Living: James Meyer talks with Gregg Bordowitz," by James Meyer; "Into the Blue: Yves Klein: Comic Relief," by Nan Rosenthal; "Into the Blue: Yves Klein: Klein and Poses," by Benjamin H. D. Buchloh; "Openings: Maurizio Cattelan," by Olivier Zahm. Book reviews by John Ash, Yve-Alain Bois, Jean-Pierre Criqui, Arthur C. Danto, Jeffery Deitch, Bruce Hainley, bell hooks, Wayne Koestenbaum, Rhonda Lieberman, Richard Martin, Patrick McGrath, D. A. Miller, Michael Musto, Peter Schjeldahl, Richard Shiff, Richard Stone, Justin Spring, Carol Squiers, and Mim Udovitch. Reviews by Jan Avgikos, Peter Bowen, Barry Schwabsky, Andrew Solomon, Joshua Decter, Donald Kuspit, David Rimanelli, Keith Seward, Ingrid Schaffner, Faye Hirsch, Dan Cameron, John Ash, Ronny Cohen, Steven Drukman, Nico Israel, Joan Seeman Robinson, Laurie Palmer, Rosetta Brooks, Benjamin Weissman, Thomas McEvilley, John K. Grande, José Luis Brea, Menene Gras Balaguer, Massimo Carboni, Mario Codognato, Michael Tarantino, Jérôme Sans, Anne Dagbert, Elizabeth Janus, Yilmaz Dziewior, Noemi Smolik, Daniel Birnbaum, and Michael Archer. Cover: Florine Stettheimer.
Editorial: Artforum, 1995
- Tapa blanda
- Publicación periódica
Librería: castlebooksbcn, Barcelona, B, Españacastlebooksbcn
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 60,00
Envío por EUR 34,00Se envía de España a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Encuadernación de tapa blanda. Condición: Bien. Estado de la sobrecubierta: Bien. Essays "Q & A: Jeffrey Slonim on Pet Piles," by Jeffery Slonim; "Letter from Paris: Pascaline Cuvelier [and] Olivier Zahm on A.P.C," by Pascaline Cuvelier and Olivier Zahm; "Preview: Florine Stettheimer at the Whitney: Jutta Koether talks with Elis…abeth Sussman," by Jutta Koether; "Preview: Florine Stettheimer at the Whitney: Brooks Adams on the Florine Scene," by Brooks Adams; "Film: Brian D'Amato on Robert Longo's Johnny Mnemonic," by Brian D'Amato; "Gadget Love: R. U. Sirius reviews J. C. Herz's Surfing the Internet," by Gadget Love; "Music: Christina Kelly on Jenny Toomey," by Christina Kelly; "Real Life Rock: Greil Marcus' Top Ten," by Greil Marcus; "Goth to Dance: Donald Kuspit talks with Georg Baselitz," by Donald Kuspit; "Critical Reflections: Dale Hickey with an introduction by Peter Schjeldahl," by Dale Hickey and Peter Schieldahl; "Venezia / Venezuela: A Project for Artforum by Meyer Vaisman with an introduction by Jesús Fuenmayor," by Meyer Vaisman and Jesús Fuenmayor; "Diary of a Sad Housewife: Collier Schorr talks with Todd Haynes," by Collier Schorr; "Art of Living: James Meyer talks with Gregg Bordowitz," by James Meyer; "Into the Blue: Yves Klein: Comic Relief," by Nan Rosenthal; "Into the Blue: Yves Klein: Klein and Poses," by Benjamin H. D. Buchloh; "Openings: Maurizio Cattelan," by Olivier Zahm. Book reviews by John Ash, Yve-Alain Bois, Jean-Pierre Criqui, Arthur C. Danto, Jeffery Deitch, Bruce Hainley, bell hooks, Wayne Koestenbaum, Rhonda Lieberman, Richard Martin, Patrick McGrath, D. A. Miller, Michael Musto, Peter Schjeldahl, Richard Shiff, Richard Stone, Justin Spring, Carol Squiers, and Mim Udovitch. Reviews by Jan Avgikos, Peter Bowen, Barry Schwabsky, Andrew Solomon, Joshua Decter, Donald Kuspit, David Rimanelli, Keith Seward, Ingrid Schaffner, Faye Hirsch, Dan Cameron, John Ash, Ronny Cohen, Steven Drukman, Nico Israel, Joan Seeman Robinson, Laurie Palmer, Rosetta Brooks, Benjamin Weissman, Thomas McEvilley, John K. Grande, José Luis Brea, Menene Gras Balaguer, Massimo Carboni, Mario Codognato, Michael Tarantino, Jérôme Sans, Anne Dagbert, Elizabeth Janus, Yilmaz Dziewior, Noemi Smolik, Daniel Birnbaum, and Michael Archer. Cover: Florine Stettheimer.
- Tapa dura
- Impresión bajo demanda
Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 251,54
Envío por EUR 7,64Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. Print on Demand pp. 296 Illus. This item is printed on demand.
- Tapa dura
- Impresión bajo demanda
Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 254,52
Envío por EUR 9,95Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. PRINT ON DEMAND pp. 296.
