9783540426950 - point defects in semiconductors and insulators: determination of atomic and electronic structure from paramagnetic hyperfine interactions: 51 (springer series in materials science, 51) de overhof, harald; spaeth, johann-martin (14 resultados)
Idioma: Inglés
Editorial: Springer, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
Librería: Basi6 International, Irving, TX, Estados Unidos de AmericaBasi6 International
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 174,10
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 10 disponibles
Condición: Brand New. New. Delivery takes 25-30 days. Excellent Customer Service.
Point Defects in Semiconductors and Insulators : Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
Spaeth, Johann-Martin; Overhof, H.; Queisser, Hans-joachim (EDT)
Idioma: Inglés
Editorial: Springer, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 216,57
Envío por EUR 17,55Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New.
Idioma: Inglés
Editorial: Springer Berlin Heidelberg, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
Librería: moluna, Greven, Alemaniamoluna
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 180,07
Envío por EUR 48,99Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New.
Idioma: Inglés
Editorial: Springer, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 227,78
Envío por EUR 14,01Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. In.
Point Defects in Semiconductors and Insulators : Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
Spaeth, Johann-Martin; Overhof, H.; Queisser, Hans-joachim (EDT)
Idioma: Inglés
Editorial: Springer, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 239,16
Envío por EUR 2,28Se envía dentro de Estados Unidos de AmericaCantidad disponible: 15 disponibles
Condición: New.
Point Defects in Semiconductors and Insulators : Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
Spaeth, Johann-Martin; Overhof, H.; Queisser, Hans-joachim (EDT)
Idioma: Inglés
Editorial: Springer, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 267,48
Envío por EUR 17,55Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: As New. Unread book in perfect condition.
Idioma: Inglés
Editorial: Springer, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 282,06
Envío por EUR 3,45Se envía dentro de Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. pp. 508.
Idioma: Inglés
Editorial: Springer, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Como Nuevo
EUR 257,85
Envío por EUR 29,25Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: Like New. Like New. book.
Point Defects in Semiconductors and Insulators : Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
Spaeth, Johann-Martin; Overhof, H.; Queisser, Hans-joachim (EDT)
Idioma: Inglés
Editorial: Springer, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 293,25
Envío por EUR 2,28Se envía dentro de Estados Unidos de AmericaCantidad disponible: 15 disponibles
Condición: As New. Unread book in perfect condition.
Idioma: Inglés
Editorial: Springer, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 223,11
Envío por EUR 64,61Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The precedent book with the title 'Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy' ap peared about 10 years ago. Since then a very active development has oc curred both with respect to the exper…imental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials science and represents one of the important methods of materials analysis. Multiple magnetic resonances are used less now for 'fundamental' studies in solid state physics. Therefore a more 'pedestrian' access to the meth ods is called for to help the materials scientist to use them or to appreciate results obtained by using these methods. We have kept the two introduc tory chapters on conventional electron paramagnetic resonance (EPR) of the precedent book which are the base for the multiple resonance methods. The chapter on optical detection of EPR (ODEPR) was supplemented by sections on the structural information one can get from 'forbidden' transitions as well as on spatial correlations between defects in the so-called 'cross relaxation spectroscopy'. High-field ODEPR/ENDOR was also added. The chapter on stationary electron nuclear double resonance (ENDOR) was supplemented by the method of stochastic END OR developed a few years ago in Paderborn which is now also commercially available.
Idioma: Inglés
Editorial: Springer Berlin Heidelberg Jan 2003, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
- Impresión bajo demanda
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 213,99
Envío por EUR 23,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The precedent book with the title 'Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy' ap peared about 10 years ago. Since then a very active development has oc curred both with resp…ect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials science and represents one of the important methods of materials analysis. Multiple magnetic resonances are used less now for 'fundamental' studies in solid state physics. Therefore a more 'pedestrian' access to the meth ods is called for to help the materials scientist to use them or to appreciate results obtained by using these methods. We have kept the two introduc tory chapters on conventional electron paramagnetic resonance (EPR) of the precedent book which are the base for the multiple resonance methods. The chapter on optical detection of EPR (ODEPR) was supplemented by sections on the structural information one can get from 'forbidden' transitions as well as on spatial correlations between defects in the so-called 'cross relaxation spectroscopy'. High-field ODEPR/ENDOR was also added. The chapter on stationary electron nuclear double resonance (ENDOR) was supplemented by the method of stochastic END OR developed a few years ago in Paderborn which is now also commercially available. 508 pp. Englisch.
Idioma: Inglés
Editorial: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jan 2003, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
- Impresión bajo demanda
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 213,99
Envío por EUR 60,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The precedent book with the title 'Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy' ap peared about 10 years ago. Since then a very active development has oc curred both with respect…to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials science and represents one of the important methods of materials analysis. Multiple magnetic resonances are used less now for 'fundamental' studies in solid state physics. Therefore a more 'pedestrian' access to the meth ods is called for to help the materials scientist to use them or to appreciate results obtained by using these methods. We have kept the two introduc tory chapters on conventional electron paramagnetic resonance (EPR) of the precedent book which are the base for the multiple resonance methods. The chapter on optical detection of EPR (ODEPR) was supplemented by sections on the structural information one can get from 'forbidden' transitions as well as on spatial correlations between defects in the so-called 'cross relaxation spectroscopy'. High-field ODEPR/ENDOR was also added. The chapter on stationary electron nuclear double resonance (ENDOR) was supplemented by the method of stochastic END OR developed a few years ago in Paderborn which is now also commercially available.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 508 pp. Englisch.
Idioma: Inglés
Editorial: Springer, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
- Impresión bajo demanda
Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 296,33
Envío por EUR 7,60Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. Print on Demand pp. 508 279 Illus.
Idioma: Inglés
Editorial: Springer, 2003
Serie: Libro 79 de 233 - Springer Series in Materials Science
- Tapa dura
- Impresión bajo demanda
Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 301,83
Envío por EUR 9,95Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. PRINT ON DEMAND pp. 508.
