Idioma: Inglés
Publicado por Springer (edition 1986), 1986
ISBN 10: 0306423871 ISBN 13: 9780306423871
Librería: BooksRun, Philadelphia, PA, Estados Unidos de America
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Añadir al carritoHardcover. Condición: Fair. 1986. The item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way.
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Añadir al carritoCondición: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Añadir al carritoHardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Añadir al carritoHardcover. Condición: Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Añadir al carritoHardcover. Condición: Good. hardback book in good condition,upper corner near rear panel has slight moist air exposure.
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Añadir al carritogebundene Ausgabe. Condición: Gut. 448 Seiten Der Erhaltungszustand des hier angebotenen Werks ist trotz seiner Bibliotheksnutzung sehr sauber. Es befindet sich neben dem Rückenschild lediglich ein Bibliotheksstempel im Buch; ordnungsgemäß entwidmet. Einbandkanten sind leicht bestoßen. Leichte altersbedingte Anbräunung des Papiers. In ENGLISCHER Sprache. Sprache: Englisch Gewicht in Gramm: 1005.
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Idioma: Inglés
Publicado por Electronic Industry Press, 2022
ISBN 10: 7121428776 ISBN 13: 9787121428777
Librería: liu xing, Nanjing, JS, China
EUR 192,38
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Añadir al carritopaperback. Condición: New. Paperback.Pub Date:2022-03-01 Pages:500 Language:Chinese Publisher:Electronic Industry Press This book introduces the basic principles of scanning electron microscopes and energy spectrometers and some typical examples in practical work from the perspective of application. application. Whole book is divided into upper. lower two and some relevant appendices. The first part includes chapters 1 to 9. It mainly discusses the principle. structure. operation points and several common image quality.
Librería: Books Puddle, New York, NY, Estados Unidos de America
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Añadir al carritoCondición: New. pp. 468.
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Añadir al carritoTaschenbuch. Condición: Neu. Principles of Analytical Electron Microscopy | Joseph Goldstein (u. a.) | Taschenbuch | xvi | Englisch | 2013 | Springer | EAN 9781489920393 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Añadir al carritoCondición: New. pp. 468.
Idioma: Inglés
Publicado por Springer, Chapman And Hall/CRC, 2013
ISBN 10: 1489920390 ISBN 13: 9781489920393
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 168,73
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Añadir al carritoTaschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the 'physics of the processes' and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
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Añadir al carritoBuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the 'physics of the processes' and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
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Añadir al carritoPaperback. Condición: Brand New. reprint edition. 464 pages. 9.26x6.11x1.20 inches. In Stock.
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Añadir al carritoHardcover. Condición: Very Good. Very Good. book.
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Añadir al carritoPaperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Idioma: Chino
Publicado por Electronic Industry Press, 2022
ISBN 10: 7121428776 ISBN 13: 9787121428777
Librería: liu xing, Nanjing, JS, China
EUR 192,38
Cantidad disponible: 3 disponibles
Añadir al carritopaperback. Condición: New. Paperback.Pub Date:2022-03-01 Pages:500 Language:Chinese Publisher:Electronic Industry Press This book introduces the basic principles of scanning electron microscopes and energy spectrometers and some typical examples in practical work from the perspective of application. application. Whole book is divided into upper. lower two and some relevant appendices. The first part includes chapters 1 to 9. It mainly discusses the principle. structure. operation points and several common image quality.
Librería: PBShop.store US, Wood Dale, IL, Estados Unidos de America
EUR 59,81
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Añadir al carritoPAP. Condición: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Librería: PBShop.store UK, Fairford, GLOS, Reino Unido
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Añadir al carritoPAP. Condición: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.