9783838104041 - optical testing of semiconductor devices under high energy pulses: advanced optical interferometric methods for nanosecond mapping of semiconductor devices under high energy pulses de dubec, viktor (5 resultados)
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Editorial: Südwestdeutscher Verlag für Hochschulschriften, 2015
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Librería: preigu, Osnabrück, Alemaniapreigu
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Taschenbuch. Condición: Neu. Optical Testing of Semiconductor Devices under High Energy Pulses | Advanced Optical Interferometric Methods for Nanosecond Mapping of Semiconductor Devices under High Energy Pulses | Viktor Dubec | Taschenbuch | 160 S. | Deutsch | 2015 | Südwestdeutscher Verlag für Hochschulschriften | EAN 978383810…4041 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.
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Editorial: Südwestdeutscher Verlag Für Hochschulschriften AG Co. KG Jul 2015, 2015
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -For optimisation of devices and verification of device simulation models the knowledge of heat dissipation and of free carrier concentration in the device is essential. Non-destructive optical methods based on monitoring of the refr…active index, absorption or light emission have previously been developed for investigation of transient temperature or free carrier changes. However, these methods suffer either from small spatial or time resolution. Therefore two testing techniques based on transient interferometric mapping have been developed within this thesis: a two-dimensional multiple-time-instant single-shot technique and a two-beam technique with sub-nanosecond time resolution. 160 pp. Deutsch.
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Editorial: Südwestdeutscher Verlag für Hochschulschriften, 2015
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Librería: moluna, Greven, Alemaniamoluna
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. For optimisation of devices and verification of device simulation models the knowledge of heat dissipation and of free carrier concentration in the device is essential. Non-destructive optical methods based on monitor…ing of the refractive index, absorption .
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Editorial: Südwestdeutscher Verlag Für Hochschulschriften AG Co. KG, 2009
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - For optimisation of devices and verification of device simulation models the knowledge of heat dissipation and of free carrier concentration in the device is essential. Non-destructive optical methods based on monitoring of the refractiv…e index, absorption or light emission have previously been developed for investigation of transient temperature or free carrier changes. However, these methods suffer either from small spatial or time resolution. Therefore two testing techniques based on transient interferometric mapping have been developed within this thesis: a two-dimensional multiple-time-instant single-shot technique and a two-beam technique with sub-nanosecond time resolution.
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Editorial: Südwestdeutscher Verlag Für Hochschulschriften Mär 2009, 2009
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
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Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -For optimisation of devices and verification of device simulation models the knowledge of heat dissipation and of free carrier concentration in the device is essential. Non-destructive optical methods based on monitoring of the refracti…ve index, absorption or light emission have previously been developed for investigation of transient temperature or free carrier changes. However, these methods suffer either from small spatial or time resolution. Therefore two testing techniques based on transient interferometric mapping have been developed within this thesis: a two-dimensional multiple-time-instant single-shot technique and a two-beam technique with sub-nanosecond time resolution.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 160 pp. Deutsch.
