Embedded processor based self test de gizopoulos dimitris (24 resultados)

Idioma: Inglés
Editorial: New Age International Publisher, 2009
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Librería: Romtrade Corp., STERLING HEIGHTS, MI, Estados Unidos de AmericaRomtrade Corp.
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Condición: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.…

Idioma: Inglés
Editorial: New Age International Publisher, 2009
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Librería: SMASS Sellers, IRVING, TX, Estados Unidos de AmericaSMASS Sellers
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EUR 31,81
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Condición: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.

Idioma: Inglés
Editorial: Springer, 2004
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EUR 191,50
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Idioma: Inglés
Editorial: Springer, 2011
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EUR 191,50
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Más imágenesIdioma: Inglés
Editorial: Springer US, 2011
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Librería: preigu, Osnabrück, Alemaniapreigu
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EUR 140,35
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Taschenbuch. Condición: Neu. Embedded Processor-Based Self-Test | Dimitris Gizopoulos (u. a.) | Taschenbuch | xv | Englisch | 2011 | Springer US | EAN 9781441952523 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Idioma: Inglés
Editorial: Springer, 2004
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Librería: BennettBooksLtd, Los Angeles, CA, Estados Unidos de AmericaBennettBooksLtd
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EUR 211,77
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hardcover. Condición: New. In shrink wrap. Looks like an interesting title.

Idioma: Inglés
Editorial: Springer, 2011
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 183,30
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit's performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.…

Idioma: Inglés
Editorial: Springer, 2004
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Librería: Books Puddle, Woodside, NY, Estados Unidos de AmericaBooks Puddle
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EUR 236,94
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Condición: New. pp. 236.

Idioma: Inglés
Editorial: Springer, 2012
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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Paperback. Condición: Brand New. 232 pages. 9.00x6.00x0.60 inches. In Stock.

Idioma: Inglés
Editorial: Kluwer Academic Pub, 2005
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Hardcover. Condición: Brand New. 1st edition. 216 pages. 9.50x6.50x0.50 inches. In Stock.

Idioma: Inglés
Editorial: Springer, 2011
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Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
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Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Idioma: Inglés
Editorial: Springer, 2011
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Condición: As New. Unread book in perfect condition.

Idioma: Inglés
Editorial: Springer, 2004
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Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Idioma: Inglés
Editorial: Springer, 2004
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Condición: As New. Unread book in perfect condition.

Idioma: Inglés
Editorial: Springer, 2011
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Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Condición: new. Questo è un articolo print on demand.

Idioma: Inglés
Editorial: Humana Dez 2004, 2004
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 160,49
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures. 236 pp. Englisch.…

Idioma: Inglés
Editorial: Springer US Dez 2011, 2011
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 160,49
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit's performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures. 236 pp. Englisch.…

Idioma: Inglés
Editorial: Springer US, 2011
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Librería: moluna, Greven, Alemaniamoluna
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EUR 136,16
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Sets the framework for comparisons among different SBST methodologies by discussing key requirementsPresents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.…

Idioma: Inglés
Editorial: Springer US, 2004
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- Impresión bajo demanda
Librería: moluna, Greven, Alemaniamoluna
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EUR 136,16
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Sets the framework for comparisons among different SBST methodologies by discussing key requirementsPresents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.…

Idioma: Inglés
Editorial: Springer US, 2004
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Librería: preigu, Osnabrück, Alemaniapreigu
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EUR 141,45
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Buch. Condición: Neu. Embedded Processor-Based Self-Test | Dimitris Gizopoulos (u. a.) | Buch | Frontiers in Electronic Testing | xv | Englisch | 2004 | Springer US | EAN 9781402027857 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. …

Idioma: Inglés
Editorial: Springer US, Springer US Dez 2004, 2004
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
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EUR 160,49
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Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit¿s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 236 pp. Englisch.…

Idioma: Inglés
Editorial: Springer New York, Springer US Dez 2011, 2011
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EUR 160,49
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Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit¿s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.Libri GmbH, Europaallee 1, 36244 Bad Hersfeld 236 pp. Englisch.…

Idioma: Inglés
Editorial: Springer, 2004
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Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
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EUR 247,81
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Condición: New. Print on Demand pp. 236 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

Idioma: Inglés
Editorial: Springer, 2004
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 249,93
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Condición: New. PRINT ON DEMAND pp. 236.