9789400760813 - Flash Memories: Economic Principles of Performance, Cost and Reliability Optimization: 40 (Springer Series in Advanced Microelectronics, 40) de Richter, Detlev (12 resultados)

Hardcover. 268 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. 9789400760813 Sprache: Englisch Gewicht in Gramm: 550.

Condición: New. In English.

Condición: New. pp. 294.

Hardcover. Condición: Brand New. 2014 edition. 231 pages. 9.25x6.25x0.80 inches. In Stock.

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The subject of this book is to introduce a model-based quantitative performance indicator methodology applicable for performance, cost and reliability optimization of non-volatile memories. The complex example of flash memories is used to introduce and apply the methodology. It has been developed by the author based on an industrial 2-bit to 4-bit per cell flash development project. For the first time, design and cost aspects of 3D integration of flash memory are treated in this book.Cell, array, performance and reliability effects of flash memories are introduced and analyzed. Key performance parameters are derived to handle the flash complexity. A performance and array memory model is developed and a set of performance indicators characterizing architecture, cost and durability is defined. Flash memories are selected to apply the Performance Indicator Methodology to quantify design and technology innovation. A graphical representation based on trend lines is introduced to support a requirement based product development process.The Performance Indicator methodology is applied to demonstrate the importance of hidden memory parameters for a successful product and system development roadmap. Flash Memories offers an opportunity to enhance your understanding of product development key topics such as: Reliability optimization of flash memories is all about threshold voltage margin understanding and definition; Product performance parameter are analyzed in-depth in all aspects in relation to the threshold voltage operation window; Technical characteristics are translated into quantitative performance indicators; Performance indicators are applied to identify and quantify product and technology innovation within adjacent areas to fulfill the application requirements with an overall cost optimized solution; Cost, density, performance and durability values are combined into a common factor - performance indicator - which fulfills the application requirements.

Hardcover. Condición: Like New. Like New. book.

Condición: new. Questo è un articolo print on demand.

Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The subject of this book is to introduce a model-based quantitative performance indicator methodology applicable for performance, cost and reliability optimization of non-volatile memories. The complex example of flash memories is used to introduce and apply the methodology. It has been developed by the author based on an industrial 2-bit to 4-bit per cell flash development project. For the first time, design and cost aspects of 3D integration of flash memory are treated in this book.Cell, array, performance and reliability effects of flash memories are introduced and analyzed. Key performance parameters are derived to handle the flash complexity. A performance and array memory model is developed and a set of performance indicators characterizing architecture, cost and durability is defined. Flash memories are selected to apply the Performance Indicator Methodology to quantify design and technology innovation. A graphical representation based on trend lines is introduced to support a requirement based product development process.The Performance Indicator methodology is applied to demonstrate the importance of hidden memory parameters for a successful product and system development roadmap. Flash Memories offers an opportunity to enhance your understanding of product development key topics such as: Reliability optimization of flash memories is all about threshold voltage margin understanding and definition; Product performance parameter are analyzed in-depth in all aspects in relation to the threshold voltage operation window; Technical characteristics are translated into quantitative performance indicators; Performance indicators are applied to identify and quantify product and technology innovation within adjacent areas to fulfill the application requirements with an overall cost optimized solution; Cost, density, performance and durability values are combined into a common factor - performance indicator - which fulfills the application requirements 292 pp. Englisch.

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. A complete memory product and system optimization analysis is provided in-depth for NAND flash based solid-state storage systemsA Performance Indicator Methodology is developed to support a requirement based application shown for the specific e.

Condición: New. PRINT ON DEMAND pp. 294.

Condición: New. Print on Demand pp. 294 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The subject of this book is to introduce a model-based quantitative performance indicator methodology applicable for performance, cost and reliability optimization of non-volatile memories. The complex example of flash memories is used to introduce and apply the methodology. It has been developed by the author based on an industrial 2-bit to 4-bit per cell flash development project. For the first time, design and cost aspects of 3D integration of flash memory are treated in this book.Cell, array, performance and reliability effects of flash memories are introduced and analyzed. Key performance parameters are derived to handle the flash complexity. A performance and array memory model is developed and a set of performance indicators characterizing architecture, cost and durability is defined.Flash memories are selected to apply the Performance Indicator Methodology to quantify design and technology innovation. A graphical representation based on trend lines is introduced to support a requirement based product development process.The Performance Indicator methodology is applied to demonstrate the importance of hidden memory parameters for a successful product and system development roadmap.Flash Memories offers an opportunity to enhance your understanding of product development key topics such as: Reliability optimization of flash memories is all about threshold voltage margin understanding and definition; Product performance parameter are analyzed in-depth in all aspects in relation to the threshold voltage operation window; Technical characteristics are translated into quantitative performance indicators; Performance indicators are applied to identify and quantify product and technology innovation within adjacent areas to fulfill the application requirements with an overall cost optimized solution; Cost, density, performance and durability values are combined into a common factor ¿ performance indicator - which fulfills the application requirementsSpringer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 292 pp. Englisch.