Digital logic testing simulation (27 resultados)
Idioma: Inglés
Editorial: Reading, MA, U.S.A.: Addison-Wesley Educational Publishers, Incorporated, 1985 1985
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Librería: Bingo Used Books, Vancouver, WA, Estados Unidos de AmericaBingo Used Books
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EUR 4,37
Envío por EUR 6,03Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: Very Good. Hardcover in very good + condition.
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Librería: HPB-Red, Dallas, TX, Estados Unidos de AmericaHPB-Red
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EUR 13,21
Envío por EUR 3,24Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponibles
hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
Idioma: Inglés
Editorial: Reading, MA, U.S.A. : Addison-Wesley Educational Publishers,. 1986
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Librería: Virginia Martin, aka bookwitch, Concord, CA, Estados Unidos de AmericaVirginia Martin, aka bookwitch
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 12,26
Envío por EUR 4,74Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: Very Good. Estado de la sobrecubierta: Unknown. Octavo, hardcover, near fine in white pictorial boards. Clean and unmarked. 414 pp New algorithms are being devised to create tests for logic circuits, and more attention is being given to design for test techniques. In this comprehensive volume the state of the art in d…igital system design and testing is discussed. (as per 1985). Book.
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Librería: Anybook.com, Lincoln, Reino UnidoAnybook.com
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EUR 3,32
Envío por EUR 15,74Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:047161307X.
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Librería: Anybook.com, Lincoln, Reino UnidoAnybook.com
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EUR 4,21
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Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:047161307X.
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Librería: Anybook.com, Lincoln, Reino UnidoAnybook.com
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EUR 22,89
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Condición: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Book contains pencil markings. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750…grams, ISBN:0060444444.
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Librería: Anybook.com, Lincoln, Reino UnidoAnybook.com
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EUR 22,89
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Condición: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. No dust jacket. Water damaged. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:00…60444444.
Editorial: Harper & Row, New York 1985
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- Primera edición
Librería: Between the Covers-Rare Books, Inc. ABAA, Gloucester City, NJ, Estados Unidos de AmericaBetween the Covers-Rare Books, Inc. ABAA
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EUR 31,10
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Hardcover. Condición: Fine. First edition. Near fine. Spine darkened just a little.
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Librería: GoldBooks, Denver, CO, Estados Unidos de AmericaGoldBooks
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EUR 118,17
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Hardcover. Condición: new. New Copy. Customer Service Guaranteed.
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Librería: PBShop.store UK, Fairford, GLOS, Reino UnidoPBShop.store UK
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EUR 180,27
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HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.
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Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
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EUR 162,12
Envío por EUR 28,93Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Paperback. Condición: Acceptable. Acceptable. Dust Jacket NOT present. CD WILL BE MISSING. SHIPS FROM MULTIPLE LOCATIONS. book.
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 192,91
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Condición: New.
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Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 179,48
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Condición: new.
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 180,26
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Condición: New.
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Librería: Buchpark, Trebbin, , AlemaniaBuchpark
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EUR 93,32
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Condición: Gut. Zustand: Gut | Seiten: 696 | Sprache: Englisch | Produktart: Bücher | Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical t…o reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: Binary Decision Diagrams (BDDs) and cycle-based simulation Tester architectures/Standard Test Interface Language (STIL) Practical algorithms written in a Hardware Design Language (HDL) Fault tolerance Behavioral Automatic Test Pattern Generation (ATPG) The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 192,50
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Condición: New. In.
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Librería: Majestic Books, Hounslow, , Reino UnidoMajestic Books
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EUR 238,78
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Condición: New. pp. xxii + 668 Illus.
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Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
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EUR 243,00
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Condición: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illu…strations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . .
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 262,17
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Condición: New. pp. xxii + 668 Index 2nd Edition.
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Librería: Revaluation Books, Exeter, , Reino UnidoRevaluation Books
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EUR 282,48
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Hardcover. Condición: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock.
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Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore
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EUR 305,79
Envío por EUR 9,06Se envía dentro de Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illu…strations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . . Books ship from the US and Ireland.
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 261,98
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Buch. Condición: Neu. Neuware - Your road map for meeting today s digital testing challengesToday, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as dig…ital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, 'the work required to . . . test a chip of this size approached the amount of effort required to design it.' A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge.There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: Binary Decision Diagrams (BDDs) and cycle-based simulation Tester architectures/Standard Test Interface Language (STIL) Practical algorithms written in a Hardware Design Language (HDL) Fault tolerance Behavioral Automatic Test Pattern Generation (ATPG) The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approachUp-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 358,80
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Condición: As New. Unread book in perfect condition.
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Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
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EUR 349,27
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Hardcover. Condición: Like New. Like New. book.
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 388,19
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Condición: As New. Unread book in perfect condition.
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- Impresión bajo demanda
Librería: CitiRetail, Stevenage, Reino UnidoCitiRetail
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EUR 205,61
Envío por EUR 42,82Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet,… as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
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- Impresión bajo demanda
Librería: Revaluation Books, Exeter, , Reino UnidoRevaluation Books
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EUR 259,85
Envío por EUR 17,36Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Hardcover. Condición: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock. This item is printed on demand.
