9783540418184 - high-resolution imaging and spectrometry of materials: 50 (springer series in materials science, 50) de ernst, frank; ruhle, manfred (11 resultados)
Idioma: Inglés
Editorial: Springer, 2003
Serie: Libro 60 de 233 - Springer Series in Materials Science
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Librería: Research Ink, Takoma Park, MD, Estados Unidos de AmericaResearch Ink
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EUR 53,58
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Hardcover. Condición: Very Good. xiv + 440 pp. Springer series in materials science, 50. Rubber-stamped on front free endpaper. book.
Idioma: Inglés
Editorial: Springer Verlag, 2002
Serie: Libro 60 de 233 - Springer Series in Materials Science
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Librería: CSG Onlinebuch GMBH, Darmstadt, AlemaniaCSG Onlinebuch GMBH
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Gebunden. Condición: Gut. Gebraucht - Gut Zustand: Gut, Mängelexemplar, XIV, 440 p. 211 illus., 32 in color About this book: This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and i…nterface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students. Written for researchers.
Idioma: Inglés
Editorial: Springer, 2002
Serie: Libro 60 de 233 - Springer Series in Materials Science
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 165,92
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Condición: New. In.
Idioma: Inglés
Editorial: Springer, 2002
Serie: Libro 60 de 233 - Springer Series in Materials Science
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Librería: California Books, Miami, FL, Estados Unidos de AmericaCalifornia Books
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EUR 180,38
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Condición: New.
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Idioma: Inglés
Editorial: Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2002
Serie: Libro 60 de 233 - Springer Series in Materials Science
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 160,49
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characte…risation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.
Idioma: Inglés
Editorial: Springer, 2002
Serie: Libro 60 de 233 - Springer Series in Materials Science
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Librería: BennettBooksLtd, Los Angeles, CA, Estados Unidos de AmericaBennettBooksLtd
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EUR 230,99
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hardcover. Condición: New. In shrink wrap. Looks like an interesting title.
Idioma: Inglés
Editorial: Springer Verlag, 2003
Serie: Libro 60 de 233 - Springer Series in Materials Science
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 240,02
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Hardcover. Condición: Brand New. 440 pages. 9.25x6.25x0.75 inches. In Stock.
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Idioma: Inglés
Editorial: Springer Berlin Heidelberg Dez 2002, 2002
Serie: Libro 60 de 233 - Springer Series in Materials Science
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 160,49
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their component…s, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. 460 pp. Englisch.
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Idioma: Inglés
Editorial: Springer Berlin Heidelberg, 2002
Serie: Libro 60 de 233 - Springer Series in Materials Science
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Librería: moluna, Greven, Alemaniamoluna
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EUR 136,16
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In contrast to previously available books this not only reports on the state of the art of advanced electron microscopy but also contains examples of applicationsThe characterisation of materials and materia…l systems is an essential aspect of materials .
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Idioma: Inglés
Editorial: Springer, Springer Berlin Heidelberg Dez 2002, 2002
Serie: Libro 60 de 233 - Springer Series in Materials Science
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
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EUR 160,49
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Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, t…his characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 460 pp. Englisch.
Idioma: Inglés
Editorial: Springer, 2002
Serie: Libro 60 de 233 - Springer Series in Materials Science
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 345,98
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Condición: New. Print on Demand pp. 460.
