Techniques power reliability optimization de diril abdulkadir (9 resultados)

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  • Idioma: Inglés

    Editorial: VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012

    3848409623 / 9783848409624

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    Librería: Books Puddle, Woodside, NY, Estados Unidos de AmericaBooks Puddle

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    Condición: Nuevo

    EUR 83,06

    Envío por EUR 3,51 
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    Cantidad disponible: 4 disponibles

    Condición: New. pp. 108.

  • Idioma: Inglés

    Editorial: LAP LAMBERT Academic Publishing, 2012

    3848409623 / 9783848409624

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    Librería: preigu, Osnabrück, Alemaniapreigu

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    Condición: Nuevo

    EUR 43,40

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    Cantidad disponible: 5 disponibles

    Taschenbuch. Condición: Neu. Techniques for Power and Reliability Optimization of CMOS Logic | Power optimization, soft error tolerance improvement | Abdulkadir Utku Diril | Taschenbuch | 108 S. | Englisch | 2012 | LAP LAMBERT Academic Publishing | EAN 9783848409624 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.…

  • Idioma: Inglés

    Editorial: LAP LAMBERT Academic Publishing, 2012

    3848409623 / 9783848409624

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    Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books

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    Condición: Usado - Como Nuevo

    EUR 120,82

    Envío por EUR 29,04 
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    Cantidad disponible: 1 disponibles

    Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Idioma: Inglés

    Editorial: LAP LAMBERT Academic Publishing Feb 2012, 2012

    3848409623 / 9783848409624

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    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

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    Condición: Nuevo

    EUR 49,00

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    Cantidad disponible: 2 disponibles

    Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme. 108 pp. Englisch.…

  • Idioma: Inglés

    Editorial: VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012

    3848409623 / 9783848409624

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    Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books

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    Condición: Nuevo

    EUR 82,66

    Envío por EUR 7,55 
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    Cantidad disponible: 4 disponibles

    Condición: New. Print on Demand pp. 108 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam.

  • Idioma: Inglés

    Editorial: VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012

    3848409623 / 9783848409624

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    Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios

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    Condición: Nuevo

    EUR 79,09

    Envío por EUR 9,95 
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    Cantidad disponible: 4 disponibles

    Condición: New. PRINT ON DEMAND pp. 108.

  • Idioma: Inglés

    Editorial: LAP LAMBERT Academic Publishing, 2012

    3848409623 / 9783848409624

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    Librería: moluna, Greven, Alemaniamoluna

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    Condición: Nuevo

    EUR 41,05

    Envío por EUR 48,99 
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    Cantidad disponible: Más de 20 disponibles

    Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Diril Abdulkadir UtkuDr. Diril completed his Ph.D. in 2005 at Georgia Institute of Technology on the subject of low power design and reliability of CMOS circuits. After finishing his Ph.D., he worked at NVIDIA in the power optimizati.…

  • Idioma: Inglés

    Editorial: LAP LAMBERT Academic Publishing, 2012

    3848409623 / 9783848409624

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    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

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    Condición: Nuevo

    EUR 49,00

    Envío por EUR 60,90 
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    Cantidad disponible: 1 disponibles

    Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme.…

  • Idioma: Inglés

    Editorial: LAP LAMBERT Academic Publishing Feb 2012, 2012

    3848409623 / 9783848409624

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    Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000

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    Condición: Nuevo

    EUR 49,00

    Envío por EUR 60,00 
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    Cantidad disponible: 1 disponibles

    Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 108 pp. Englisch.…